key areas for consideration in sample handling design
TRANSCRIPT
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Yokogawa Information Exchange
Sample Systems Chance or Choice?
1
Trevor Hibdige C.Eng MInstMC BSc(Hons) Analyser Consultant and Data System Designer [email protected]
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
2
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
3
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
4
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
5
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
6
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
7
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
8
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Classic Pitfalls
Reliability - Perception or Fact? n Most Analyser problems are caused by
inadequate Sample System designs
It doesn’t matter if its real or perceived. If the system has a bad reputation then it will not be used fully or maintained fully
9
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
10
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Classic Pitfalls
Response Time “An Analyser (system) that responds so slowly as to be boring or irritating to those using it or maintaining it will receive little attention and poor maintenance” Publication Date: September 1959 Copyright © 1959 American Chemical Society
(With the exception of model based control where precision outweighs speed this still is true)
11
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Classic Pitfalls
n Forgetting who the “Customer” is n Overloading the Technician n Pushing for an unrealistic response time n Freezing up a regulator n Too long sample lines n Changing Phases n Diffusion or adsorption n Sample Pumps
12
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
13
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Basic Design Strategies
n What the Analyser needs vs What comes out of the process
n Understand the pressure drops n Maintainability
14
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
15
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Understand the pressure drops (basic design strategy)
n Pressure Stability n Flow Control n Material Compatibility
16
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Understand the pressure drops (basic design strategy)
n Pressure Stability n Flow Control n Material Compatibility
17
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Pressure Drops (basic stuff)
18
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Pressure Drops (real world)
19
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Understand the pressure drops (basic design strategy)
n Pressure Stability n Flow Control n Material Compatibility
20
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Pressure Stability & Flow Control
21
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Understand the pressure drops (basic design strategy)
n Pressure Stability n Flow Control n Material Compatibility
22
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Pressure Stability & Flow Control
23
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
n Understand the pressure drops (basic design strategy)
n Pressure Stability n Flow Control n Material Compatibility
24
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Where to Focus
Material Compatibility n Metals
We all know that Stainless Steel is better than Carbon Steel
n Elastomers We think we know that PTFE is better than Viton is better than Nitrile BUT…….
25
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
26
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n What is Analyser Response Time? n What is Sample Response Time?
u Agreeing u Calculating u Optimising
27
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Agreeing
u What is needed u Is it achievable u Is it safe and realistic u Is it maintainable
28
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Agreeing – What is needed
29
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Agreeing – What is needed
30
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Agreeing – What is needed
31
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Agreeing – What is needed
32
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Calculating There are 7 different ways to calculate pressure loss in a flowing gas tube or pipe……(no wonder we all come up with different answers)
Ø Laminar Flow Ø Pressure Loss <10%of P1 (incompressible model) Ø Pressure Loss <40%P1 (average line pressure) Ø Integrate pressure loss along the whole length Ø P2>40% of P1 (compressible model)
• Weymouth (1912) • Panhandle A (1940s) • Panhandle B (1956)
33
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Calculating
34
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Optimising
35
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Optimising (increase analyser flow)
36
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Response Times
n Optimising (decrease probe volume)
37
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Key Areas for Sample Handling Design
38
1. Classic Pitfalls 2. Basic Design Strategies 3. Where should we focus? 4. Understanding Response Times 5. Future Trends
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Future Trends
n In Line Analysers n Fibre Optics n Data Systems n Self Diagnostic Systems n The dreaded NESSI
(not so much have you got the money more can you generate the return)
39
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Future Trends
n NESSI Increasing the reliability of these systems through the use of increased automation Shrinking their physical size and energy use by means of miniaturization Promoting the creation and use of industry standards for process analytical systems Helping create the infrastructure needed to support the use of the emerging class of robust and selective microAnalytical sensors
40
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Tomorrow Our Industry will still need sample systems Our Industry will still complain about the costs Our Industry will still do it wrong
41
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Tomorrow Our Industry will need more people to understand how to do it before we lose the “art”
42
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
QUESTIONS
43
| Document Number | March 23, 2016 | © Yokogawa Electric Corporation
Contact Details The Presenter – Trevor Hibdige [email protected] Dale Cathey Yokogawa [email protected]
44