Author Index

491

A

Abe, E., 189–190Acher, O., 354–355Adesida, I., 149Adrian, M., 489Aeppli, G., 191Agio, M., 304Ahn, J.-P., 425Aksay, I. A., 304Aktary, M., 150Alam, M. N., 43, 75Alexander, J., 148Alexandrov, I. A., 354Alitalo, K., 466Allan, D. C., 304Allard, M., 382Allen, L. J., 189–191Almawlawi, D., 279Amelinckx, S., 426Amiens, C., 355Amiridis, M. D., 189An, S. Y., 356Anderhalt, R., 1Anderson, T. F., 35, 40Andok, R., 149Andrews, R., 268, 280Angelo, S. K. St, 381Angelopoulos, M., 148–149Anguita, J. V., 150Antonelli, M., 236Anzalone, P. A., 236Anzalone, P., 225, 236Aoki, K., 305Aoyagi, Y., 304–305

Apkarian, R. P., 1, 40, 467, 489Arai, T., 149Arepalli, S., 224Arias, T. A., 424Ariga, M., 304Arnold, M., 424Asakawa, K., 304Assayag, G. Ben, 235Ausman, K. D., 223Austin, R. H., 151Aviram, A., 149Avouris, P., 280, 423–424Avouris, Ph., 223Awano, Y., 280Awschalom, D. D., 151Aziz, M. J., 356

B

Baba, T., 304–305Babensee, J. E., 466Bachand, G., 151Bachtold, A., 425Badel, X., 382Bae, E. J., 425Bae, S. C., 381Bae, S. Y., 408, 425Bai, D., 424Baik, H. S., 189, 191Bailey, G. W., 40Baker R. W., 465Bakish, R., 148Balsamo, A., 279Bando, Y., 381Barak, V., 149

492 Author Index

Barry, J. D., 280Barsan, N., 150Barton, J. E., 356Batson, P. E., 190–191Bauer, L. A., 381Baughman, R. H., 40, 304, 355, 382Bean, J. C., 235Bearer, E. L., 40Beermann, N., 356Bell, D. C., 100Belmonte, M., 305Beneking, H., 150Benson, O., 191Benter, T., 355Berger, P. R., 149Bergulund, C. N., 148Bernaerts, D., 426Bertagnoli, E., 236Bertone, J. F., 355, 382Bethune, D. S., 267, 280, 424Beyers, R., 280, 424Bhunia, S., 248, 279Bigi, A., 466Binh, N. T., 426Birks, T. A., 304Birner, A., 304, 382Biswas, R., 304–305Bizios, R., 466Blaaderen, A. van, 382–383Black, C. T., 355, 382Black, J., 464Blackman, M., 75Blackwell, A. S., 465Blanco, A., 304Bland, J. A. C., 150Blanford, C. F., 356Bleloch, A., 150Blick, R. H., 150Bloyet, D., 235Blum, A. S., 223Bo, X. Z., 304Boanini, E., 466Bockrath, M. W., 425Bockrath, M., 425Boer, M. van de, 383Böhringer, K. F., 381Bonnell, D. A., 190Booker, G. R., 75Boothroyd, C., 279

Borel, J. -P., 191Boretos, J. W., 464Borgstrom, M., 304Borisevich, A. Y., 189–190Borisevich, A., 152, 190–191Born, M., 190Boscarino, D., 150Bouadma, N., 304Bour, D. P., 278Bowlin, G. L., 465Boyan, B. D., 466Boyde, A., 40Boyes, E. D., 182, 191Brathwaite, C., 465Bres, E. de, 383Brett, M. J., 150, 305Brinkman, W. T., 489Brintlinger, T., 272–273, 280Briones, F., 150Broers, A. N., 39, 148–150Broitman, E., 424Brorson, M., 381Brown, I. J., 355Brown, S. R., 236Browne, F., 465Browning, N. D., 190–191Browning, R., 148Brummel, S., 489Bu, W. B., 425Buck, E. C., 426Buczko, R., 189–191Buffat, P., 191Buhrman, R. A., 151Bunk, R., 151Bunn, R. D., 40Bur, J., 304Buriak, J. M., 312, 355Burns, L. D., 423Busch, K., 304Buschmann, V., 382Bush, G. G., 356

C

Cador, O., 356Cai, W. L., 382Caldwell, K. D., 466Calestani, G., 190Calvin, S., 354

Author Index 493

Campbell, L. J., 40, 150Campbell, M., 305Campillo, A. J., 304Cao, H., 151, 265, 280, 381Cao, L. M., 424Cao, Y. G., 278Cao, Y., 381Caplovic, I., 149Caran, K. L., 488–489Carlberg, P., 304Carleson, P. D., 236Carlsson, N., 304Carnahan, D. L., 425Carpenter, E. E., 354Carpenter, L. E. II, 149Carrejo, J. P., 148Caruntu, D., 306Caruntu, G., 306, 356Caruso, F., 382Caruso, R. A., 382Caseri, W., 356Cassanove, M. J., 355Cassell, A., 425Cavanah, T. M., 223Cerrina, F., 149Chabasseur-Molyneux, V., 149Chaikof, E. L., 488–489Chan, C. T., 303Chandrasekaran, H., 381Chang, C., 465Chang, J. J., 489Chang, T. H. P., 149Chang, Z. P., 191Chapline, M. G., 424–425Chapman, J. N., 150Chatham, N. J., 355Chatlain, A., 424Chaudret, B., 320, 355Chaudret, M., 355Chelnokov, A., 305Chen, B., 191Chen, C. D., 149Chen, C., 151Chen, D. P., 279Chen, E., 465Chen, F., 278Chen, H. R., 425Chen, J. J., 40, 224Chen, J., 280, 382, 424

Chen, K. H., 426Chen, K., 149Chen, L. C., 426Chen, L., 381Chen, M. S., 191Chen, M., 356Chen, Q. W., 425Chen, V. J., 465Chen, X. L., 278Chen, X., 224Chen, Y. F., 280Chen, Y. X., 40, 150Chen, Y., 278, 305, 356, 489Chen, Z., 381Cheng, H., 350, 356Cheng, J. P., 426Cheong, S. W., 191Chisholm, M. F., 152, 190Chiu, J., 465Chlebowski, M. E., 489Chmelka, B. F., 383Cho, K. J., 424Cho, K., 425Cho, Y. J., 425Choi, H. J., 426Choi, H., 266, 280Choi, J. H. C., 355Choi, J., 262, 280, 381Choi, S. W., 465Choi, W. B., 425Chomski, E., 304Choopun, S., 279Chou, S. Y., 151Chow, E., 304Chow, L., 235Christen, H. M., 189Christova, C. G., 382Chtchelkanova, A. Y., 151Chu, B., 465Chu, S., 263, 280Chung, K. S., 278Chutinan, A., 304Ci, L. J., 279Citrin, P. H., 189Cizeron, J., 355Claesson, D., 224Cleland, A. N., 149Cobas, E., 280Cobden, D. H., 425

494 Author Index

Cojocaru, C. S., 382Colbert, D. T., 424Colliex, C., 424Colliex, H. O., 426Collins, P. G., 223Colvin, V. C., 382Colvin, V. L., 322, 354–356, 382Comini, E., 150, 424Compbell, L. A., 120Connor, S., 355Conticello, V. P., 488–489Cooper, A., 489Cosgriff, E. C., 189, 191Cosslett, V. E., 39Cote, M. J., 425Coulter, M., 279Cowburn, R. P., 150Cowin, J. P., 100Cox, E. C., 151Craighead, H. G., 150Crane, G. M., 465Cregan, R. F., 304Crespi, V. H., 381Crewe, A. V., 189–190Croft, M., 424Cromer, R., 382Crouch, D. D., 304Cui, C., 304Cui, F. Z., 466Cui, Y., 150, 424–425Cui, Z., 150Cuisin, C., 305Cullity, B. D., 356Cummings, J., 218, 223Currier, B. L., 466Curtis, J. C., 40Cushing, B. L., 354Cusick, R. A., 465

D

Da, X., 236Dahm, G., 305Dai, H., 150, 424–425Dai, S., 189–191Dai, Z. R., 381, 423, 425Dan, N., 382Daniel, J. H., 235Dantas, S. O., 304Daughton, J. M., 151

Davidson, A. P., 382Day, A. P., 75Dean, D. D., 466Deblieckhogervorst, J. M. A., 465Decanini, D., 305Deepak, F. L., 238, 278Degroot, K., 465Deheer, W. A., 424Dekker, C., 423, 425Della Mea, G., 150Dellby, N., 189–190Deng, H. Y., 465Deng, S., 278Denning, R. G., 305Derbyshire, F., 280Dhanasekaran, T., 191Dhas, N. A., 279Diao, H. W., 279Dick, K., 191Dickey, E. C., 189, 191, 280Diebold, A. C., 191Dijkkamp, D., 424Dikin, D. A., 224Dimiduk, D. M., 236Dimitrov, A., 304Dimitrov, N., 356Ding, J., 278–279Ding, Q. M., 278Ding, W., 224Ding, Y., 356, 381, 423, 426Dingley, D. J., 44–46, 75Dobrev, D., 382Doh, S., 191Dolabdjian, C., 235Dolan, S. E., 426Doll, T., 304Dollomore, D., 356Dong, C., 465Dong, J., 426, 488–489Dong, L., 279Dong, Z. L., 278Dood, M. J. A. de, 304Doremus, R. H., 466Doyle, H., 355Driel, H. M. van, 304Drift, E. W. J. M. van der, 304Du, C., 466Du, G., 279Du, Y., 280, 382Duan, B., 465

