electrons and their interaction with the specimen
DESCRIPTION
The chapter explains the behaviour of electrons within a specimen and shows how they interact with the atoms of the sample. From "Electron Microscopy and Analysis" textbook by Peter J. Goodhew, John Humphreys and Richard Beanland. Courtesy of Taylor and Francis Books UK.TRANSCRIPT
Contents (Note: Page numbers are as in the whole book so that the index remains valid)
Acronyms …………………………………………………….……………………… iii Preface ………………………………………………………………………………. iv
2 Electrons and their interaction with the specimen 2.1 Introduction ………………………………………..… 20 2.2 Electrons ………………………………...…………… 20 2.3 Generating a beam of electrons ……………………… 24 2.4 Deflection of electrons – magnetic lenses …………… 27 2.5 The scattering of electrons by atoms .…………..……. 29 2.6 Elastic scattering ...…………………………………… 30 2.7 Inelastic scattering ……………...………………….… 31 2.8 Secondary effects …………….………………………. 34 2.9 The family of electron microscopes ……………..…... 37 2.10 Questions …………………………………………….. 38
Further reading ……………………………………………………………..……. 236 Answers ……………………………………………………………………………. 238 Index …………………………………………………………………………..……. 243
Electron Microscopy and Analysis, Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).
__________________________________________________________
Electron Microscopy and Analysis, Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).
__________________________________________________________
Electron Microscopy and Analysis, Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).
__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________
Reproduced by kind permission of Taylor and Francis Books UK under a Creative Commons Licence (BY-SA).Third Edition (electronic copy) by Peter J. Goodhew, John Humphreys, and Richard Beanland.
Electron Microscopy and Analysis,__________________________________________________________