5Ãì o ã ªçt2 e|Êë òw·Úh §êa ¢ ?´0(©&sa «%Ôb;
TRANSCRIPT
To learn more about ON Semiconductor, please visit our website at www.onsemi.com
Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to [email protected].
Is Now Part of
ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
March 2016
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com1
FDP51N25 / FDPF51N25 N-Channel UniFETTM MOSFET 250 V, 51 A, 60 mΩ
Features• RDS(on) = 48 mΩ (Typ.) @ VGS = 10 V, ID = 25.5 A
• Low Gate Charge (Typ. 55 nC)
• Low Crss (Typ. 63 pF)
Applications
• PDP TV
• Lighting
• Uninterruptible Power Supply
• AC-DC Power Supply
DescriptionUniFETTM MOSFET is Fairchild Semiconductor’s high voltage MOSFET family based on planar stripe and DMOS technology. This MOSFET is tailored to reduce on-state resistance, and to provide better switching performance and higher avalanche energy strength. This device family is suitable for switching power converter applications such as power factor correction (PFC), flat panel display (FPD) TV power, ATX and electronic lamp ballasts.
Absolute Maximum Ratings TC = 25°C unless otherwise noted.
*Drain current limited by maximum junction temperature.
Thermal Characteristics
Symbol ParameterFDP51N25
FDPF51N25 FDPF51N25YDTUFDPF51N25RDTU Unit
VDSS Drain-Source Voltage 250 V
ID Drain Current - Continuous (TC = 25°C)- Continuous (TC = 100°C)
5130
51*30*
AA
IDM Drain Current - Pulsed (Note 1) 204 204* A
VGSS Gate-Source voltage ± 30 V
EAS Single Pulsed Avalanche Energy (Note 2) 1111 mJ
IAR Avalanche Current (Note 1) 51 A
EAR Repetitive Avalanche Energy (Note 1) 32 mJ
VISO Insulation withstand voltage (RMS) from all three leads to external heat sink (t=0.3sec; TC = 25°C) N/A 2500 V
dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns
PD Power Dissipation (TC = 25°C)- Derate Above 25°C
3203.7
380.3
WW/°C
TJ, TSTG Operating and Storage Temperature Range -55 to +150 °C
TL Maximum Lead Temperature for Soldering,1/8” from Case for 5 Seconds
300 °C
Symbol ParameterFDP51N25
FDPF51N25FDPF51N25YDTUFDPF51N25RDTU Unit
RθJC Thermal Resistance, Junction-to-Case, Max. 0.39 3.3 °C/W
RθJA Thermal Resistance, Junction-to-Ambient, Max. 62.5 62.5 °C/W
GS
D
TO-220FY-formed
TO-220F
GDS
G
S
D
TO-220
GDS GS
D
TO-220FLG-formed
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com2
Package Marking and Ordering Information
Electrical Characteristics TC = 25°C unless otherwise noted.
Notes:
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. L = 0.68 mH, IAS = 51 A, VDD = 50 V, RG = 25 Ω, starting TJ = 25°C.
3. ISD ≤ 51 A, di/dt ≤ 200 A/μs, VDD ≤ BVDSS, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
Part Number Top Mark Package Packing Method Reel Size Tape Width Quantity
FDP51N25 FDP51N25 TO-220 Tube N/A N/A 50 units
FDPF51N25 FDPF51N25 TO-220F Tube N/A N/A 50 units
FDPF51N25YDTU FDPF51N25TO-220F
(Y-formed)Tube N/A N/A 50 units
FDPF51N25RDTU FDPF51N25TO-220F
(LG-formed)Tube N/A N/A 50 units
Symbol Parameter Conditions Min. Typ. Max. Unit
Off Characteristics
BVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 μA, TJ = 25 °C 250 -- -- V
ΔBVDSS / ΔTJ
Breakdown Voltage Temperature Coefficient
ID = 250 μA, Referenced to 25°C -- 0.25 -- V/°C
IDSS Zero Gate Voltage Drain Current VDS = 250 V, VGS = 0 VVDS = 200 V, TC = 125°C
----
----
110
μAμA
IGSSF Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V -- -- 100 nA
IGSSR Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0V -- -- -100 nA
On Characteristics
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 μA 3.0 -- 5.0 V
RDS(on) Static Drain-SourceOn-Resistance
VGS = 10 V, ID = 25.5 A -- 0.048 0.060 Ω