Duan, X. F., 244, 278, 424Duan, X., 150, 381Dubochet, J., 469, 489Dubuc, C., 235Ducamp-Sanguesa, C., 355Duguet, E., 356Dullens, R. P. A., 382Dumestre, F., 355Dunn, D. N., 235Dürkop, T., 280Durlam, M., 150Duscher, G., 189–191Dvorak, J., 191Dyer, M. J., 223–224

E

Ebels, U., 304Eberhardt, W., 150Eberl, K., 426Echlin, P., 39, 100, 489Eck, W., 150Eden, M., 464Egerton, R. F., 176, 191Ehrfeld, W., 305Eklund, P. C., 191Ekvall, I., 224El-Kady, I., 305Elliott, L. L. C., 355Ellis, M., 223Ellis, W. C., 426Elsesser, M. T., 383Emley, N., 382Empedocles, S., 424Endo, M., 280Ergun, C., 466Erickson, R. O., 383Erlebacher, J., 325–326, 328, 356Erts, D., 224Erwin, M. M., 189, 191Esquivias, C., 280Etourneau, J., 344, 356Eustis, S., 489Everhart, T. E., 5, 24, 40

F

Faglia, G., 150, 424Falvo, M. R., 223–224Fan, S. H., 278Fan, S. S., 426

Fan, S., 303Fan, X., 189–191, 280Fang, D. F., 465Fang, J., 339, 347, 356Fasol, G., 278Favier, F., 355Feick, H., 279, 356, 423Feiertag, G., 305Fejes, P. L., 190Fejes, P., 355Feldman, D. S., 465Feldman, Y., 426Feldmann, J., 191Feng, Q. L., 466Feng, S. Q., 279, 424Fennimore, A. M., 280Ferguson, B. A., 236Ferrara, N., 466Ferroni, M., 150Ferry, D. K., 149Feynman, R. P., 153, 154, 189Fièvet, F., 354–355Fievet-Vincent, F., 354–355Figlarz, M., 355Files, B. S., 224Finch, C. A., 465Findlay, S. D., 189–191Finkelstein, G., 424Fisher, J. E., 424Flahiff, C. M., 465Flament, S., 235Fleming, J. G., 304–305Folks, L., 355Foran, B., 191Ford, C. E., 304Ford, C. J. B., 149Formhals, A., 465Foster, P., 223Franceschi, R., 465Frank, J., 190Frank, L., 112, 119Frank, S., 424Franklin, N. R., 150, 424–425Freeman, M. R., 150Freeman, R. G., 382Freimuth, H., 305Fridrikh, S. V., 465Friedman, R. S., 150, 425Frommen, C., 40, 355, 382Frost, J. E. F., 149

Author Index 495

Fu, J. J., 278Fuhrer, M. S., 280Fujikawa, S., 279Fujita, J. -I., 236Fujita, J., 149–150Furneaux, R. C., 382

G

Gai, P. L., 182, 191Galloway, A. L., 489Gao, C. X., 424Gao, C., 424Gao, J. M., 466Gao, P. X., 384, 426Gao, P., 381, 424Gao, R. P., 426Gao, X., 356Gao, Y., 279Garcia-Santamaria, F., 305Garlick, B., 465Garratt-Reed, A. J., 100Gasparac, R., 382Gates, B., 355–356, 381, 383, 423Gearheart, L., 280Gedankan, A., 279Geisberger, A., 223Geng, J., 355Genut, M., 426Geohegan, D. B., 189, 191Georgiev, Y. M., 149Gëpel, W., 150Geyer, W., 150Giannobile, W., 466Giannuzzi, L. A., 225, 236Gierak, J., 235Giersig, M., 304, 425Gire, F., 235Glazoff, M. V., 189Gnade, B. E., 223Goglio, G., 381Golberg, D., 380Goldberger, J., 278, 381, 426Golding, R. K., 382Goldman, J. L., 424Goldstein, J. I., 39, 100Gole, J. L., 425Golzhauser, A., 150Goodman, D. W., 191

Gorman, G., 280, 424Gösele, U., 280, 304, 381–382Gossmann, H. J. L., 189Gotzinger, S., 191Gou, L., 356Gouezigou, L. Le, 304Govindaraj, A., 278Grabtchak, S., 304Graham, J. J., 148Grasset, F., 356Graugnard, E., 425Grazul, J. L., 189Greiner, A., 381Greyson, E. C., 356Grigorian, L., 191Groeber, M., 236Gronsky, R., 381Groot, K. D., 466Gross, H., 489Gross, M., 383Grunze, M., 355Gu, G., 424Gu, Q., 425Gu, W., 425Guarini, K., 382Guarnieri, C. R., 149Gudiksen, M. S., 279, 381, 424–425Gui, L. L., 279, 381Guidi, V., 150Guiseppi-Elie, A., 465Gundiah, G., 278Gunther, G., 235Guo, G. L., 279, 382Guo, R. Y., 426Gupta, R., 192, 223

H

Haas, T. W., 465Haberstroh, K. M., 465Hadjiargyrou, M., 465Hadley, P., 425Hagfeldt, A., 356, 426Haginoya, C., 151Hahn, K., 424Haider, M., 190Haine, M. E., 39Haller, C., 489Ham, D., 425

496 Author Index

Hamano, Y., 304Hamatsu, H., 149Hamet, J. F., 235Hamilton, E. J. M., 426Han, J., 150Han, S., 150, 424Han, W., 278Han, X. D., 75Haneda, H., 356Hang, Q. L., 279Hansen, T. W., 381Harland, C. J., 44, 75Harris, V. G., 354Harrison, M. T., 305Haruta, M., 191Haruyama, J., 279Haruyama, Y., 236Hasegawa, H., 425Hatamura, Y., 305Hattori, Y., 356Hawig, R., 381Hawkes, P., 189Hayashi, N., 149Hayden, O., 425He, J., 382He, L., 382He, M., 424He, R. R., 426He, R., 278, 381Heal, G. R., 328, 356Heer, W. H. De, 424Hefferan, T. E., 466Hellgren, N., 424Helmbrecht, M. A., 381Helser, A., 223–224Hench, L. L., 466Henglein, A., 355Henschel, W., 149Hentschel, J., 489Hermann, R., 472–473, 489Herrera-Urbina, R., 355Herter, P., 489Hess, C., 381Hetherington, D. L., 304Hietala, V., 304Hillion, F., 236Hinze, P., 150Hirayama, H., 304–305Hirayama, Y., 151

Ho, K. M., 303–305Hoga, M., 149Holland, B. T., 356Hollinger, J. O., 466Hollis, J. M., 465Homma, Y., 273, 280Homo, J. C., 489Hong, B. H., 381Hong, J., 280Hong, S., 381Hong, Z., 279Hoogenboom, J. P., 383Hoole, A. C. F., 149–150Hoshino, T., 236Hough, P. V. C., 46, 48, 53, 56, 75Howe, R. T., 381Hoyer, P., 355Hrbek, J., 191Hrkut, P., 149Hsiao, B. S., 465Hsu, C. M., 424Hu, J. Q., 279Hu, J., 381Hu, Y. H., 466Hu, Y., 278Hu, Z. H., 279Hu, Z., 278, 280, 381Hua, Z. L., 425Huang, C. C., 149Huang, J. Y., 356Huang, L., 381Huang, M. H., 279, 356, 423Huang, S. M., 278Huang, W. M., 425Huang, W. -S., 148–149Huang, W., 149Huang, Y., 150, 381, 424Huang, Z. M., 465Huang, Z. P., 425Hubbell, J. A., 466Huber, C. A., 425Huber, T. E., 425Hudson, T., 223Hughes, W., 423, 426Hui, C., 181, 191Hull, R., 235Hultgren, A., 381Hultman, L., 424Hummert, T. W., 466

Author Index 497

Hunt, T., 236Huo, K. F., 278Huo, K., 278Hussain, A., 235Huynen, I., 382Hwang, J. S., 354Hwang, K. S., 382Hyeon, T., 354Hyning, D. L. Van, 355

I

Ibisate, M., 304Ichihashi, T., 280, 423Idegami, K., 381Iga, K., 304Igaku, Y., 149Iijima, S., 267–268, 280, 423Iisate, M., 305Ikeda, N., 304Iliadis, A., 279Ilic, B., 150Ilyas, I., 355Im, S. H., 382Imada, M., 304Ingino, J., 148Inomata, H., 149Inoshita, K., 304–305Inoue, K., 304Inoue, S., 280Iqbal, Z., 304Irwin, R. B., 236Ishaug, S. L., 465Ishibashi, M., 151Ishida, M., 149, 236Ishigaki, H., 149Ito, H., 149Ito, Y., 466Ivanov, V., 426

J

Jackson, E. M., 354Jackson, T. N., 381Jacobsen, C. J. H., 381Jacques, D., 280Jana, N. R., 280Janke, A., 466Jaskierowicz, G., 382Javey, A., 150

Jefferson, D. A., 355Jensen, M. O., 150Jeong, D. K., 425Jeong, K. S., 425Jeong, L., 465Jeong, S., 381Jeppesen, S., 279Ji, C., 381Jia, D., 381Jiang, P., 354–355, 382Jiang, Y., 254, 279Jiao, J., 279Jin, H. J., 465Jin, Q., 466Jin, S., 150, 381Jin, W., 150, 424Jirsak, T., 191Jisrawi, N., 424Jo, S. M., 465Joannopoulos, J. D., 288, 303–304Joe, N., 120Johansson, M. P., 424John, S., 303–305Johnson, G., 320, 355Johnson, S. A., 355Johnston, A. B., 150Joy, C. S., 40Joy, D. C., 40, 44, 75Joy, D., 1, 39, 100Junarsa, I., 149Jung, H., 425Justus, B. L., 304

