dft basic introduce draft 1029 · 2017-04-20 · way of chips to be tested the internals of the...
TRANSCRIPT
可测性设计(DFT)基本知识及流程介绍
主讲人 : Kevin HeOct, 2016
Copyright © Infotmic. All Rights Reserved.
AgendaAgenda
Manufacturing Defect1
Manufacturing Testing2
What is DFT and Why DFT3
Describe Different DFT Techniques4
DFT Fl I t d5 DFT Flow Introduce5
What Is a Manufacturing Defect?• Physical Defect:
A on‐chip flaw introduced during fabrication or packagingf i di id l ASIC h k h d i lf iof an individual ASIC that makes the device malfunction.
ShortCircuit
CommonPhysicalD f
Circuit
OpenCircuit
Defects
Transistor OxideTransistorAlways ON
OxidePinholes
Physical Defects in CMOS
OutputShorted
to Logic 1
POWER
to Logic 1
IN OUT
InputOpen
Pull-DownTransistor
IN
TransistorAlways ON
GROUND
Manufacturing Test• There is no perfect IC fabrication process! Physical defects may exist within thePhysical defects may exist within the manufactured chip.
A d f t l i l f lt h th• A defect may cause a logical fault , or changes the parametric properties of the IC and/or negatively p p p / g yaffects the product’s reliability.
Manufacturing Test(cont)
TestSTIL 1.0;
PackagedIC Chips
Program
p
Pass
ATE
Fail
Manufacturing Test(cont)
Structural Functionalmeasurements
++ ++
Logical Differences
Timing &Performance
Current &Voltage
Test Automation
Test Automation• Automated Test Equipment is essential part of manufacturingof manufacturing
• Highly automated throughput‐oriented g y g pequipmentI t t 1M$ t• Investment > 1M$ per system
• Multiple systems at each manufacturing siteMultiple systems at each manufacturing site
ATE Example: Agilent 93000
mainframe
workstation
t th dtesthead
ATE Example: Agilent 93000 (cont)• Workstation
– Test software, interface and control of mainframeTest engineer computer– Test engineer computer
• Mainframe
– Test computer– Power sources– Measurement instruments
h d• Testhead
– Device Interface Board (DIB) to DUT– Sensible measurement equipment kept close to DUT– Sensible measurement equipment kept close to DUT
Probers
Probecard
• Robotic machine that manipulates the wafers• Connects individual chip to probe card needles• ATE is connected for measurementATE is connected for measurement
Manufacturing Test(cont)• A speck of dust on a wafer is sufficient to kill chip• Manufacturing testers are very expensive
• Think about it at beginning phase, careful plan about chip performance requirment, ATE, Load Board..
• DFT designer pay attention to it during dft implement, such as chain length, memory instance number per test step
• ATPG efficiency• selection of test vectorsselection of test vectors
AgendaManufacturing Defect1
Manufacturing Testing2
What is DFT and Why DFT3
Describe Different DFT Techniques4
DFT Fl I t d5 DFT Flow Introduce5
Test DefinitionTestTest• checking a manufactured object for matching with a set of
ifi d ispecified properties.
Test Spec• A set of product features and related check rules required toA set of product features and related check rules required to guarantee product quality and product reliability.
Testability h ff f d l d li i• the effort for test development and test application.
Rules for Detecting Faults• Rules of the Game:T t t th DUT i l ll dTester access to the DUT is only allowedthrough its primary I/O ports because Internal g p y pProbing of IC Too Costly!
Way of Chips to be TestedThe internals of the integrated circuit is not accessible.
test vectors are applied to the inputsO t t d t t d lOutputs are compared to expected valuesProcess is automatized using an ATE
DUTCircuit
ResponseDigital InputPatterns
CorrectResponse
101 101100Device UnderTest (DUT)
Digital Circuit
Comparator110
010
101111
010
101110
010
100
.
...
.
.
Result ofTest
010 010 010
Design For Testf h d h h• DFT refers to those design techniques that
– Make test generation and test application cost‐effective– Make extra design effort in making an IC testableg g– Involve inserting or modifying logic, and adding pins– Help design the chip to increase observability and controllability
• If each register could be observed and controlled test• If each register could be observed and controlled, test problem reduces to testing combinational logic between registersregisters
• Logic blocks could enter test mode where they generate t t tt d t th lt t ti lltest patterns and report the results automatically.
