development of lpp-euv source for hvm euvl · 2013. 3. 13. · our final goal of gl-200e is 250w...
TRANSCRIPT
Development of LPP-EUV source for HVM EUVL
Junichi Fujimoto*1, Toru Suzuki, Hiroaki Nakarai, Tsukasa Hori, Satoshi Tanaka, Yukio Watanabe, Yasufumi Kawasuji, Takeshi Ohta, Tamotsu Abe, Hakaru Mizoguchi*1
*1 Gigaphoton Inc. :400 Yokokura shinden,Oyama, Tochigi,JapanKomatsu Ltd. : 3-25-1 Shinomiya, Hiratsuka, Japan
Outline1. Introduction
2. Engineering Test source 1st Generation (ETS) device: System experiment
– Operation Data
10Hz device: Critical issue experiment– Vaporization experiment– Ionization experiment– Magnetic mitigation – Pre-pulse and high CE
3. HVM EUV light source Product roadmap 2nd Generation device: Development status
– Configuration– Latest status
4. Summary
Outline1. Introduction
2. Engineering Test source 1st Generation (ETS) device: System experiment
– Operation Data
10Hz device: Critical issue experiment– Vaporization experiment– Ionization experiment– Magnetic mitigation – Pre-pulse and high CE
3. HVM EUV light source Product roadmap 2nd Generation device: Development status
– Configuration– Latest status
4. Summary
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P4
Type LPP
Power (at present) peak/average 104W/21W
Plasma No electrode
Mitigation Pre pulse + Magnet
Life limitation ( several 1000 hr )
Remark ・Theoretically no limit・Engineering works still to be done
LPP:CO2 laser and Sn source High power pulsed CO2 laser Magnetic field plasma mitigation Pre-Pulse plasma technology
EUV sources
Outline1. Introduction
2. Engineering Test source 1st Generation (ETS) device: System experiment
– Operation Data
10Hz device: Critical issue experiment– Vaporization experiment– Ionization experiment– Magnetic mitigation – Pre-pulse and high CE
3. HVM EUV light source Product roadmap 2nd Generation device: Development status
– Configuration– Latest status
4. Summary
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P6
ETS system configuration
System layout
■ EUV chamber
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P7
SPIE 2010(Feb.2010)
EUV Symposium(Oct.2010)
Latest Data(Feb,2011)
EUV power ( @ I/F) 69 W 104 W 42 W
EUV power ( clean @ I/F) 33 W 50 W 20 W
Duty cycle 20 % 20 % 5%
Max. non stop op. time >1 hr <1 hr >7 hr
Average CE 2.3 % 2.5 % 2.1%
Dose stability :simulation (+/- 0.15%) -Droplet diameter 60mm 60mm 30mm
CO2 laser power 5.6 kW 7.9 kW 3.6kW
System operation Data ( ETS device)System operation Data ( ETS device)
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P8
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5
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0 1 2 3 4 5 6 7 8
Time [H]
EU
V p
ower
@ IF
cle
an [W
]System operation result on ETS
Long time system operation demonstrated Operation duration: 7 hours Droplet 30 mm diameter Full repetition rate: 100 kHz In burst clean power: 20W (average)
25W (max)
Conditions;Control: Droplet position control ON, EUV energy control OFFCO2 laser = 3.6kW @ 100kHzDuty=5% (50msecON、950msecOFF)
25W= CE 2.6%20W= CE 2.1%
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P9
Conclusion of ETS device experiment“ETS experiment clarified 3 key challenges are essential”
CE (Conversion Efficiency) improvement Debris mitigation = Stability and size of droplets CO2 laser load = power x duty
- Stable and small droplet- high power CO2 laser- the best plasma creation
main-pulse
Pre-pulseCO2 laserpre-pulse laser
Droplet generator
Outline1. Introduction
2. Engineering Test source 1st Generation (ETS) device: System experiment
– Operation Data
10Hz device: Critical issue experiment– Vaporization experiment– Ionization experiment– Magnetic mitigation – Pre-pulse and high CE
3. HVM EUV light source Product roadmap 2nd Generation device: Development status
– Configuration– Latest status
4. Summary
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P11
Collector mirror protect Concept
Droplet
(liquid)
Crashed-mist
(liquid)Plasma
(gas)
mist size <300mm,
100% vaporization to atom
droplet <20mm
CO2 laser irradiation
100% ionization
Guided ionAtom
• scattered by ion
• Charge exchange
Ions with low energy trapped by B field
Atoms tapped by charge exchange with ions
pre-pulse main-pulse
No Large Fragment s
atom 0 ion 0
All Sn atoms should be ionized.