K

Kadavanich, A. V., 189, 190–191Kafesaki, M., 304Kaito, T., 236Kakinuma, Y., 426Kaler, E. W., 382Kaltenpoth, G., 355Kanamoto, K., 304Kanda, K., 236Kaneko, K., 328, 356Kang, T. W., 278Kanoh, H., 356Kaplan, D. L., 465Karabacak, T., 424Karma, A., 356

498 Author Index

Karmilov, A. Y., 354Kasai, S., 425Kashima, Y., 40Kästle, G. A., 382Kasuya, K., 149Katoh, K., 149Kawabata, A., 280Kawai, N., 304Kawamura, T., 279Kawasaki, M., 426Kawasaki, S., 356Kazan, B., 189Keeting, C. D., 382Keis, K., 356, 426Kellenberger, E., 489Kelley, B. K., 382Kelley, S. O., 382Kelly, T. F., 224Kempa, K., 425Kennedy, S. R., 305Kern, D. P., 149Kern, D., 150Khamsehpour, B., 150Khayrullin, I. I., 382Khayrullin, I., 304, 355Khoury, M., 149Kiang, C. H., 280Kikuchi, T., 381Kile, B. M., 425Kim, B. G., 191Kim, D. S., 278Kim, D. Y., 278Kim, E., 355Kim, H. M., 278Kim, J. M., 465Kim, J. Y., 465Kim, J., 425Kim, K. -H., 150Kim, K. L., 465Kim, K. S., 381, 465Kim, M. J., 223Kim, M. Y., 191Kim, M., 189, 191Kim, S. B., 355Kim, S. G., 424Kim, S. H., 465Kim, S., 383Kim, T. H., 465Kim, Y. H., 425

Kim, Y. R., 465Kima, C. S., 341, 356Kimball, B., 425Kind, H., 279, 356, 423King, J. S., 425Kippeny, T. C., 189, 191Kiriakidis, G., 305Kirkland, E. J., 190Kisielowski, C., 191Kistler, K. C., 381Kitaev, V., 382, 383Kitakami, O., 151Klang, C. H., 424Klaui, M., 150Kleckley, S., 235Klein, C., 465Kline, T. R., 382Klinth, J., 151Kneller, E. E., 381Knight, J. C., 304Kobayashi, H., 304Kobayashi, Y., 280Kobu, S., 149Koenig, W., 305Koeppe, R., 191Koike, H., 26, 40Koike, K., 151Koinuma, H., 426Kolesnichenko, V. L., 354Kolle, H., 305Kometani, R., 236Komuro, M., 149Kondo, D., 280Kondo, K., 236Konecnikova, A., 149Kong, G. L., 279Kong, J., 424–425Kong, X. Y., 381, 423, 426Konishi, T., 356Koops, H. W. P., 305Kornowski, A., 191Kostic, I., 149Kotaki, M., 465Kotthaus, J. P., 150Kovacs, G. T. A., 148Kovtyukhova, N. I., 382Koyama, F., 304Koyama, T., 280Koyano, K., 305

Author Index 499

Kozlov, M. E., 355, 382Krajbich, I., 466Kranz, C., 236Krauss, P. R., 151Kretz, J., 305Kriele, A., 150Krivanek, O. L., 189–190Krumeich, F., 356Krusin-Elbaum, L., 382Krylov, S., 150Kubis, A. J., 235Kuebler, O., 489Kueng, A., 236Kuhl, J., 305Kuhn-Spearing, L., 465Kulinovski, K. M., 354Kumacheva, E., 383Kumar, D., 189, 191Kuo, C. T., 424Kurihara, K., 149Kurihara, L. K., 354Kurihara, M., 149Kurtz, S. R., 304Kurz, H., 149Kuykendall, T., 278, 355Kwang-Deog Jung, K. J. Y., 356Kwon, Y. U., 332, 356Kwong, R., 149Kyprianidou-Leodidou, T., 356

L

Labhsetwar, N., 356Labianca, N. C., 149Lai, H. J., 424Lai, X., 191Lakadamyali, M., 425Lammert, P. E., 381Lan, Y. C., 278Langen-Suurling, A. K. van, 149, 383Langer, R., 465–466Langheinrich, W., 150Langmore, J., 189Lao, C. S., 426Lao, J. Y., 279, 356, 425Lapierre-Devlin, M. A., 382Larson, D. R., 466Laskin, A., 100Lauhon, L. J., 150, 381, 424–425

Lazareck, A. D., 382Lecorre, M. A., 148Lecorre, M., 149Lee, B., 153, 189, 191Lee, C. J., 424Lee, C. S., 278–279Lee, C., 278–279Lee, C. -W., 381Lee, G., 465Lee, H. S., 425Lee, H., 278, 465Lee, J. H., 191, 425Lee, J. Y., 425Lee, K. L., 148, 305Lee, K., 149Lee, M. S., 355Lee, R., 424Lee, S. H., 425Lee, S. T., 278–279, 425Lee, S. W., 356, 426Lee, S., 278Lee, T. A. T., 488–489Lee, T. S., 465Lee, V. H. L., 466Lee, W. S., 465Lee, Y. H., 304, 383, 424Lehmann, V., 304, 382Lehr, H., 305Lei, B., 424Lei, Y., 279Leiber, C. M., 150Leisen, J., 489Lenhoff, A. M., 382Leonard, S. W., 304Leontidis, E., 356Lepault, J., 489Leslie, A. G. W., 426Lesquey, E., 235Lewis, P. C., 383Li, A. P., 304Li, C., 150, 424Li, D., 356, 465Li, F., 381–382Li, G. H., 425Li, J. Y., 278Li, J., 279, 426Li, Q., 278–279Li, S., 280, 465Li, W. Z., 425

500 Author Index

Author Index 501

Li, X., 356Li, Y. C., 424–425Li, Z. Y., 383Lian, O. Y., 425Liang, C., 279Liang, J., 280Liao, C. S., 426Liao, X. B., 279Liddle, J. A., 149Lieber, C. M., 150, 244, 278–279, 381,

423–425Lifshin, E., 39, 100Lim, C. T., 465Lim, Y. T., 383Lin, C. H., 424Lin, J., 356Lin, M., 279Lin, S. Y., 304–305Lindquist, S. E., 356, 426Linner, T., 355Linnros, J., 382Liu, B. H., 278Liu, B. Y., 278Liu, D. F., 279Liu, G., 191Liu, H., 355Liu, J. J., 40, 224Liu, J. Y., 119Liu, J., 237, 278–279, 424Liu, L. F., 279Liu, M., 426Liu, S. C., 426Liu, W. K., 224Liu, X., 150, 424Liu, Y., 426Liu, Z., 280, 424Loh, K., 279Lõhmus, A., 224Lõhmus, R., 224Loncar, M., 304Look, D. C., 279Lopez, C., 304–305Lopez-Diaz, L., 150Lorenz, H., 150Louie, S. G., 425Lourie, O., 224Lourtioz, J. M., 305Love, L., 279Lu, C. G., 278

Lu, C., 424Lu, L., 466Lu, T. -M., 424Lu, W., 356Lu, X. K., 223Lu, Y., 278, 356, 383Lubensky, T. C., 382Lubin, J. A., 425Lugstein, A., 236Lupini, A. R., 152, 189–191Lupini, A., 191Lupton, J. M., 191Lutwyche, M. I., 149Luu, Y. K. K., 465Lyman, C., 39, 100Lynn, D. G., 488–489Lyon, L. A., 489Lyu, S., 244, 278

M

Ma, A .P. X., 465Ma, C., 279, 426Ma, J., 356Ma, K. J., 149Ma, P. X., 427–428, 465–466Ma, X. L., 425Ma, X., 279Ma, Y., 149, 356Madou, M. J., 149Magg, C. K., 149Mahorowala, A. P., 149Mahurin, S. M., 191Maissonat, A., 355Maiti, A., 191Maitland, T. M., 41, 75Majumdar, A., 148Makarovski, A., 424Malkinski, L., 40, 355, 382Mallikarjunan, A., 424Mallouk, T. E., 381–382Mallouk, T. T., 355Manalis, S., 425Mancini, D., 150Mandoli, C., 382Mangan, B. J., 304Mann, C. E., 426Manoharan, V. N., 382Mansfield, J. F., 236

502 Author Index

Mansson, A., 151Manthiram, A., 356Mao, S., 279, 356, 423Mao, Y. Q., 279Maoa, Y., 356Margulis, L., 426Marson, B., 424Martensson, T., 304Marti, J., 304Martin, B. R., 381Martin, C. R., 423Martin, J. I., 150Martinelli, G., 150Martin-Gonzalez, M., 382Masala, O., 354Matay, L., 149Matsui, S., 149–150, 236Matsutani, A., 304Mayer, T. S., 381Mayers, B. T., 355, 381, 423Maynor, B. W., 423Maynor, B., 278Mbindyo, J., 381McAlpine, M. C., 150Mcalpine, M. C., 425McBride, J. R., 190–191McCauley, L. K., 465–466McCord, M. A., 148McDowall, A. W., 489McEuen, P. L., 425McFarland, M. J., 382McIntire, L. V., 466McMillan, R. A., 488–489McNab, S. J., 304Meade, R. D., 303Medeiros, D. R., 149Mei, Y., 425Meisel, D., 191Melngailis, J., 280Menco, B. P. M., 489Meng, G. W., 279Meng, X. M., 261, 279Meng, X., 279Menger, F. M., 488–489Merli, P. G., 190Meseguer, F., 304–305Messer, B., 383Meulenkamp, E. A., 279