What is Design‐for‐Testability?• Design for Testability (DFT):• Design for Testability (DFT):• Extra design effort invested in making an IC testable• Involves inserting or modifying logic, and adding pins
ExtraPin
ASIC_TEST
D Q D QPin 0
1CLK
ClockDivider SE
F0SEF1
AddedMUX
Typical DFT Hardware
Observability and Controllability• Observability: ease of observing a node by watching external output pins of the chipwatching external output pins of the chip
• Controllability: ease of forcing a node to 0 or 1 y gby driving input pins of the chipC bi ti l l i i ll t b• Combinational logic is usually easy to observe and control
Roles of Testing• Detection: determination whether or not the (DUT) has faults
– Identification of process flowp– Detection of chips that must not be sold to customerscustomers
• Diagnosis: location and identification of a specific faultD i h t i ti• Device characterization
• Failure mode analysis (FMA): determination of manufacturing process issues that may have caused defects on the DUTthat may have caused defects on the DUT
– manufacturing process improve and the yield iimprove
Real Tests• Based on analyzable fault models which may not perfectly match real defects• Incomplete test coverage due to the extreme complexity of IC
• Mixed‐mode analog and digital• Several cores, memory• Hundreds of millions of transistors
• Some good chips are rejected (yield loss).• Some bad chips pass tests (defect level).
What we test by DFT
Defect Level vs Fault Coverage
2530
el
20
25
ct L
eve
1015
Def
ec
05
D
00 10 20 30 40 50 60 70 80 90 100
Fault Coverageg
DFT CostDFT cost• DFT cost– Area cost;– Performance penalty ;
• ATPG tool cost and pattern debug cost• ATE testing cost
DFT C t ( t)DFT Cost (cont)Test cost reduce• Test cost reduce– Proper test plan, such as chain length, memory
conc rrent testingconcurrent testing…;
– Reduce pattern number;I t t f– Increace test frequency;
AgendaManufacturing Defect1
Manufacturing Testing2
What is DFT and Why DFT3
Describe Different DFT Techniques4
DFT Fl I t d5 DFT Flow Introduce5
DFT Methods• No single methodology solves all testing problems.
• No single DFT techniqne is effective for all kinds of g qcircuits.
DFT Methods(cont)• Ad‐hoc• Structured• Structured
– Scan– Built‐in self‐test (BIST)Boundary scan– Boundary scan
Scan• To provide controllability and observability of internal state variables for testinginternal state variables for testing
• To turn the sequential test problem into a bi ti lcombinational one
Scan(cont)q
/ 0
1q
SIPI1 Test for a SAO fault
q / 0
0
1 / 0 q
q
q
PI2
PI3 SO
PO1
PO20
q
q
0
0SE
PI4SOq
SE
Scan Shift Scan Shift
SE
CLK
SISO
10 0 0 Next Test PatternqqqResults From Previous Test Pattern q q q q q q q1
Advantages/Disadvanges• Advantages
– Design automation, Automated DFT hardware g ,insertion Combinational ATPGHigh fault coverage– High fault coverage
– Reasonable area (~15%) and speed (~5%) overhead• Disadvantages
– Large test data volume and long test timeLarge test data volume and long test time– A slow speed test
Typical Memory BIST Architecture Normal I/Os
Te
Test Controller
RAM
st CollTest Pattern
BIST module
arGenerator
ComparatorGo/No-go
MBIST Without DiagnosisMBIST Without Diagnosis ArchitectureBIST controller creates and applies patternsArchitectureBIST controller creates and applies patterns Fail goes active
when mismatch occurs
Multiplexers select b/w system and test dataMultiplexers select b/w system and test data
BIST with Diagnostic Block
=1For enteringDiagnostic Mode
Diagnostic Data
Boundary ScanMotivation and benefits:1 Detect board manufacturing process faults including1.Detect board manufacturing process faults, includingwrong/missing components, pin stuck/short/open, assist interconnection test on the board‐levelinterconnection test on the board level2. A many degrees of freedom are allowed
Specification• Independent sub‐system (independent clocks)Pi TDI TDO TMS TCK d t• Pins: TDI, TDO, TMS, TCK are mandatory
• Reset: optional TRST* pin or power‐on resetReset: optional TRST pin or power on reset circuitry
• Registers:– Instruction bypass boundary‐scan (mandatory)– Instruction, bypass, boundary‐scan (mandatory)– Device identification, design‐specific data (optional)
• BSDL (boundary‐scan description language)
Board Test ExampleTDI
ONON
TCKCORE LOGIC
TAPC
O
CORE LOGIC
TAPC
O
TMSCORE LOGIC CON
CORE LOGIC CON
TDO
TMSCORE LOGIC
TAPC CORE LOGIC
