div class=ts-pagebutton class=gotoPage data-page=1Page 1button div class=ts-imageimg data-url=2955mr-1-cdrpubsolegesd-2004-11-22-o-semenov-et-al-microelectronicshtmlpage=1 data-page=1 class=ts-thumb lazyload alt=Page 1: 2955MR 1cdrpubsOleg_ESD · 2004-11-22 · O Semenov et al Microelectronics Reliability 44 2004 1817—1822 1819 3 ESD Devices under Investigation For the analysis of loading=lazy src=data:imagegifbase64iVBORw0KGgoAAAANSUhEUgAAAAIAAAACCAQAAADYv8WvAAAAD0lEQVR42mP8X8AwAgiABKBAv+vAXklAAAAAElFTkSuQmCC data-src=https:reader033vdocumentspubreader033viewer20220419235e6cc3408597a30ea411be9ahtml5thumbnails1jpg width=140 height=200 divdivdiv class=ts-pagebutton class=gotoPage data-page=2Page 2button div class=ts-imageimg data-url=2955mr-1-cdrpubsolegesd-2004-11-22-o-semenov-et-al-microelectronicshtmlpage=2 data-page=2 class=ts-thumb lazyload alt=Page 2: 2955MR 1cdrpubsOleg_ESD · 2004-11-22 · O Semenov et al Microelectronics Reliability 44 2004 1817—1822 1819 3 ESD Devices under Investigation For the analysis of loading=lazy src=data:imagegifbase64iVBORw0KGgoAAAANSUhEUgAAAAIAAAACCAQAAADYv8WvAAAAD0lEQVR42mP8X8AwAgiABKBAv+vAXklAAAAAElFTkSuQmCC data-src=https:reader033vdocumentspubreader033viewer20220419235e6cc3408597a30ea411be9ahtml5thumbnails2jpg width=140 height=200 divdivdiv class=ts-pagebutton class=gotoPage data-page=3Page 3button div class=ts-imageimg data-url=2955mr-1-cdrpubsolegesd-2004-11-22-o-semenov-et-al-microelectronicshtmlpage=3 data-page=3 class=ts-thumb lazyload alt=Page 3: 2955MR 1cdrpubsOleg_ESD · 2004-11-22 · O Semenov et al Microelectronics Reliability 44 2004 1817—1822 1819 3 ESD Devices under Investigation For the analysis of loading=lazy src=data:imagegifbase64iVBORw0KGgoAAAANSUhEUgAAAAIAAAACCAQAAADYv8WvAAAAD0lEQVR42mP8X8AwAgiABKBAv+vAXklAAAAAElFTkSuQmCC data-src=https:reader033vdocumentspubreader033viewer20220419235e6cc3408597a30ea411be9ahtml5thumbnails3jpg width=140 height=200 divdivdiv class=ts-pagebutton class=gotoPage data-page=4Page 4button div class=ts-imageimg data-url=2955mr-1-cdrpubsolegesd-2004-11-22-o-semenov-et-al-microelectronicshtmlpage=4 data-page=4 class=ts-thumb lazyload alt=Page 4: 2955MR 1cdrpubsOleg_ESD · 2004-11-22 · O Semenov et al Microelectronics Reliability 44 2004 1817—1822 1819 3 ESD Devices under Investigation For the analysis of loading=lazy src=data:imagegifbase64iVBORw0KGgoAAAANSUhEUgAAAAIAAAACCAQAAADYv8WvAAAAD0lEQVR42mP8X8AwAgiABKBAv+vAXklAAAAAElFTkSuQmCC data-src=https:reader033vdocumentspubreader033viewer20220419235e6cc3408597a30ea411be9ahtml5thumbnails4jpg width=140 height=200 divdivdiv class=ts-pagebutton class=gotoPage data-page=5Page 5button div class=ts-imageimg data-url=2955mr-1-cdrpubsolegesd-2004-11-22-o-semenov-et-al-microelectronicshtmlpage=5 data-page=5 class=ts-thumb lazyload alt=Page 5: 2955MR 1cdrpubsOleg_ESD · 2004-11-22 · O Semenov et al Microelectronics Reliability 44 2004 1817—1822 1819 3 ESD Devices under Investigation For the analysis of loading=lazy src=data:imagegifbase64iVBORw0KGgoAAAANSUhEUgAAAAIAAAACCAQAAADYv8WvAAAAD0lEQVR42mP8X8AwAgiABKBAv+vAXklAAAAAElFTkSuQmCC data-src=https:reader033vdocumentspubreader033viewer20220419235e6cc3408597a30ea411be9ahtml5thumbnails5jpg width=140 height=200 divdivdiv class=ts-pagebutton class=gotoPage data-page=6Page 6button div class=ts-imageimg data-url=2955mr-1-cdrpubsolegesd-2004-11-22-o-semenov-et-al-microelectronicshtmlpage=6 data-page=6 class=ts-thumb lazyload alt=Page 6: 2955MR 1cdrpubsOleg_ESD · 2004-11-22 · O Semenov et al Microelectronics Reliability 44 2004 1817—1822 1819 3 ESD Devices under Investigation For the analysis of loading=lazy src=data:imagegifbase64iVBORw0KGgoAAAANSUhEUgAAAAIAAAACCAQAAADYv8WvAAAAD0lEQVR42mP8X8AwAgiABKBAv+vAXklAAAAAElFTkSuQmCC data-src=https:reader033vdocumentspubreader033viewer20220419235e6cc3408597a30ea411be9ahtml5thumbnails6jpg width=140 height=200 divdiv