Meyer, G. J., 381Michael, J., 39, 100Mickelson, W., 280Midgley, P. A., 191Miguez, H., 304, 383Mikos, A. G., 465–466Miller, M. J., 465Miller, M. K., 236Mills, R. H., 236Min, B. M., 465Min, Y. S., 425Minlee, Y. H., 424Mitsushima, A., 40Mittlemanb, D., 356Miyamoto, T., 304Miyazaki, H. T., 304–305Mizaikoff, B., 236Mo, C. M., 382Möhwald, H., 382Molares, M. E. T., 382Moll, N., 304Mollenstedt, G., 148Moloni, K., 224Mondia, J. P., 304Montelius, L., 151, 304Montemagno, C., 147, 151Moodenbaugh, A. R., 356Moon, J. H., 383Moore, D. F., 235, 423, 426Moore, D., 279Morales, A. M., 424Moreau, W. M., 149Morishita, H., 299, 305Morita, T., 236Morita, Y., 381Morley, P., 466Mornet, S., 356Morral, A. F., 382Moser, A., 355Moskorvits, M., 279Mukhopadhyay, K., 278Muller, D. A., 189, 191Muller, F., 304, 381–382Muller, M., 473, 489Muller, R. S., 381Muller, T., 489Mullins, D. R., 191Mulvaney, P., 355

Author Index 503

Mulvey, T., 189Murakami, Y., 381Murata, T., 426Muray, L. P., 149Murfitt, M. F., 189–190Murphy, C. J., 280, 338, 356Murray, B. J., 355Murray, C. B., 309, 355Murugan, R., 465

N

Nag, M., 280Nagahara, L. A., 148Nagai, H., 381Nagapudi, K., 489Nagase, M., 149Nagayama, K., 304Nagy, J. B., 426Nakadera, T., 40Nakamura, H., 304Nakamura, K., 149Nakanishi, T., 425Nakatani, I., 150Nam, Y. S., 465Namatsu, H., 149–150Namikawa, T., 150Natan, M. J., 382Nealey, P. F., 149Neff, J. A., 466Neilsch, K., 381Nellist, P. D. L., 189–190Nelson, P., 382Neumann, R., 382Neuzil, P., 150Newbury, D. E., 39, 100Ng, K. H., 355Nicewarner-Pena, S. R., 382Nicholls, I., 151Nielsch, K., 280, 381–382Nihei, M., 280Niklason, L., 466Nikolaev, P., 424Nitschke, M., 466Niu, C. M., 424Niu, J. J., 279Noch, W., 279Noda, S., 288, 304

Nordquist, C. D., 381Nordquist, K., 150Norris, D. J., 304Novembre, A., 149

O

O’Connor, C. J., 354, 356Oatley, C. W., 39Ober, C., 150Oberlin, A., 267, 280Ochiai, Y., 149–150, 236Ocola, L. E., 149Oden, P. I., 148Odom, T. W., 347, 356Oh, J. E., 425Ohlsson, B. J., 279Ohnishi, Y., 150Ohtaka, K., 304Okano, M., 304Okuno, D., 149Okuyama, H., 383Oldham, J. B., 466Olin, H., 224Olivier, P. J., 355Olmeda, C. C., 381Olsson, E., 224Omling, P., 151Orci, L., 40Orphanou, M., 356Ortiz-Soto, L., 189Osatake, H., 40Ouyang, H., 465Overbury, S. H., 189, 191Owen, G., 148Oxley, M. P., 152, 189–191Ozin, G. A., 304, 382–383

P

Padovani, J. M., 382Pan, H., 381Pan, Z. W., 150, 191, 381, 423–425Panabiere, J. -P., 149Pandharkar, S., 150Pantelides, S. T., 189–191Panzavolta, S., 466Papadakis, S. J., 224Papaefthymiou, G. C., 356

504 Author Index

Parce, J. W., 424Parent, M., 356Parish, R. V., 426Park, D. C., 356Park, G. S., 425Park, H. G., 304Park, H., 425Park, O. O., 383Park, S. H., 304, 355–356Park, S., 280Park, T. J., 356Park, W. H., 465Park, W. I., 189, 191Park, Y. S., 278Partel, N., 149Pashley, D. W., 75Patel, A. M., 224Patolsky F., 150, 425Paulson, S., 223Pauzauskie, P. J., 278Paxton, W. F., 381Pease, R. F. W., 148Pedersen, T., 305Peng, J., 356Peng, S. G., 280Peng, S., 424–425Peng, X., 278–279Peng, Y., 152, 190–191Penner, R. M., 311, 355Pennycook, S. J., 152, 189–191Pepper, M., 149Persson, A. I., 279Pescini, L., 150Peters, D. M. P., 489Peters, K. -R., 40Petit, P., 424Petrillo, K. E., 149Pettway, G. J., 465–466Phifer, D., 235–236Pichoir, F., 100Pickett, G., 371, 383Pignard, S., 382Pine, D. J., 382Piqueras, A. J., 190Piraux, L., 382Pleul, D., 466Pokropivny, A. V., 224Polak, J. M., 466Polman, A., 304

Ponc, F. A., 278Poncharal, P., 424Porter, B. D., 466Porter, L. A., 355Portier, J., 356Pouchou, J. L., 100Prater, C. B., 425Prenitzer, B. I., 236Pribat, D., 382Prieto, A. L., 382Principe, E., 191Prinz, G. A., 151Prokofiev, A. I., 354Prola, A., 149Prouteau, C., 235Puers, R., 236Puetter, R. C., 190Purcell, B. M., 236Puretzky, A. A., 189, 191

Q

Qi, L., 356Qian, D., 224, 280Qian, F., 424Qian, Y., 280Qiao, Z. Y., 278Quate, C. F., 425Queisser, A., 75

R

Rabenberg, L., 356Radulescu, A., 382Rai-Choudhury, P., 148Raj, R., 191Rajesh, R., 356Rakhimov, R. R., 308, 354Ralchenko, V. G., 304Ramakrishna, S., 465Ramos, L., 382Rao, A. M., 280Rao, C. N. R., 278Rao, C. R., 278Rao, D. V. G. L. N., 425Rashkeev, S. N., 189–190Ratna, B. R., 223Ravel, F., 354Reddi, A. H., 464, 466Reich, D. H., 381

Author Index 505

Reiss, B. D., 382Ren, Z. F., 356, 425Renaud, P., 355Renner, C., 191Resnick, D., 150Rétif, C., 383Reyntjens, S., 233, 235–236Rho, J. Y., 465Ribbe, A. E., 355Rickerby, D. G., 190Ricketts, D. S., 425Rigby, W. R., 382Rinzler, A. G., 424Rishton, S. A., 149Ritomsky, A., 149Rizvi, A. H., 383Roa, S. G., 381Robbes, D., 235Robert, J., 424Roberts, P. J., 304Robinson, K. A., 489Rodriguez, J. A., 191Rogach, A. L., 191Rohrs, H. W., 223Roisnel, T., 356Romand, P., 149Romijn, H., 149Romijn, J., 383Ronning, C., 426Rosengren, J., 151Rosenthal, S. J., 189–191Rossie, B., 236Rossouw, C. J., 190Rothman, J., 150Roukes, M. L., 151Roundy, D., 424Routkoyitch, D., 279Roveri, N., 466Rubini, K., 466Ruda, H. E., 425Rudolph, M., 305Ruh, H., 278Rühle, M., 424Ruoff, R. S., 197, 223–224Russell, K. F., 236Russell, P. St. J., 304Russell, T. P., 382Russo, R., 279, 356, 423Rutledge, G. C., 465

Ryan, J. M., 149–150Rybczynski, J., 304, 425Ryen, L., 224Ryu, H. Y., 304Ryu, Y. G., 356

S

Sadoqui, M., 425Sahi, V., 424Saito, N., 356Saitoh, H., 149Sakamizu, T., 149Salzman, D. B., 190Samuelson, L., 279, 304Sander, M. S., 425Sands, T., 382Sandstrom, R. L., 355Sang, H., 280, 381Sanki, S., 149Sano, H., 149Sargent, E. H., 383Sarma, S. D., 151Sasaki, S., 149Sato, S., 269, 280Sato, T., 304–305Satoh, H., 149Sattler, K., 424Sauer, G., 280Saville, D. A., 304Savoy, R., 280, 424Sawyer, L., 39, 100Sazonova, V., 424Sberveglieri, G., 150, 424Schadler, L. S., 466Scheltens, F., 236Scherer, A., 304Scherzer, O., 190Scheu, C., 424Schilling, J., 381Schltz, S., 150Schmack, G., 466Schmeltzer, J. M., 355Schmidt, O. G., 426Scholz, R., 382Schotter, J., 382Schuchert, I. U., 382Schulte, A., 235Schultz, P. Q., 489