TAPC
TDO
hJTAG Architecture
functionalinput pins Core Logic
functionaloutput pins
TDI Device Identification RegisterDevice Identification Register Boundaryll
p p p p
Test Data RegistersBypass Register
Device Specific RegisterBypass RegisterDevice Specific Register Scan Cells
TDOInstruction Register
Instruction Decoder D Q
Instruction Register
Instruction Decoder D Q
TMSTCKTRST* TCK*
SELECT
Instruction Register
TAP‐ControllerFSM
Instruction Register
TAP‐ControllerFSMTRST TCK
TDO_ENABLE
FSMFSM
Instructions (1)• BYPASS (mandatory)
– Provides a minimum length serial shift register from TDI to TDOto TDO
• SAMPLE/PRELOAD (mandatory)Allows a snapshot of all I/O lines– Allows a snapshot of all I/O lines
– For loading the BSR serially• EXTEST (mandatory)• EXTEST (mandatory)
– Data shifted into the BSR will be available at the chip outputsp
• INTEST– Data shifted into the BSR is driven on the core logic ginputs
Instructions (2)• IDCODE (mandatory, if ID register available)
– ID register selected for reading HW identificationg g• CLAMP
Holds the chip outputs at values shifted in before– Holds the chip outputs at values shifted in before, while bypass register is active
• HIGHZ• HIGHZ– All chip outputs are placed in high impedance state
• User‐defined test mode– May be private or publicy p p
f d /User‐Defined Instru/Data RegisterTest Data
update_drclock_dr
Test Data RegisterTest Data Register
TDI TDO
InstructionDecoderInstructionDecoder
TDI TDO
Bypass
Instruction
Bypass
Instruction
TMSTCK
* TDO ENABLETAP‐Controller16 state FSMTAP‐Controller16 state FSMTRST* TDO_ENABLE16 state FSM16 state FSM
TAP‐Controller accesses external register
AgendaManufacturing Defect1
Manufacturing Testing2
What is DFT and Why DFT3
Describe Different DFT Techniques 4
DFT Fl I t d5 DFT Flow Introduce5
Test Development FlowS S h i d i• Scan Synthesis
• Macro Isolation• Boundary Scan
• Scan Ordering • AutomaticTest Pattern
• Pattern Assembly• Test Simulation• Test ProgramSynthesis
• BIST SynthesisGeneration• IDDQ Selection
• Test ProgramGeneration
Producth
Chip Level Test TestTapeBlock LevelArchitecture Design Pattern ProgramOutDesign
• Test ConceptEngineering
• Fault Simulation• Adhoc DFT• Extraction of
• Analog Test Sets• Parametric Tests• Test Specification Extraction of
Func. PatternParametric Tests
DFT i 5 t kDFT�engineer�5�tasksRTL/Gate sim and pat‐resim
DFT verificationTop design – TCU/TAP/Toplevel connections.
DFT DFT
verification p g / / pModule design edt_ip/BSCAN/MBIST/HardMacro DFT Development and delivery
design pattern
Test scheduling and Support Test engineers
Test Support
test mode controlpp g
and Failure analysis
defineSupport and FADFT engineer 5 tasks
DFT Flow (top)DFT Flow (top)
DFT flow inputs/outputsDFT flow inputs/outputs
DFT flow used toolsDFT flow used tools
DFT ToolsPhase Need Tools
1 Insert scan chains Design Compiler/Tessent1 Insert scan chains Design Compiler/Tessent
2 Insert edt/compress ip Tessent - TestKompress/TMAX
3 Insert MBIST Tessent MBIST/MBIST Architect
4 Insert BSCAN Tessent BSCAN / BSCAN Architect
5 Test Pattern Generate Tessent - TestKompress/TMAX
6 Test scan Diagnose Tessent - Diagnosis
7 Simulation VCS
B kBackup
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Fault ModelingPhysical fault Logic fault
IO leakage or short between signal hard faultnet open delay faultnet open delay faultmaterial pollution static current faultelectronic migration …gmetal stress …
……
Fault ModelingddIddq
All Defects Stuck‐atDelayDelay
B idBridge
Fault model :A logical model representing the effects of a physical defectA logical model representing the effects of a physical defect
Fault Modeling(cont)
• Stuck‐at fault modell f l d l• Delay fault model
– Transition– path delay
IDDQ• IDDQ
SA fault modelingSA fault modeling
Transition fault modeling• Focus on speed/timingFocus on speed/timing
– STR,(slow‐to‐rise)– STF,(slow‐to‐fall),( )
STR fault at U1/ZU1/Z
Path delay fault modeling• Path delay faults do not have localized fault sites, rather, they are associated with testing therather, they are associated with testing the combined delay through all gates of specific paths.
• Typically critical paths
IDDQIDDQ• IDDQ: total current consumption when CMOSIDDQ: total current consumption when CMOS circuit in static state
• Just leakage current or diode reverse current,A b id h l d IDDQ i i• Any bridge, open, short or lead to IDDQ variation