m russak presentation 3 03 rev a - thic · bpi/tpi 9.4 8.2 7.4 6.3 5.3 4.4 ... january 2000) in...
TRANSCRIPT
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Presented at the THIC Meeting at the Sony Auditorium, 3300 Zanker Rd, San Jose CA 95134-1940
March 4-5, 2003
MEDIA TECHNOLOGYCurrent Status and Future Trends
Dr. Michael A. RussakPresident & Chief Technical Officer
Komag, Incorporated1710 Automation ParkwaySan Jose CA 95131-1873
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MEDIA TECHNOLOGYCurrent Status and Future Trends
Dr. Michael A. RussakPresident & Chief Technical Officer
Komag, Incorporated1710 Automation Parkway
San Jose, CA
Presented at the THIC Meeting at the Sony Auditorium, 3300 Zanker Rd, San Jose CA 95134
March 4-5, 2003
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2000 2002 2004 2006 2008 2010 2012
10
100
1000
10
1520
3040
60
80120
160240
320480
640960
1280
920
100% CAGR60% CAGR40% CAGRDTR @ MR160DTR @ MR240DTR @ MR320
PerpendicularPerpendicular
Areal Density & Capacity vs. Time
YearYear
Are
al D
ensi
ty (G
b/in
Are
al D
ensi
ty (G
b/in
22 ))
ConventionalConventional
SAFSAF
PatternedPatternedHAMRHAMR
Long. AD DemoLong. AD Demo135 Gb/in135 Gb/in22
853 kbpi, 158 ktpi853 kbpi, 158 ktpi
Perp. AD DemoPerp. AD Demo111Gb/in111Gb/in22
850 kbpi, 131 ktpi850 kbpi, 131 ktpi
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Longitudinal Data Recording Longitudinal Data Recording ProcessProcess
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Magnetic Spacing BudgetT
hick
ness
Sep
arat
ion
(Å)
0
50
100
150
200
20 50 100 150Areal Density (Gb/in2)
FLY HGT (Å)HALF MAG. THKDISK OC (Å)HEAD OC (Å)PTR (Å)
GMR Head
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Bit Size Vs. Recording Density
0.15µm
3 µm
0.8 µm
0.064 µm
0.16 µm
0.034 µm
0.13 µm
0.028 µm
Gb/in2 KBPI KTPI
1996 1 160 6.5
2000 10 400 25
2003 100 750 133
2005 150 900 170
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Product Roadmap – 95mm Form Factor
Production Launch 3Q01 3Q02 1Q03 1Q04 1Q05 4Q05 2006GB/Platter ( 95mm) 40 60 80 120 160 240 320Areal Density (Gb/in2) 29 40 60 90 120 180 240KTPI 55 70 90 120 150 200 TBDKBPI 516 571 667 750 800 900BPI/TPI 9.4 8.2 7.4 6.3 5.3 4.4
Magnetics
Magnetic Structure Conventional Conventional Conv/SAF SAF SAF/Per Perpendicular Perpendicular
VSM Coercivity 3700-3900 4000-4300 4000-5000 4300-5300 4500-5500 5000-6000
Mrt 0.35-0.38 0.3-0.37 0.25-0.35 0.2-0.3 0.2-0.3 0.4-0.8
0.4-0.8
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Magnetic Coercivity and MrT Product
6000
5000
4000
3000
2000
1000
Mag
netic
Coe
rciv
ity (O
e)
3 4 5 6 7 8 9
12 3 4 5 6 7 8 9
102 3 4 5 6 7 8 9
100
Areal Density (Gb/in2)
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
MrT Product (m
emu/cm
2)
INDUCTIVE
SAF
Hc
MrT
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Coercivity vs. Mrt for Longitudinal Media Alloys
Avg. Grain Size = 7 nm
7000
6500
6000
5500
5000
4500
4000
3500
3000
2500
Hc
(Oe)
1.00.90.80.70.60.50.40.30.2
MrT (memu/cm 2 )
Non-EpitaxialEpitaxial I
Epitaxial II
Epitaxial III
Epitaxial IV
Epitaxial V
SAF
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100 GB/in2
150 GB/in2
Grain Size Reduction
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Grain Size Distribution Improvement
140
120
100
80
60
40
20
0
302520151050Grain Size (nm)
80GB/Platter<D>= 9.1nm ; Sigma=0.24
Decay Rate= 0.4 %/Decade
20GB/Platter<D>=10.8 nm ; Sigma=0.41
Decay Rate= 0.7 %/Decade
( )( )2250
/131.0
><+=
VSaBWPWSNR
σ(H. Zhou and H.N. Bertram, IEEE Trans. Magn., Vol. 36, No.1, pp. 61-66, January 2000)
In absence of exchange, once σ/<v> is~15% or less there is negligible impact on SNR
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Oriented Magnetics
• Orientation provides 2 to 3 dB of SNR gain over isotropic magnetics.