506 Author Index

Schwartz, V., 191Schwartz, Z., 466Schweizer-Berberich, M., 150Scuseria, G., 424Searson, P. C., 279, 381Seeger, A., 224Segawa, T., 149Segawa, Y., 426Seifert, W., 304Sekar, P., 356Sekiguchi, T., 381Sen, A., 381Senaratne, W., 150Sennett, M., 425Seredyuk, V. A., 489Sergeant, E. H., 383Seshandri, R., 354Setyawan, W., 381Sha, J., 279Shaheen, S. A., 424Sharma, R. P., 279Sharma, S., 381Sharp, D. N., 305Shaw, J. M., 148–149Shen, B., 278Sheng, D., 280, 381Shi, J. L., 425Shi, J., 150Shi, W. S., 244, 278–279Shi, X., 247, 279, 382Shibata, N., 189–191Shibauchi, T., 382Shim, M., 150Shimada, Y., 151Shin, H. S., 355, 425Shinohara, K., 41, 75Shinya, N., 305Shofner, T. L., 236Sholtes, V., 464Shreve, P., 190Shy, S. L., 149Sides, W. H., 189–190Siegel, R. W., 466Sieradzki, K., 356Sigalas, M. M., 304–305Silcox, J., 191Silevitch, D. M., 381Simmel, F., 150

Simon, F., 466Simpson, D. G., 465Sinclair, M., 224Singh, J. P., 424Sitzman, S., 41, 75Skidmore, G. D., 223Slavkin, H. C., 464Smalley, R. E., 424Smith, B. K., 304Smith, D. C., 381, 424Smith, P. A., 381Smyrl, W. H., 356Smyth, J. F., 150Snider, N., 223Snoeks, E., 304Snyder, G. J., 382Sock, S. R., 356Soga, T., 149Soh, H. T., 425Soh, Y. A., 191Sohlberg, K., 189–190Solak, H. H., 149Song, H., 355Song, J. H., 426Song, L., 279Song, Y., 426Sors, P., 40Sotiropoulos, S., 322, 355Soukoulis, C. M., 303–305Soulantica, K., 355Spangenberg, B., 150Spanier, J. E., 425Speaks, R., 150Speidel, R., 148Spence, J. C. H., 190Spinu, L., 382Srinivasan, U., 381Srolovitz, D. J., 426Stacy, A. M., 382Stadler, V., 150Stallcup, R. E. II, 192, 224Stallcup, R., 223Stamatas, G. N., 466Steeves, D., 425Stein, A., 356Steinbrecht, R. A., 489Steinhart, M., 381Stemmer, S., 191

Author Index 507

Stevie, F. A., 236Stout, J. D., 425Stoykovich, M. P., 149Stucky, G. D., 383Sturgess, J. M., 489Sturm, J. C., 304Su, J., 381Subramania, G., 304Sudhiranjan, T., 279Suenaga, K., 424Sugimoto, Y., 304Sugiyama, S., 150Suh, D. J., 383Summers, C. J., 304, 425Sun, L. D., 426Sun, L. L., 424Sun, L., 381Sun, M., 425Sun, S., 355Sun, Y. G., 423Sun, Y., 355, 381Sundgren, J. E., 424Sung, M. M., 425Sunkara, M. K., 381Superfine, R., 223–224Suzuki, M., 40Suzuki, S., 280Svensson, K., 224Szilagyi, Z. S., 189–190

T

Tada, T., 149Taft, B. J., 382Tager, A. A., 279Tagerud, S., 151Takagi, D., 280Takemori, T., 304Talapin, D. V., 191Talneau, A., 304Tamiya, E., 381Tanaka, H., 304Tanaka, K., 40Tanaka, Y., 288, 304Tanase, M., 381Tang, T., 150, 424Tang, Y. Q., 279Tang, Y., 279, 382

Taniyama, T., 150Tans, S. J., 423, 425Tao, A., 381Tauber, R. N., 149Taylor, R. M. II, 223–224Tegenfeldt, J. O., 151Teherani, S., 150Tennant, D., 149Tenne, R., 426Tersoff, J., 224Tétreault, N., 383Thadani, N. N., 354Thapa, A. A., 465Thess, A., 424Thölén, A., 224Thomas, B. S., 489Thompson, G. B., 236Thornley, R. F., 5, 24, 40Thurn-Albrecht, T., 382Tian, Y., 278Tibbetts, G. G., 267, 280Tie, C., 280, 381Tilke, A., 150Timp, G., 149Tissier, M., 148–149Tiwari, A., 191Toader, O., 304–305Todoroki, S., 280Tokushima, K., 279Tomanek, D., 424Tombler, T. W., 150Tomoda, K., 304Toneguzzo, P., 355Tonucci, R. J., 304Toriyama, T., 150Trau, M., 304Travaglini, S. M., 190Treger, D. M., 151Tresco, P. A., 466Trimby, P. W., 75Tripp, C. P., 425Tseng, A. A., 149Tuck, K., 223Tung, L. D., 382Tuo, C. C., 149Tuominen, M. T., 382Turberfield, A. J., 305Tzou, Y., 191

508 Author Index

U

Uchic, M. D., 236Udod, A., 355Udod, I., 382Ueno, K., 40Ugarte, D., 424Uhlemann, S., 190Urban, J. J., 425Urquia, A., 305Usami, N., 426Ustunel, H., 424Utsunomiya, H., 465

V

Vacanti, J. P., 465Vaddiraju, S., 381Valden, M., 191Valdré, G., 190Valdré, U., 190van Benthem, K., 152, 190–191van Delft, F. C. M. J. M., 149van Langen-Suurling, A. K., 149Vanblitterswijn, C. A., 465Vandervelde, T. E., 235Vane, R., 224Vanhoenacker, D., 382Varela, M., 152, 154, 189–190Vartuli, C. B., 236Vaswani, H., 354Vayssières, L., 330–331, 356,

423, 426Vaz, C. A. F., 150Vazquez, J., 280, 424Velev, O. D., 382Velikov, K. P., 382Venables, J. A., 44–45, 75Venkatesan, T., 279, 387, 424Verheyen, C., 465Verschueren, A. R. M., 423Verschueren, R. M., 425Vescan, A., 150Vetter, J., 382Viau, G., 354–355Vicent, J. L., 150Villeneuve, P. R., 303–304Vines, R., 408Vinod, C. P., 278Vispute, R. D., 279

Vittori-Antisari, M., 190Vlasov, Y. A., 304Vogel, M., 150von Molnar, S., 151VonEhr, J. R., 223Vorst, A. V., 382Vos, W. L., 355–356Voyles, P. M., 189Vries, M. S. de, 280, 424Vuckovic, J., 304

W

Wada, K., 280Wade, T., 382Wagner, G. J., 224Wagner, R. S., 426Wahlström, E., 224Wakatsuki, K., 426Waldo, V., 100Walker, J. E., 235, 426Wall, J., 189Wallace, R. M., 223Wallenberg, L. R., 424Walter, E. C., 355Walther, P., 489Walton, I. D., 382Wang, C. M., 426Wang, C., 279Wang, D. Z., 356, 425Wang, F., 425Wang, G., 279Wang, G. -C., 424Wang, H., 235Wang, J. C., 424Wang, J. F., 279, 424Wang, J. Q., 40, 355Wang, J. X., 279Wang, L. G., 189–190Wang, M., 381Wang, N., 278–279Wang, P., 426Wang, Q. M., 426Wang, Q., 150Wang, R. M., 426Wang, S. W., 189Wang, S., 465Wang, W. K., 424Wang, X. D., 304, 425–426

Wang, X. F., 279Wang, Y. P., 279Wang, Y. Q., 279, 424Wang, Y. W., 279Wang, Z. L., 1, 150, 279, 304, 355–356,

381, 423–426Washburn, S., 223–224Wasserman, E., 426Watanabe, K., 236Watanabe, Y., 279Weber, E., 279, 356, 423Weber, M., 305Webster, T. J., 465–466Wegrowe, J. E., 382Wehrspohn, R. B., 280, 381Wei, G. B., 466Wei, L. W., 278Wei, Q., 381, 425Weill, A., 149Weimann, T., 150Weitz, D. A., 382Weller, D., 355Weller, H., 191Wells, O. C., 39Wen, J. G., 279, 356Wendorff, J. H., 381Werner, C., 466West, A., 40Westra, K. L., 150Weterings, J. P., 149Weyland, M., 191Whang, D., 150, 381Wharam, D. A., 150Wheeler, R., 236White, T., 278Whitesides, G. M., 355, 383Whitfield, J. F., 466Wijnhoven, J. E. G. J., 356Wiley, J. B., 40, 323, 355, 357, 382Wilkinson, C. D. W., 150Willard, M. A., 354Williams, K. A., 191Williams, P. A., 224Willick, G. E., 466Willmott, P. R., 424Winn, J. N., 303Winn, S. R., 466Wischnitzer, S., 39Wnek, G. E., 465

Wolf S., 149Wolf, E., 190Wolf, S. A., 151Wolfe, D. E., 424Wolke, J. G. C., 465Wong, E. M., 279Wong, E. W., 423Wong, S. S., 345, 356Wong, S., 382Woo, K. M., 465Word, M. J., 149Wright, E. R., 488–489Wu, C. T., 426Wu, C., 279Wu, D., 424Wu, J. J., 426Wu, J. S., 426Wu, P. F., 425Wu, Q., 278Wu, X., 489Wu, Y. Y., 423Wu, Y., 150, 240, 260, 279, 356,

381, 423Wu, Z. H., 425

X

Xi, X., 381Xi, Z. H., 279, 426Xia, Y. N., 423, 465Xia, Y., 304, 381, 383Xiao, G. Z., 465Xie, C., 279Xie, S. S., 279Xie, Y., 279Xin, X., 381Xing, Y. J., 279, 426Xiong, Y., 279Xu, C., 424Xu, D., 279, 382Xu, J. M., 279, 382Xu, L. B., 355Xu, L., 40, 355, 382, 425Xu, N., 278Xu, Y. J., 254, 279Xu, Y. Y., 279Xu, Z., 280, 381Xue, Z. Q., 426Xue, Z., 381