gFS Forward Transconductance VDS = 40 V, ID = 25.5 A -- 43 -- S
Dynamic Characteristics
Ciss Input Capacitance VDS = 25 V, VGS = 0 V,f = 1 MHz
-- 2620 3410 pF
Coss Output Capacitance -- 530 690 pF
Crss Reverse Transfer Capacitance -- 63 90 pF
Switching Characteristics
td(on) Turn-On Delay Time VDD = 125 V, ID = 51 A,VGS = 10 V, RG = 25 Ω
(Note 4)
-- 62 135 ns
tr Turn-On Rise Time -- 465 940 ns
td(off) Turn-Off Delay Time -- 98 205 ns
tf Turn-Off Fall Time -- 130 270 ns
Qg Total Gate Charge VDS = 200 V, ID = 51 A,VGS = 10 V
(Note 4)
-- 55 70 nC
Qgs Gate-Source Charge -- 16 -- nC
Qgd Gate-Drain Charge -- 27 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain-Source Diode Forward Current -- -- 51 A
ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 204 A
VSD Drain-Source Diode Forward Voltage VGS = 0 V, IS = 51 A -- -- 1.4 V
trr Reverse Recovery Time VGS = 0 V, IS = 51 A,dIF/dt =100 A/μs
-- 178 -- ns
Qrr Reverse Recovery Charge -- 4.0 -- μC
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com3
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
10-1 100 101100
101
102
VGS
Top : 15.0 V 10.0 V
8.0 V 7.0 V 6.5 V 6.0 V
Bottom : 5.5 V
* Notes : 1. 250μs Pulse Test
2. TC = 25oC
I D,
Dra
in C
urre
nt [
A]
VDS
, Drain-Source Voltage [V]
2 4 6 8 10 12100
101
102
150oC
25oC
-55oC
* Notes :1. V
DS = 40V
2. 250μs Pulse Test
I D,
Dra
in C
urre
nt [
A]
VGS
, Gate-Source Voltage [V]
0 25 50 75 100 125 150
0.04
0.06
0.08
0.10
0.12
0.14
VGS
= 20V
VGS
= 10V
* Note : TJ = 25oC
RD
S(O
N) [
Ω],
Dra
in-S
ourc
e O
n-R
esis
tanc
e
ID, Drain Current [A]
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8100
101
102
150oC
* Notes :1. V
GS = 0V
2. 250μs Pulse Test
25oC
I DR,
Rev
erse
Dra
in C
urre
nt [
A]
VSD
, Source-Drain voltage [V]
10-1 100 1010
2000
4000
6000C
iss = C
gs + C
gd (C
ds = shorted)
Coss
= Cds
+ Cgd
Crss
= Cgd
* Note ; 1. V
GS = 0 V
2. f = 1 MHzC
rss
Coss
Ciss
Cap
acita
nces
[pF
]
VDS
, Drain-Source Voltage [V]
0 10 20 30 40 50 600
2
4
6
8
10
12
VDS
= 125V
VDS
= 50V
VDS
= 200V
* Note : ID = 51A
VG
S,
Gat
e-S
ourc
e V
olta
ge
[V]
QG, Total Gate Charge [nC]
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com4
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature
Figure 9-1. Maximum Safe Operating Area Figure 9-2. Maximum Safe Operating Area for FDP51N25 for FDPF51N25 / FDPF51N25YDTU
Figure 10. Maximum Drain Current vs. Case Temperature
-100 -50 0 50 100 150 2000.8
0.9
1.0
1.1
1.2
* Notes :1. V
GS = 0 V
2. ID = 250 μA
BV
DS
S,
(Nor
mal
ized
)
Dra
in-S
ourc
e B
reak
dow
n V
olta
ge
TJ, Junction Temperature [oC]
-100 -50 0 50 100 150 2000.0
0.5
1.0
1.5
2.0
2.5
3.0
* Notes :1. V
GS = 10 V
2. ID = 25.5 A
RD
S(O
N),
(Nor
ma
lized
)
Dra
in-S
ourc
e O
n-R
esis
tanc
e
TJ, Junction Temperature [oC]
100 101 10210-2
10-1
100
101
102
100 ms
1 ms
10 μs
DC
10 ms
100 μs
Operation in This Area is Limited by R
DS(on)
* Notes :
1. TC = 25 oC
2. TJ = 150 oC
3. Single Pulse
I D,
Dra
in C
urre
nt [
A]
VDS
, Drain-Source Voltage [V]
100 101 10210-2
10-1
100
101
102
100 ms
1 ms
10 μs
DC
10 ms
100 μs
Operation in This Area is Limited by R
DS(on)
* Notes :
1. TC = 25 oC
2. TJ = 150 oC
3. Single Pulse
I D,
Dra
in C
urre
nt [
A]
VDS
, Drain-Source Voltage [V]
25 50 75 100 125 1500
10
20
30
40
50
60
I D,
Dra
in C
urre
nt [
A]
TC, Case Temperature [oC]
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com5
Typical Performance Characteristics (Continued)
Figure 11-1. Transient Thermal Response Curve for FDP51N25
Figure 11-2. Transient Thermal Response Curve for FDPF51N25 / FDPF51N25YDTU
10-5
10-4
10-3
10-2
10-1
100
101
10-2
10-1
* Notes :
1. ZθJC
(t) = 0.39 0C/W Max.