• Can we keep the same level of MrT OR for next generations ?
Yes, we cannot afford to give it up
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Texture Roughness and Orientation Ratio
2.2
2.0
1.8
1.6
1.4
1.2
1.0
MrT
Orie
ntat
ion
Rat
io
12 3 4 5 6 7 8 9
10TMS Roughness (Angstroms)
2.2
2.0
1.8
1.6
1.4
1.2
1.0
Hc O
rientation Ratio
MrT OR Hc OR
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Cross-Section TEM Image of Longitudinal Media
Mechanical texture must sustain magnetic OR development (necessary to maintain SNR) while satisfying head flyability requirements (e.g., glide avalanche)
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2000 2002 2004 2006 2008 2010 2012
10
100
1000
10
1520
3040
60
80120
160240
320480
640960
1280
920
100% CAGR60% CAGR40% CAGRDTR @ MR160DTR @ MR240DTR @ MR320
PerpendicularPerpendicular
Areal Density & Capacity vs. Time
YearYear
Are
al D
ensi
ty (G
b/in
Are
al D
ensi
ty (G
b/in
22 ))
ConventionalConventional
SAFSAF
PatternedPatternedHAMRHAMR
Long. AD DemoLong. AD Demo135 Gb/in135 Gb/in22
853 kbpi, 158 ktpi853 kbpi, 158 ktpi
Perp. AD DemoPerp. AD Demo111Gb/in111Gb/in22
850 kbpi, 131 ktpi850 kbpi, 131 ktpi
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Perpendicular Data Recording Perpendicular Data Recording ProcessProcess
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Perpendicular Media Candidates
• Granular– Co Alloys with Cr, B, oxides as segregants to reduce
intergranular exchange coupling.
• Multilayer– Co/Pd, Co/Pt, etc…
• Ordered Compounds– CoPt (L10), FePt (L10), etc…
• Oxides– Ba-Ferrite
• Rare-Earth Based– CoSm, CoFeTb, etc…
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Why Granular Media ?• Media Noise
– Of all the candidates, granular media offers the easiest way to achieve low noise.
• Familiarity– The manufacturing methods are extensions of current
(or recent) technologies.• Manufacturability
– Moderate heating or room-temperature processes, possible to make using current equipment. Higher throughput potential.
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Perpendicular Media Structure
n=1
n=5...
o/c
Mag. L.
N.L.S.L.