Author Index 509

510 Author Index

Y

Yablonovitch, E., 303Yahil, A., 190Yaish, Y., 424Yamada, Y., 426Yamaguchi, T., 149Yamamoto, J., 151Yamamoto, N., 304Yamamura, A., 381Yamasaki, K., 149Yamato, I., 426Yamazaki, Y., 150Yan, C. H., 426Yan, H. F., 260, 279Yan, H. Q., 279, 426Yan, H., 356, 381, 423Yan, W. F., 191Yan, X. Q., 279Yan, Y. Q., 423Yang, D. R., 279Yang, F., 465Yang, H. J., 355Yang, J., 279Yang, P. D., 260, 278–279, 423, 426Yang, P., 336, 355–356, 381, 383, 423Yang, R. S., 381, 423, 426Yang, S. M., 383Yang, Y., 280Yang, Z., 381Yao, J. L., 278Yao, K., 465Yao, L., 443, 465Yasko, A. W., 465Yaszemski, M. J., 465–466Ye, D., 424Yee, D., 150Yen, K., 465Yi, G. C., 191Yi, G. -R., 383Yin, J. S., 356Yin, Y. D., 423Yin, Y., 356, 381, 383Yiu, W., 279Yokoyama, K., 381Yonekura, J., 304Yoon, Y. -G., 425Young, R. A., 236Young, R. J., 236

Yu, D. P., 279, 424, 426Yu, M. F., 197, 207, 223–224Yu, M. H., 40, 151Yu, M., 356Yu, X., 381Yu, W., 356Yuan, H. J., 251, 279Yuan, X., 465Yun, W. S., 425Yuzvinsky, T. D., 277, 280

Z

Zaban, A., 279Zach, J., 190Zach, M. P., 355Zailer, I., 149Zakhidov, A. A., 40, 304, 355, 382Zardi, L., 489Zen, Z. F., 279Zeng, X. B., 279Zettl, A., 223, 280Zhan, J., 380Zhang, B. P., 426Zhang, B., 426Zhang, D., 150, 424, 426Zhang, F., 426Zhang, H. F., 426Zhang, H., 279Zhang, J., 243, 278, 279, 424, 426Zhang, L. D., 279, 382, 425Zhang, M. Q., 466Zhang, Q., 278Zhang, R. Y., 465–466Zhang, S. B., 279Zhang, S. L., 426Zhang, S., 224Zhang, X. Y., 262, 279Zhang, X., 278Zhang, Y. F., 278, 426Zhang, Y. Z., 465Zhang, Y., 278, 424–425Zhang, Z. Y., 191Zhang, Z., 424Zhao, L. X., 279Zhao, Y., 356Zheng, B., 424Zheng, G. F., 425Zheng, H., 381

Author Index 511

Zheng, M. J., 425Zheng, Y. F., 278–279Zhong, Z., 424–425Zhou, C. W., 150, 424Zhou, D., 235Zhou, W. L., 40, 150–151, 224, 355, 382Zhou, W. Y., 279Zhou, W., 1, 120, 382Zhou, Z. P., 279Zhu, H. G., 189, 191Zhu, J., 278Zhu, M., 224Zhu, Mo, 120, 151

Zhu, T., 150, 425Zhu, X. D., 466Zhu, X., 466Zhuang, W., 425Zierold, K., 489Zijlstra, Y., 304Zimmerman, T., 465Zioupos, P., 465Zollinger, K., 235Zubrzycki, W., 304Zukoski, C. F., 355Zuo, J. M., 426Zypman, F., 190

513

Subject Index

Page numbers followed by f and t indicate figures and tables, respectively.

A

Abbe’s equation and resolution, 1–9AFM, see Atomic force microscope /

microscopyAiry disk, 1–2Aligned rods, 289–290, 290fAll-Euler orientation component, 56–57Aluminum alloy analysis, friction stir

welded, 61–63, 62f–63fAluminum thin film analysis, 71–74,

72f–74fAnodic alumina membranes (AAMs), 358Astigmatism, 18–20, 19fAtmospheric molecular contamination

(AMC), 194Atomic force microscope lithography, 120Atomic force microscope / microscopy

(AFM), 298, 307, 428Auger electrons, 3, 8

B

Backscatterred electrons (BSE), 3, 6–7Band contrast (BC), 53Band slope (BS), 53

component of EBSD maps, 56Biomaterials, 427

nanofibers, 429–443, 431f–435f, 436t, 437f–442f, 444f

nanoparticles, 444–450, 446f–452f,453–454, 454f–457f

surface modification, 455–462, 459f–463fBioorganic specimens, high-resolution

SEM of, 32–33

Bone tissue engineering, polymer/hydroxyapatite nanoparticles for,444–450, 446f–452f

Boron nanowires, 261–262, 262fBragg mirrors, 282Bremsstrahlung x-ray signal, 8BSE, see Backscatterred electrons

C

Carbon nanotubes, 267–278; see alsoNanotubes

multiwalled, 268–270nanowires and, 237–278precision cutting, 276–278probing, 210, 212, 212f–213fsingle-walled, 270–276

Cathodoluminescence, 3, 8Characteristic X-rays, 3, 7–8Cold field emission (CFE), 14Colloidal crystal wires, nano-building

blocks from, 366–373, 367f–372f

Colloidal self-assembly and nanoparticles,306–354

Column parameters of scanning electronmicroscope, 16–21

aperture, 17–18, 18fastigmatism, 18–20depth of field, 20–21stigmation, 18–20

Computer chip, 91–94, 91f–92f, 94f–95f,94t

Condenser lens, 15

514 Subject Index

Contamination in SEM vacuum system,193–197, 194f–195f

preventing contamination, 196removing contamination, 196–197

Contamination writing, 193Continuum x-ray signal, 8Copper nanowires, 266, 267fCopper thin film analysis, by electron

backscattered diffraction, 68–71,69, 72f

CPD-processed biological tissuein high-resolution SEM studies, 36–39

Critical point drying (CPD), in specimenpreparation, 35

Cryo high-resolution scanning electronmicroscopy (cryo-HRSEM), see Cryo-HRSEM

Cryo-HRSEMbulk LT fractured yeast cells, 478–481,

479f–480fetching bulk samples for, 481–484,

482f–485fhistory, 472–473imaging of colloids, 487–488, 487f–488fin-lens, 473–476, 474f–475finstrumentation and methods, 473–488,

474f–480f, 482f–488fliquid water, ice, and vitrified water,

469–472, 470f–471flow-temperature scanned cryoimaging,

477–488, 478f–480f, 482f–488fnear-lens, 476–477, 476f–477fspecimen carriers used in, 477–488,

478f–480f, 482f–488ftandem recordings, 484–485, 485fterminology used in aqueous systems,

468–469Crystalline material, electron interaction

with, 48fCVD deposition with bitmap files, for nano-

fabrication, 230–231, 230f–232f

D

1D, 2D, and 3D inverse colloid crystalsfrom 3D colloid crystals, 373–377,374f, 376f–377f

Data analysisin EBSD, 54–61

Data analysis (cont.)EBSD maps, 55–61grain size analysis, 54–55

Data measurementband slope and band contrast, 53in electron backscattered diffraction,

54–61match unit, 52mean angular deviation, 53orientation, 52phase, 51

3D colloid crystalsinverse colloid crystals, 373–380, 374f,

376f–377f, 379f–380fsynthesis of, 360, 361f

Dehydration and air drying in specimenpreparation, 34

3D metal sphere colloid crystalsinverse colloid crystals, 378–380,

379f–380f3D nanofibrous poly(L-lactic acid)

(PLLA), 427, 430–431, 433–436

surface modification, 458–462,459f–463f

3D nanofibrous scaffolds, 427, 430–431,433–440, 440f–442f, 458–462,459f–463f

predesigned macropores, 437–440,440f–442f

1D nanostructurescatalyst-involved vapor-liquid-solid

growth process, 415–416, 417fchemical synthesis, 386t, 387chemical vapor deposition, 386t, 387conjunctional synthesis using

lithographically patterned,388–389, 389f

1D metal oxide, 389–414growth mechanisms, 415–420,

417f–419f, 421fhierarchical oxide, 408–414, 409f,

411f–416foxide nanobelt, 397–408oxide nanotube, 391–396, 392f–393f,

396foxide nanowires, 389–391physical vapor deposition method,

385–388, 386t

Subject Index 515

1D nanostructures (cont.)self-catalyzed growth, 420, 422f,

429synthesis and fabrication of, 384–389,

385f, 386tvapor phase deposition method,

385–389, 386t, 389f1D photonic crystals, see Bragg mirrors2D photonic crystals, 289–293

aligned rods, 289–290, 290fdeep holes, 291, 291ffibers, 291–292, 292fmonolayer spheres, 292–293, 293fPC slabs and waveguides, 289, 290f

3D photonic crystals, 293–298cubic lattice, 296–297, 297f2D-ordered helix nanowires, 297–298,

298finversed opal structure, 294, 295fopal structure, 293–294woodpile, 295–296, 296f

