design of dsp testing environment performed by: safovich yevgeny307015578 instructors: eli shoshan...

Design of DSP testing environment

Performed By:Safovich Yevgeny 307015578

Instructors: Eli Shoshan

Yevgeni Rifkin

הטכניון - מכון טכנולוגי לישראל

הפקולטה להנדסת חשמל

Technion - Israel institute of technologydepartment of Electrical Engineering

Table of Content:

Introduction Goal Testing Environment Architecture Principles of Architecture Scope Test routines description Module for Tests Control Status

Introduction

Satellites are exposed to several sources of ionizing radiation: Trapped radiation Galactic cosmic rays Solar flares

This radiation induces transient and permanent changes in semiconductor devices Single Event Latch-Ups (SEL) Total Ionizing Doze (TID)

Introduction (cont.)

We are going to measure the impact of radiation on DSP

DSP 6416 has been chosen for: Requested by the customer It is used for calculations and control on satellites Project “LOKO” of an archiving algorithm has been

developed in EE faculty for this DSP It is one of the most advanced of its type

Goal

Test DSP operation during radiation Total Ionizing Doze (TID)

Quantify reversal of bits per each module Output statistical summary of the results

Environment

Tests Control GUI:• Parameters Setting

• Control

• Results

• Analysis

JTAG cable

XDS510

TEB 6416 Host

Tests Execution:• Initial settings

• Behavior verification

• Output results

Architecture

TEB C6416

DSP(C & Asm)

JTAG

XDS510 emulator

Code Composer

Tests Control UI(VB)

PC

COM

Architecture (cont.)

PC (Host) Connection to DSP via JTAG DSP control by using COM technology (Code

Composer is exposed by COM interface) Access to DSP memory space Ability to run program routines Ability to analyze test results externally Convenient GUI

Architecture (cont.)

DSP (controlled by the Host) Used in TEB development environment Availability of external memory (EMIF) The test program is executed from external

memory (with minor exceptions) “Fast” tests execution (vs. running tests on Host)

Principles of Architecture

DSP All tests are executed by DSP

PC (Host) Control the testing routines Gather & Output results

Interface All data exchange is done by DSP external

memory (not influenced by radiation)

Principles of Architecture (cont.) PC

Initialize development environment Reset TEB & DSP

Load the test program to DSP Set active testing routine(s) according to user’s

selection Run program on DSP Gather & present immediate results from DSP

(EMIF) Complete collection of results & analysis

Principles of Architecture (cont.) DSP

Separate testing route per each module

Module state initialization Test execution Behavior verification & errors’ analysis

(+counters) Output results to external memory space (EMIF)

Scope

Only state containing modules to be tested Each module should be tested “separately” Errors (“damaged” addresses / modules)

should be counted

Scope (cont.)

Modules to be tested: Internal Memory (1Mb) CPU EDMA MCBSP (0 – 2) Timers (0 – 2)

Modules not to be tested (defined by customer): VCP TCP EMIF A/B (no buffers) UTOPIA HPI PCI External memory PLL

Scope (cont.)

Test routines description

CPU All 6416 opcodes are tested Each opcode is given “sample” input values Opcode result is compared to the pre-calculated

one

MCBSP A “sample” data is written to each port The data is read from the port and compared to

the input one

Test routines description (cont.) Internal Memory

Backup critical program Interrupts handlers Timer test routines

Fill memory by sample data (the addresses values)

Wait for reversal of bits Repeat the above for data = NOT of address

Test routines description (cont.) EDMA

Schedule the following transfers finalized by EDMA interrupt:

Data Block

Data Block

Data Block

Backup

Image

Source

Data Block

1. Data Block -> Backup

2. Source -> Data Block

3. Data Block -> Image

4. Backup -> Data Block

5. Comparison: Source – Image

Test routines description (cont.) Timers

Each timer is tested by the following routine:

Set clock to 1/8 of the internal clock Start timer Run a loop of with a counter variable The code is written in such a way that:

Each loop iteration takes 8 CPU cycles Counter variable should reach the same number as the

timer’s one Loop is finished upon timer interrupt

Module for Tests Control

Tests execution control: Reset TEB & DSP Reset Statistics Run single test once (loop) Run all tests once (loop) Automatic Reset upon program failure (watchdog) Immediate results presentation

Module for Tests Control (cont.) Full results analysis:

Gather all errors counters Show errors counters per module Present graph of errors distribution on memory Presentation of errors average, std. dev, min, max Ability to save results (addresses sorted by errors

frequency)

Module for Tests Control (cont.)

Module for Tests Control (cont.)

Module for Tests Control (cont.) Summary:

Total tests count: 6Total errors: 18Auto resets performed: 0

CPU:Tests count: 1Total errors: 1

…

Memory:Tests count: 2Total errors: 14Avg. total errors per test: 7Min. errors per address: 0Max. errors per address: 2

Memory - errors per address report:Addr.[hex] Errors70000 2…

Text file format:

Status

DSP Test routines are ready Host Control Module is ready Documentation – in progress