① Magnet field is effective for guiding ions not to going to mirror
② All Sn fragments and atoms are needed to be ionized
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P12
Critical issue investigation with 10Hz device
- Double pulse optimization- Debris mitigation mechanism- Higher CE investigation
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P13
Setup configurations
Back
illuminator
CCD
camera
EUV
sensor
Drive laser
Tin dropletLIF
camera
Corrector mirror
Intermediate focus
EUV/Debris Measurementport
LIF Laser
- Droplet diameter: 10 to 60 micron meter- Shooting rate: up to 10 Hz- Observe what’s happen in the vessel?
- Shadow camera & LIF: droplet & its behavior after laser shooting- Driver laser: refraction power & distribution
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Proper pre-pulse conditionDroplet shooting scheme
a) without main-pulse laser
pre-pulse irradiation TimeMain pulse laser/ EUV emission after EUV emission
b) with main-pulse laser
Back
illuminator
CCD
camera
EUV
sensor
Drive laser
Tin dropletLIF
camera
EUV/DebrisMeasurementport
Corrector mirror
Intermediate focus
EUV/DebrisMeasurementport
Back
illuminator
CCD
camera
EUV
sensor
Drive laser
Tin dropletLIF
camera
EUV/DebrisMeasurementport
Corrector mirror
Intermediate focus
EUV/DebrisMeasurementport
Perfectvaporization!
100micron
20 micron droplet
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Atom measurement by LIF - 2
3 mm
①w/o CO2 laser ②w/ CO2 laser
Laser
Remaining atoms was estimated by subtractingw/ CO2 vs w/o CO2 measurement
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P16
0
0.2
0.4
0.6
0.8
1
1.2
0 0.25 0.5 0.75 1Io
n nu
mbe
r (ar
b. u
nit)
Magnetic Field (arb. unit)
Ion Measurements by Faraday cups
Amount of ion is measured by Faraday cup
>99% Sn go to Sn ion catcher !!
Faraday cup 1 @ mirror
position
Magnetic Field
EUV CollectorMirror position
Drive laser
Amount of ions going to Sn ion
catchers
Amount of Sn ions not going to ion catchers
Faraday cup 2
@ Sn ion catcher position
Proto / Pilot
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P17
Results Summary Sn molecule measurement results
pre-pulse laser + CO2 laser irradiation : ionized 93% of Sn Only pre-pulse laser irradiation : ionized 3% of Sn
Thistime
ProtoCondition
Repetition rate Hz 10 100k
Experimental Condition: Same as proto machine
onlyPre-pulse Irradiation
pre-pulse laser + CO2 laser Irradiation
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Estimated deposition and cleaning rates Deposition rate: 1.2 nm / Mpls* Cleaning rate: 4.4 nm / Mpls**
Clean operation feasibility proven
*Estimation of Sn atom dispersion: isotropic
** Estimation based on experimental data under pilot conditions
Cleaning rate
CO2 Laser Energy [a.u.]
CO2 energy at final proto / pilot
Clean operation is proven by test data with ETS and 10Hz source
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P19
Conversion Efficiency vs CO2 Laser Intensity
After CE optimization 3.3% → 3.8% (@ pilot condition)
Final Target
After Optimization
Beforeoptimization
New champion data of CE = 3.8% (Aug.2011)
CO2 intensity (a.u.)