DualBeam applications fornanofabrication, 225–235

1D wurtzite semiconductingnanostructures, 384–423

1D ZnO nanostructuresSn-catalyst orientation on growth of,

418–420, 419f, 421f

E

E-beam nanolithographyaccelerating voltage, 135applications, 143–148automated stage, 127beam blanking, 126beam current, 135–136biological applications, 147–148configuration, 134–136design guidelines, 133–134digital interface, 127etching, 140image signal output, 126magnetic nanodevices, 146–147materials and processing preparation,

127–132microscope setup, 136–137nanosensors, 145–146nanotransistors, 143–145

E-beam nanolithography (cont.)pattern checking and common errors,

140–143, 140f–142fpattern generation process, 132–133resists, 128–132scanning electron microscopy,

120–148self-assembled monolayers, 132SEM connections, 124–127SEM lithography system, 120–124spin coating technique, 132substrate, 127–128working distance, 135xy interface and beam current reading,

124EBSD, see Electron backscattered

diffractionEBSD maps component

all-Euler orientation, 56–57band slope, 56in data analysis, 55–61grain boundary, 60grain size coloring, 59inverse pole figure, 57–58pattern quality, 56special boundary, 60–61texture, 58–59

Electrochemical step edge decoration(ESED), 312

Electron backscattered diffraction (EBSD)technique

aluminum alloy analysis by, 61–63,62f–63f

aluminum thin film analysis by, 71–74,72f–74f

angular resolution of, 75applications, 61–74band contrast, 53band slope, 53copper thin film analysis by, 68–71, 69,

72fdata analysis, 54–61data measurement, 51–53Fe-Al intermetallic alloy analysis by,

63–64, 63f–65fhistory, 41–46limitations and future, 74–75match unit, 52mean angular deviation, 53

516 Subject Index

Electron backscattered diffraction (EBSD)technique (cont.)

platinum thin film analysis by, 64,66–68, 66f–68f

from quartz, 49fspatial resolution of, 74speed of, 75technique, 7working, 46–51

Electron beam induced deposition (EBID),193, 194f–195f, 198, 206–208, 210

Electron beam lithography, see E-beamnanolithography

Electron beam resists, 128–132negative electron, 130–132positive electron, 129–130resolution and intrinsic properties,

128–129Electron beam specimen interaction, 2–4

elastic interactions, 2inelastic interactions, 2

Electron channeling patterns (ECP), 45Electron energy loss spectroscopy

(EELS), 154, 156–157, 173–176,187–188, 238

Electron generation and acceleratingvoltage, 103–105

Electron gunsfield emission guns, 13–15lanthanum hexaboride guns, 13tungsten electron guns, 9–12

Electron lenses, 15–16condenser lenses, 15, 16fobjective lenses, 15–16, 17f

Energy dispersive x-ray (EDX)microscopy, 238, 309

Energy dispersive x-ray spectroscopy (EDS)artifacts, 85–87, 86f–87fcomputer chip, 91–94, 91f–92f,

94f–95f, 94tMonte Carlo modeling of

nanomaterials, 87–91nanoparticles and submicron particles,

95, 97–99, 97f–99fnanowire, 94–95, 96fparameters, 81–85in SEM, 76–100signal detection, 79, 80f, 81–82signal generation, 77–79

Environmental SEM (ESEM), 429Euler angle rotations, 52Everhart-Thornley (ET) detector, 5

F

Faraday cage, 5, 7FIB milling for nanofabrication, 230–231,

230f–232fField emission guns, 13–15

cold field emission, 14electron guns, 13–15thermal field emission, 14

Field emission scanning electronmicroscope (FESEM), 4

Focused ion beam (FIB) technology, 120,124, 193

applications for nanofabrication, 225–235Freeze drying in specimen preparation,

34–35Friction stir welded aluminum alloy,

61–63, 62f–63f

G

Germanium (Ge) nanowires, 260–261, 261fGlue wire-modified templates

nanotubes from, 362–363, 363f–364fGold (Au) nanowires, 262, 263fGrain boundary (GB) component of

EBSD maps, 60Grain size analysis, 54–55Grain size coloring component of

EBSD maps, 59

H

High-Resolution SEM (HRSEM), 238, 240bioorganic specimens, 32–33CPD-processed biological tissue, 36–39

HRSEM, see High-Resolution SEMHydrogen bonding, 469–472, 470f–471fHydroxyapatite nanocomposite scaffold

nanoparticles, 444–450, 446f–452f

I

Ice, 469–472, 470f–471fIC probing, 216–218, 219f

Subject Index 517

III–V compound semiconductorsnanowires, 237–250

II–VI compound semiconductorsnanowires, 250–259

Image formationscanning coils, 22–23, 23fin scanning electron microscope, 22–29,

23fsecondary electron detector, 23–27,

24f–25fsignal generation, 22specimen composition, 28, 28fspecimen magnification, 29specimen topography, 28–29, 29f

In-lens cryo-HRSEM, 473–476, 474f–475f

Inverse colloid crystals3D colloid crystals, 373–377,

374f, 376f–377f3D metal sphere colloid crystals,

378–380, 379f–380fInverse pole figure (IPF) component

of EBSD maps, 57–58, 58fIron nanowires, 265–266, 266f

K

Kikuchi patterncalcite cleavage, 42firon, 43fmica, 43f

L

Lasers, 286–287La-stabilization of supports, 182–183,

183fLiquid water, 469–472, 470f–471fLow kV scanning electron microscopy

accelerating voltage, 103–105carbon-coated formvar TEM grid

image, 113, 114fcoated filter sample image, 116, 118felectron generation, 103–105electron source, 105timage on Al stub, 113, 114freasons for using, 105–112secondary electron images, 101, 102f,

106–108, 107f–112f, 112Si wafer image, 113, 114f

Low kV scanning electron microscopy(cont.)

uncoated filter sample image, 116, 118funcoated latex spheres image, 116, 117fusing in practice, 112–119

Low temperature (LT)-HRSEM, 486,486f, see Cryo-HRSEM

Low-temperature scanned cryoimagingspecimen carriers used in, 477–488,

478f–480f, 482f–488fLow-temperature SEM history, 472–473

M

Magnetic nanodevices, 146–147Magnetic nanoparticles, 185Mean angular deviation (MAD), 53Mechanical probing of nanostructures,

207–208, 208f–209fMEMS grippers, see

Microelectromechanical systemsMesoporous metal nanostructures,

322–328, 323f–328fMetal coating in specimen preparation,

35–36Metallic nanoparticles, 307–321, 308f–310f,

312f–318f, 318t, 320f–321fMicroelectromechanical systems (MEMS)

grippers, 204–205Micromanipulation system in SEM,

298–300, 301fMicroscope-based lithography

basics of, 120–122electron sources, 120–122linewidths, 121–122

Microspheresdiamond architectures of, 301–302, 302f2D lattices of, 300–301woodpile structure, 302, 303f

Monte Carlocomputer chip study, 91–94, 91f–92f,

94f–95f, 94tmodeling of nanomaterials, 87–91nanoparticles and submicron particles

study, 95, 97–99, 97f–99fnanowire study, 94–95, 96fsimulations, 88f–90f, 326

Multiwalled carbon nanotubes (MWNTs),193, 268–270

518 Subject Index

N

Nanobows, 402, 403fNano-building blocks

colloidal crystal wires, 366–373,367f–372f

3D colloid crystals synthesis, 360, 361f,373–377, 374f, 376f–377f

electrochemical deposition, 360, 361ffabricated through templates, 357–380inverse colloid crystals from 3D colloid

crystals, 373–377, 374f, 376f–377fmaterials and methods, 358–360, 359f,

361fnanotubes from glue wire, 362–363,

363f–364fnanowires from porous templates, 361,

362fnanowires with structured tips, 363,

365–366, 365f–366fporous wires, 366–373, 367f–372fSEM and TEM observation, 360

Nanocatalysis, 181–182, 182fNanocombs, 420, 422f, 429Nanocrystalline oxides

magnetic oxides, 341–347, 341f–346foptical applications, 329–330, 329f,

331f–340f, 332–339, 341Nanoelectromechanical systems (NEMS),

143, 193Nanofabrication

automation for nanometer control, 233,233f–234f

CVD deposition with bitmap files, 230–231, 230f–232f

with electron beam, 231, 232fFIB and DualBeam technology

applications for, 225–235FIB milling, 230–231, 230f–232fwith ion beam, 226–230, 227f–230f

Nanofibers3D nanofibrous scaffolds, 437–440,

440f–442felectrospinning, 441–443, 444fphase separation, 429–436, 431f–435f,

436t, 437f–439fNanofibrous PLLA scaffolds with gelatin

surface modification, 458–462, 459f–463fNanohelixes, 405–408, 406f–407f

Nanolithography, 137–143Nanomanipulation

cantilevered probes, 204end effector, 200, 201f–202f, 202MEMS grippers, 204–205nanomanipulators, 197–200nanomaterials engineering, 192–223probes or nanoprobes, 197–200tungsten probe, 200, 202–203,

202f–204fNanomanipulators, 197–200

applications for, 205–223carbon nanotubes probing, 210, 212,

212f–214felectrical probing, 210–215, 211f–215fIC probing, 216–218, 219fmechanical probing of nanostructures,

207–208, 208f–209fnanopositioning, 205–207semiconductor coupon extraction, 218,

220f–222fin situ TEM manipulation, 218–219,

222f–223fZnO nanowires with Mn-coated tips

probing, 212, 214, 215f–218fNanomaterials

backscattering detector and EBSD in,41–74

computer chip, 91–94, 91f–92f,94f–95f, 94t

engineering, 192–223Monte Carlo modeling of, 87–91nanoparticles and submicron particles,