2. Duty Factor, D=t1/t
2
3. TJM
- TC = P
DM * Z
θJC(t)single pulse
D=0.5
0.02
0.2
0.05
0.1
0.01
ZθJ
C(t
), T
herm
al R
espo
nse
t1, Square W ave Pulse Duration [sec]
t1
PDM
t2
ZθJ
C(t
), T
herm
al R
esp
onse
[oC
/W]
10-5 10-4 10-3 10-2 10-1 100 10110-2
10-1
100
* Notes :
1. ZθJC
(t) = 3.3 0C/W Max.
2. Duty Factor, D=t1/t
2
3. TJM
- TC = P
DM * Z
θJC(t)
single pulse
D=0.5
0.02
0.2
0.05
0.1
0.01
ZθJ
C(t
), T
herm
al R
espo
nse
t1, Square Wave Pulse Duration [sec]
t1
PDM
t2
ZθJ
C(t
), T
herm
al R
espo
nse
[oC
/W]
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com6
Figure 12. Gate Charge Test Circuit & Waveform
Figure 13. Resistive Switching Test Circuit & Waveforms
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
VGS
VDS
10%
90%
td(on) tr
t on t off
td(off) tf
VDD
10V
VDS
RL
DUT
RG
VGS
VGS
VDS
10%
90%
td(on) tr
t on t off
td(off) tf
VDD
10V
VDS
RL
DUT
RG
VGS
VGS
Charge
VGS
10VQg
Qgs Qgd
3mA
VGS
DUT
VDS
300nF
50KΩ
200nF12V
Same Typeas DUT
Charge
VGS
10VQg
Qgs Qgd
3mA
VGS
DUT
VDS
300nF
50KΩ
200nF12V
Same Typeas DUT
EAS = L IAS2----
21 --------------------
BVDSS - VDD
BVDSS
VDD
VDS
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
10V DUT
RG
L
I D
t p
EAS = L IAS2----
21
EAS = L IAS2----
21----21 --------------------
BVDSS - VDD
BVDSS
VDD
VDS
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
10V DUT
RG
LL
I DI D
t p
VGSVGS
IG = const.
FD
P51N
25 / FD
PF
51N25 —
N-C
han
nel U
niF
ET
TM
MO
SF
ET
©2008 Fairchild Semiconductor Corporation FDP51N25 / FDPF51N25 Rev. 1.8
www.fairchildsemi.com7
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
VDS
+
_
DriverRG
Same Type as DUT
VGS • dv/dt controlled by RG
• ISD controlled by pulse period
VDD
LI SD
10VVGS
( Driver )
I SD
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
VSD
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D =Gate Pulse Width
Gate Pulse Period--------------------------
DUT
VDS
+
_
DriverRG
Same Type as DUT
VGS • dv/dt controlled by RG
• ISD controlled by pulse period
VDD
LLI SD
10VVGS
( Driver )
I SD
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
VSD
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D =Gate Pulse Width
Gate Pulse Period--------------------------D =Gate Pulse Width
Gate Pulse Period--------------------------
B4.904.50
3
3.403.20
3.283.08
B10.369.96
2.54 2.54
1.471.24
0.900.70
7.00
2.14
1
0.50 M A
A B2.662.42
B16.0715.67
0.70
6.886.48
1 X 45°
2.962.56
B0.600.45
B4.804.20
B8.507.50
R1.00
R1.00
B4.503.50
NOTES:
A. EXCEPT WHERE NOTED CONFORMS TO EIAJ SC91A.
B DOES NOT COMPLY EIAJ STD. VALUE. C. ALL DIMENSIONS ARE IN MILLIMETERS. D. DIMENSIONS ARE EXCLUSIVE OF BURRS,
MOLD FLASH AND TIE BAR PROTRUSIONS. E. DIMENSION AND TOLERANCE AS PER ASME
Y14.5-1994. F. DRAWING FILE NAME: TO220N03REV2
B4.904.50
16.0015.60
3.403.20
3.283.08
B10.369.96
1.471.24
0.900.70
2.54 2.54
7.00
2.14
1 3
0.50 M A
A B2.662.42
B16.0715.67
2.962.56
0.70
6.886.48
1 X 45°
B0.600.45
B10.009.00
B6.004.00
B10.459.45
R0.30
B 4.00 MIN
R0.30
NOTES:
A. EXCEPT WHERE NOTED CONFORMS TO EIAJ SC91A.
B DOES NOT COMPLY EIAJ STD. VALUE. C. ALL DIMENSIONS ARE IN MILLIMETERS. D. DIMENSIONS ARE EXCLUSIVE OF BURRS,
MOLD FLASH AND TIE BAR PROTRUSIONS. E. DIMENSION AND TOLERANCE AS PER ASME
Y14.5-1994. F. DRAWING FILE NAME: TO220Q03REV2
10.67
9.65
16.30
13.90
3.40
2.50
1.62
1.10
6.69
6.06
"A1"
4.70
4.00
2.85
2.10
0.60
0.36
14.04
12.70
Ø4.00
3.50
5°
3°
5°
3°
9.40
8.13
14.30
11.50
8.65
7.59
3 2 1
1 2 3
NOTES:
A) REFERENCE JEDEC, TO-220, VARIATION AB
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS COMMON TO ALL PACKAGE
SUPPLIERS EXCEPT WHERE NOTED [ ].
D) LOCATION OF MOLDED FEATURE MAY VARY
(LOWER LEFT CORNER, LOWER CENTER
AND CENTER OF THE PACKAGE)
E DOES NOT COMPLY JEDEC STANDARD VALUE.
F) "A1" DIMENSIONS AS BELOW:
SINGLE GAUGE = 0.51 - 0.61
DUAL GAUGE = 1.10 - 1.45
G) DRAWING FILE NAME: TO220B03REV9
H PRESENCE IS SUPPLIER DEPENDENT
I) SUPPLIER DEPENDENT MOLD LOCKING HOLES
IN HEATSINK.
C
16.51
15.42
[2.46]
SUPPLIER "A" PACKAGE
SHAPE
SUPPLIER "B" PACKAGE
SHAPE
1.00
0.55
SEE NOTE "F"
E
E
E
E
2.67
2.40
2.13
2.06
OPTIONAL
CHAMFER
1.62
1.42
H
IF PRESENT, SEE NOTE "D"
NOTE "I"
FRONT VIEWS
BOTTOM VIEW
BACK VIEW
SIDE VIEW
4.10
2.70
B4.904.50
16.0015.60
10.059.45
3.403.20
3.283.08
B10.369.96
1.471.24
0.900.70
0.450.25
30°
2.54 2.54
7.00
2.14
(3.23) B
1 3
SEE NOTE "F"
0.50 M A
A B2.662.42
B16.0715.67
2.962.56
B0.600.45
0.70
6.886.48
1 X 45°
SEE NOTE "F"
NOTES:
A. EXCEPT WHERE NOTED CONFORMS TO EIAJ SC91A.
B DOES NOT COMPLY EIAJ STD. VALUE. C. ALL DIMENSIONS ARE IN MILLIMETERS. D. DIMENSIONS ARE EXCLUSIVE OF BURRS,
MOLD FLASH AND TIE BAR PROTRUSIONS. E. DIMENSION AND TOLERANCE AS PER ASME
Y14.5-1994. F. OPTION 1 - WITH SUPPORT PIN HOLE. OPTION 2 - NO SUPPORT PIN HOLE. G. DRAWING FILE NAME: TO220M03REV5
www.onsemi.com1
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patentcoverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liabilityarising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/orspecifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customerapplication by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are notdesigned, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classificationin a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorizedapplication, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, andexpenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if suchclaim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. Thisliterature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATIONN. American Technical Support: 800−282−9855 Toll FreeUSA/Canada
Europe, Middle East and Africa Technical Support:Phone: 421 33 790 2910
Japan Customer Focus CenterPhone: 81−3−5817−1050
www.onsemi.com
LITERATURE FULFILLMENT:Literature Distribution Center for ON Semiconductor19521 E. 32nd Pkwy, Aurora, Colorado 80011 USAPhone: 303−675−2175 or 800−344−3860 Toll Free USA/CanadaFax: 303−675−2176 or 800−344−3867 Toll Free USA/CanadaEmail: [email protected]
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your localSales Representative
© Semiconductor Components Industries, LLC