Outline1. Introduction
2. Engineering Test source 1st Generation (ETS) device: System experiment
– Operation Data
10Hz device: Critical issue experiment– Vaporization experiment– Ionization experiment– Magnetic mitigation – Pre-pulse and high CE
3. HVM EUV light source Product roadmap 2nd Generation device: Development status
– Configuration– Latest status
4. Summary
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P21
Clean power roadmap
* Against hemisphere (Calculation base)** w/o SPF
500
350
250
100
0
100
200
300
400
500
600
ETS GL200E GL200E+ GL400E
Out
put a
fter S
PF (W
att)
Drive laser power kW 10 23 33 40Conversion efficiency % 3.0 5.0 5.0 6.0C1 mirror collector angle sr 5.5 5.5 5.5 5.5 efficiency* % 74 74 74 74C1 mirror reflectivity % (50) 57 57 57Optical transmission % 95 95 95 95SPF (IR, DUV) % N/A** 62 62 62Total EUV power (after SPF) W 100 250 350 500
GL200E+ GL400EEUV model ETS GL200E
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GL200E system overview
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GL200E proto constructed at Hiratsuka facility
Main-AMP2
Main-AMP1
BDU3
BDU4
Pre-AMP
OSC
Pre-AMP
CO2 laser OSC+Pre-AMP
CO2 laser Main-AMP
EUV-chamber
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P24
Real 1st EUV light was observed on proto ! Max EUV energy =0.182mJ, CE=0.6% (Energy 18W equiv.@100kHz)
Operation conditionsDuty=30% (0.3 sec ON (300pls DL / 30,000pls Laser) , 0.7sec OFF)
- CO2 laser power = 3.0kW 100kHz @ Plasma- Pre-pulse laser power = 0.1kW 100kHz @ Plasma- DLG = 33μm 1kHz
0.3s 0.7s
Number of Laser pulses (100kHz)
Number of Droplet pulses (1kHz)
Miss hit remain, seems by instability of DL acceleration voltage
Improvement with plasma shield
Rate of success hit
= 6.3% (=19 / 300)
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EUV Output Power vs CO2 Input Power
We achieved 2.5mJ EUV output which correspond to 250W clean power
0
50
100
150
200
250
300
0
0.5
1
1.5
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2.5
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0 50 100 150 200 250 300EUV Clean Power Equivalent to 100kHz
Operation (W)
EUV Clean Energy (mJ)
CO2 Laser Pulse Energy (mJ)
Proto Target
Pilot Target
Condition for High CE
Conventional condition
●
■
Outline1. Introduction
2. Engineering Test source 1st Generation (ETS) device: System experiment
– Operation Data
10Hz device: Critical issue experiment– Vaporization experiment– Ionization experiment– Magnetic mitigation – Pre-pulse and high CE
3. HVM EUV light source Product roadmap 2nd Generation device: Development status
– Configuration– Latest status
4. Summary
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P28
Summary 1st generation integrated setup LPP source (ETS) and 10 Hz device:
One order smaller fragment (droplet size reduction from 60mm to 30 mm) extends operation time to 7 hours under 20W(clean power @I/F, 5%duty) level operation.
10Hz experiment proved debris mitigation concept experimentally. That is; proper pre-inonization and main ionization make >93% ionization. This technology enables clean light source with combination with magnetic field.
10Hz experiment clarify CE (Conversion Efficiency) improvement, with <20mm droplet we found the region where CE >3.8% and perfect vaporization are simultaneously possible.
2st generation LPP source (GL200E): Concept of design and outline is reported. Our final goal of GL-200E is 250W and the feasibility is supported by high CE
experimental data. We observed 1st EUV light on proto source with 18W equivalent level at
present. Next target is 50W level demonstration until 1Q 2012.
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P29
Acknowledgments
Thanks to fund
This work was partly supported by the New Energy and Industrial Technology Development Organization NEDO Japan, and Komatsu Ltd.
■ Copyright 2011 GIGAPHOTON INC. all rights reserved. GR11-241 2011 EUVL symposium P30xxxxxxxxxx P30 P30