95, 97–99, 97f–99fnanowire, 94–95, 96fx-ray microanalysis in, 76–100

Nanometer control automation, 233,233f–234f

Nanoparticlescolloidal self-assembly and, 306–354controlled delivery of bioactive factors,

453–454, 454f–457fmetallic, 307–321, 308f–310f,

312f–318f, 318t, 320f–321fpolymer/hydroxyapatite nanocomposite

scaffold, 444–450, 446f–452fpreparation of, 307properties of, 306submicron particles, 95, 97–99, 97f–99f

Subject Index 519

Nanoporous gold, Monte Carlo simulationof, 326

Nanoporous metal nanostructures,322–328, 323f–328f

Nanopositioning, 205–207Nanoprobes, 197–200Nanopropellers and junction arrays,

408–410, 409fNanoribbons, 412–413, 413f–415fNanoring, 402–405, 404fNanosaws, 420, 422f, 429Nanoscale

direct fabrication of, 234, 235fphase separation, 187–188, 188fstructures, 234, 235f

Nanosensors, 145–146Nanosphere controlled delivery of bioactive

factors, 453–454, 454f–457fNanospiral and nanosprings, 400–402, 401fNanostructural research, cryotemperature

stages in, 467–488Nanostructured semiconductor, 347–353,

348f–354fNanotransistors, 143–145Nanotubes, 177–178, 180–181, 180f;

see also Carbon nanotubesglue wire, 362–363, 363f–364fnanowires with structured tips from,

363, 365–366, 365f–366fNanowires, 94–95, 96f

boron, 261–262, 262fcarbon nanotubes and, 237–278copper, 266, 267felemental nanowires, 260–267germanium, 260–261, 261fgold, 262, 263fIII–V compound semiconductors,

237–250II–VI compound semiconductors,

250–259iron, 265–266, 266fnanotube-modified templates, 363,

365–366, 365f–366fnickel, 263–264, 265fporous templates, 361, 362fSEM applications, 237–278silicon, 260, 260fsilver, 262–263, 264f

Nickel nanowires, 263–264, 265f

O

Objective lenses, 15–16, 17fOptical applications of nanocrystalline

oxides, 329–330, 329f, 331f–340f,332–339, 341

Optical fiber, 285–286Optical microscopy resolution limit, 1Orientation imaging microscopy (OIM), 46Oxide nanobelt, 397–408

nanohelixes, 405–408, 406f–407fnanoring, 402–405, 404fnanospiral and nanosprings, 400–402,

401fZnO nanobelts, 398–400, 399f

Oxide nanotube, 391–396ZnO microtubes and nanotubes,

391–395, 392f–393f, 396fZnO nanotube arrays on ZnO cages,

393–394, 395f–396fOxide nanowires, 389–391

P

Pattern processing in e-beamnanolithography, 137–143

coating and liftoff, 137–138developing, 137evaporation, 139–140, 139fsputtering system, 138–139, 139f

Pattern quality component of EBSD maps, 56

PC slabs and waveguides, 289, 290fPhotonic band gap (PBG), 282Photonic crystals (PCs), 281–303

applications of, 284–289classification, 282devices, 281–3032D photonic crystals, 289–2933D photonic crystals, 293–298fabricated by micromanipulation,

300–302fabrication in SEM, 298–303lasers, 286–287optical fiber, 285–286, 291–292, 292fphotonic integrated circuit, 287–289physical background and band gaps of,

282–283SEM imaging of, 289–298waveguides, 284–285

520 Subject Index

Photonic integrated circuit, 287–289Photonic stop band, 282Platinum thin film analysis by

electron backscattered diffraction, 64,66–68, 66f–68f

PLLA, see 3D nanofibrous poly (L-lacticacid)

Polymer nanocomposite scaffoldnanoparticles, 444–450, 446f–452f

Porous membranes fabrication of,358–360, 359f

Porous polycarbonate membranes (PPMs),358

Porous silicon membranes (PSMs), 358Porous templates, nanowires from, 361, 362fPorous wires, nano-building blocks from,

366–373, 367f–372fPrecision cutting carbon nanotubes,

276–278

R

Raman spectroscopy, 238Resolution and Abbe’s equation, 1–9Robotic manipulators, 192

S

Scanning electron microscope/microscopy (SEM), 1, 10f,428–429

applications to carbon nanotubes andnanowires, 237–278

atmospheric molecular contamination,193

backscattering detector and EBSD in,41–74

column parameters, 16–21configuration of, 9–32connections, 124–127contamination issues associated with,

193–197E-beam nanolithography and, 120–148electron guns, 9–15electron lenses, 15–16electron sources, 121tenergy dispersive x-ray spectroscopy in,

76–100fundamentals of, 1–39

Scanning electron microscope/microscopy(SEM) (cont.)

image formation in, 22–29interface, 49flithography system, 122–124low kV, 101–119micromanipulation system in, 298–300,

299f, 301fmodels of, 124, 125tphotonic crystals fabrication in,

298–302photonic crystals imaging, 289–298resolution and Abbe’s equation, 1–9robotic manipulators in, 192sample orientation in, 47fsecondary electrons used in, 5specimen preparation, 32–39vacuum system, 29–32

Scanning transmission electronmicroscope/microscopy (STEM),77, 120, 127

applications, 177–188chromatic aberration, 158, 160components, 1553D imaging, 176–177, 178f–179ffuture directions, 188–189geometric aberrations, 158–160image contrast, 163–173, 164f–166f,

169f–170f, 172fimaging in, 155–173La-stabilization of supports, 182–183,

183flens aberrations, 157–160magnetic nanoparticles, 185nanocatalysis, 181–182, 182fnanoscale phase separation, 187–188,

188fnanostructure characterization,

152–189nanotubes, 177–178, 180–181, 180fprobe formation, 157–163resolution in, 156semiconductor nanocrystals, 183–185,

184fspectroscopic imaging, 173–176ZnO nanorods, 186–187, 186f–187f

Scanning tunneling microscope/microscope (STM), 120, 298

Schottky field emission gun, 105

Subject Index 521

Secondary electrons, 3–6images, 101, 102f, 108, 108f–112fSiO2 nanoparticles images, 108,

108f–110fsurface topography and position of

detector, 5–6Ti fracture images, 108, 110f–112f

Selected area channeling patterns (SACP),43–44

Selected area electron diffraction (SAED),238

Self-assembled monolayers (SAMs), 132

Semiconductor, see Nanostructuredsemiconductor

Semiconductor coupon extraction, 218,220f–222f

Semiconductor nanocrystals, 183–185,184f

SEM lithography system, 122–124alignment, 123–124CAD interface, 123connections, 124–127vector or raster writing, 122–123writing speed, 123

Silicon nanowires (SiNWs), 260, 260fSilver nanowires, 262–263, 264fSingle-walled carbon nanotubes (SWNTs),

270–276Special boundary component of EBSD

maps, 60–61Specimen carriers

bulk LT fractured yeast cells, 478–481,479f–480f

etching bulk samples, 481–484, 482f–485f

imaging of colloids, 487–488, 487f–488f

low temperature-HRSEM, 486, 486flow-temperature scanned cryoimaging,

477–488, 478f–480f, 482f–488ftandem recordings, 484–485, 485f

Specimen current, 9Specimen preparation

bioorganic, 32–33critical point drying, 35dehydration and air drying, 34fixation and drying methods, 33–34freeze drying, 34–35

Specimen preparation (cont.)metal coating, 35–36in scanning electron microscope, 32–39

Spin coating technique, 132Sputtering system, 138–139, 139fSuperconducting quantum interference

device (SQUID), 147Surface modification

biomaterials, 455–462, 459f–463fnanofibrous PLLA scaffolds with

gelatin, 458–462, 459f–463ftissue engineering, 457–458

Synthetic polymeric biomaterials (SPM),427

T

Texture component (TC) of EBSD maps,58–59

Thermal field emission (TFE), 14Thermoelectric materials

and nanostructured semiconductor,347–353, 348f–354f

Tin (Sn)-catalyst orientation1D ZnO nanostructures, on growth of,

418–420, 419f, 421fTissue engineering, surface modification

for, 457–458Transmission electron microscope /

microscopy (TEM), 76, 193, 238,307

Transmitted electrons, 8Tungsten electron guns, 9–12

burnt-out filament, 11, 12ffalse peak, 11, 12fsaturation point, 11, 12f

V

Vacuum systemdiffusion pump, 30–31ion pumps, 31mechanical pumps, 30in scanning electron microscope,

29–32turbo pumps, 31–32

Vitrified water, 469–472, 470f–471f

W

Waveguides, 284–285

522 Subject Index

X

X-ray diffraction (XRD), 307X-ray microanalysis; see also Energy

dispersive x-ray spectroscopyin nanomaterials, 76–100

X-ray photoelectron spectroscopy (XPS),238

X-ray powder diffraction (XRD), 238X-ray signal generation, 77–79

Z

ZnOnanobelts, 398–400, 399f, 417–418,

418fnanorods, 186–187, 186f–187f,

417–418, 418f

ZnO (cont.)nanotube arrays on ZnO cages,

393–394, 395f–396fnanowires with Mn-coated tips probing,

212, 214, 215f–216fZnO microtubes and nanotubes

growth mechanism of, 394–395, 396fZnO nanoarchitectures, 410–415,

411f–416fcircular architectures, 410–412,

411f–412fcrossed nanoribbon architectures, 413,

415fswitching growth, 410–412, 411f–412fY shape single-crystal nanoribbons,

412–413, 413f–414fzigzag chain, 414, 416f