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    Basic concepts of Measurements

    Instrument

    A device for determining the value or magnitude of a quantity or variable

    Accurac *

    Closeness with which an instrument reading approaches the true value of thevariable being measured.

    Precision*

    Measure of the reproducibility of the results

    Measure of the degree to which successive measurements differ from one

    another ens v y

    Ratio of output signal or response of the instrument to a change of input ormeasured variable.

    The smallest change in measured value to which the instrument will respond

    Errors

    Deviation from the true value of the measured variable

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    Accuracy

    Precision Degree of agreement within a group of measurements or instruments

    Composed of two characteristics

    Conformity

    Significant Figures

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    Accuracy Vs Precision

    Example 1.

    Consider an ammeter which posses high degree of precision by virtue

    , ,

    with mirror arrangement to remove parallax. LC=(1/100) of Ampere. But the zero adjustment is wrong

    , , ,

    and the readings are consistent. However, the readings are not accurate

    since they do not confirm to the truth.

    Example 2.

    Consider a known voltage of 100V. Five reading are taken: 104V,

    , , .precision is 1%.

    The instrument can be calibrated so that it could be used properly.

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    Accuracy Vs Precision

    By calibration, accuracy can be improved upon but not theprecision of the instrument.

    Althou h the readin s are close to ether the have a small scatter andthus have a high degree ofprecision, but the results are far fromaccurate.

    When it is stated that a set of reading shows precision, itmeans that the results agree among themselves.

    A reement is no uarantee ofaccurac as there ma be some

    disturbing effect that cause all the measured values to be in error.

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    Significant Figures (SF)

    Convey the actual information regarding the magnitude and the

    .

    The more SF, the greater is the precision of the measurement

    The result is only as accurate as the least accurate measurement

    The number of SF in multiplication may increase rapidly

    Examples of SF

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    Direct method

    Unknown quantity (Measurand) is directly compared against a standard

    ,

    Indirect method

    Measuring Instruments

    Absolute Instruments (AI)

    Give the magnitude of the quantity in terms of physical constant of the

    instrument

    Secondary Instruments (SI)

    Quantity can be measured by observing the output indicated by the instrument

    Calibrated by comparison with an absolute instrument

    Working with AI for routine work is time consuming since every time ameasurement is made, it takes a lot of time to compute the magnitude

    Therefore, SI is most commonly used.

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    Types of Instruments

    Depending upon the way the instruments present the results of measurements,they are classified into two broad categories:

    Deflection Type (DT)

    Value of the measurand will be inferred from deflection or mechanicaldisplacement at the point of balance

    Opposing effect = cause producing the deflection

    Example: PMMC

    Null Type (NT)

    A zero indication leads to the determination of magnitude of measurand

    Attempt to maintain the deflection at zero by suitable application of an

    affect opposing that generated by the measurand Example: DC Potentiometer

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    Comparison between Deflection and Null Type

    Accuracy is higher for NT

    Because the o osin effect is calibrated with the hel of standards whichhave high degree of accuracy

    Whereas for DT, calibration depends upon the instrument constant whichare normally not known to a high degree of accuracy

    Measurand is balanced out for NT

    Because the detector have to cover a small range around the balance point

    Whereas for DT, it has to be large in size, more rugged and less sensitive

    D namic measurement

    NT is not suitable because it require many manipulation before balance

    DT is suitable because it can follow the rapid variations of the measurand

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    Characteristic of Instrument & Measurement System

    Static (measurand are either constant or vary slowly with time)

    Static Characteristic

    Accuracy

    Sensitivity

    Drift

    Static error

    Dead zone

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    True Value Defined as the average of an infinite number of measured value when

    the average deviation due to the various factors tend to zero.

    Variation between the largest and the smallest reading (or largest one)

    Scale Span

    Difference between the largest and the smallest reading

    Frequency Range requenc es over w c measuremen s can e per orme w a

    specified degree of accuracy

    Static Error

    Difference between the measured and true vale

    Static Correction

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    Drift

    Perfect reproducibility means no drift

    i.e., with a given input, the values do not vary with time

    Zero Drift

    If the whole calibration gradually shift due to the slippage, permanent set,

    or due to the undue warming up of the electronic circuit.

    Can be prevented by zero setting

    Span Drift or Sensitive Drift

    Zonal Drift

    Occurs onl over a ortion of s an

    Drift is an undesirable quantity for the industries.

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    Static Sensitivity Ratio of the magnitude of response or output signal to the magnitude of

    the measurand.

    When a calibration curve is linear sensitivit can be defined as the

    slope of curve Constant over the entire range

    , .

    Dead Time

    Time re uired b a measurement s stem to be in to res ond to a

    change in the measurand.

    Time before the instrument begins to respond after the measurand has been

    changed

    Dead Zone

    Largest change of input for which there is no output of the instrument

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    Resolution

    The smallest increment in the input which can be detected with

    So, the resolution defines the smallest measurable input change While, the threshold defines the smallest measured input.

    Loading Effect

    The ori inal si nal should not be distorted b introduction of an

    element in the measurement system

    However, practically it is not possible.

    phase shift, etc.