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TEM image of State of the Art filmTEM image of State of the Art film
20 nm20 nm
Average grain size ~7.5 nmAverage grain size ~7.5 nm
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Grain Size Distribution of Latest Perpendicular Media
Grain number-frequency histogram of perpendicular media (E3126)
020406080
100120140160180200
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Grain size (nm)
Num
ber-
freq
uenc
y
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-20000 -10000 0 10000 20000-3x10-4
-2x10-4
-1x10-4
0
1x10-4
2x10-4
3x10-4Perpendicular and In-plane Loops
File: K2889
Perpendicular In-plane
HK: 12.5-16 kOe (-15.0 kOe)
Mom
ent (
emu)
H (kOe)
AGFM Loops of Perpendicular Media
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SNR Evolution for Boron and Oxide Granular Media
20
15
10
5
SNR
[dB
]
26242220181614121086420
Time [months]
- 6 dB
+ 7.9 dB
Boron Alloy Media Oxide Alloy Media
Dec. 2000 February 2003
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MFM Images of Recorded Transitions on E3289
100 KFCI1000 KFCI
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BTD: OTC4 747 Curve at 691kBPI
221F, F9F0OKKDS0, 332.5Mb/s, 691kBPI, Komag S3087D1, 8% squeeze
0
0.2
0.4
0.6
0.8
1
1.2
6 7 8 9 10 11 12 13 14
TRACK PITCH (uin)
OTC
4
-5.5
-5
-4.5
-4
-3.5
-3
-2.5
-2
-1.5
-1
OT
C_E
FL
OTC410% TPOTC_EFL
145KTPI
691 X 145 = 100.2Gbpsi
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0 1 2 3 4 5log10(Time(seconds))
0.91
0.92
0.93
0.94
0.95
0.96
0.97
0.98
0.99
1.00
1.01
Nor
mal
ized
100
-kFC
I Am
plitu
de
E2575-SA#20 (CoCrPtO) 100-kFCI Amplitude Decay At Ambient Temperature
Decay Rate = 0.02 %/decade, Goodness of Fit R2 = 0.0002
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Criteria & Considerations For Criteria & Considerations For Perpendicular Media IntroductionPerpendicular Media Introduction
•• What performance advantage is needed for perpendicular What performance advantage is needed for perpendicular media to be considered POR for a product?media to be considered POR for a product?–– Areal density demonstration for perpendicular media about 2x Areal density demonstration for perpendicular media about 2x
higher than for longitudinal media? higher than for longitudinal media? (Current Demos: (Current Demos: PerpPerp.: 111 .: 111 GbGb/in/in22, 850 , 850 kbpikbpi, 131 , 131 ktpiktpi; Long.: 135 ; Long.: 135 GbGb/in/in22, 853 , 853 kbpikbpi, 158 , 158 ktpiktpi) )
–– Extra margin in performance needed to account for the unexpectedExtra margin in performance needed to account for the unexpectedthat accompanies a new technology introduction.that accompanies a new technology introduction.
•• Perpendicular media cost expected to be higher than Perpendicular media cost expected to be higher than longitudinal media costlongitudinal media cost–– Perpendicular media sputter material cost delta expected to be Perpendicular media sputter material cost delta expected to be
significantsignificant•• Perpendicular media manufacturing will affect media production Perpendicular media manufacturing will affect media production
capacitycapacity–– For inFor in--situ static sputtering machines, perpendicular media capacity situ static sputtering machines, perpendicular media capacity
could be less than 60% of longitudinal capacity.could be less than 60% of longitudinal capacity.
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2000 2002 2004 2006 2008 2010 2012
10
100
1000
10
1520
3040
60
80120
160240
320480
640960
1280
920
100% CAGR60% CAGR40% CAGRDTR @ MR160DTR @ MR240DTR @ MR320
PerpendicularPerpendicular
Areal Density & Capacity vs. Time
YearYear
Are
al D
ensi
ty (G
b/in
Are
al D
ensi
ty (G
b/in
22 ))
ConventionalConventional
SAFSAF
PatternedPatternedHAMRHAMR
Long. AD DemoLong. AD Demo135 Gb/in135 Gb/in22
853 kbpi, 158 ktpi853 kbpi, 158 ktpi
Perp. AD DemoPerp. AD Demo111Gb/in111Gb/in22
850 kbpi, 131 ktpi850 kbpi, 131 ktpi
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Discrete Track Recording (DTR) TechnologyDiscrete Track Recording (DTR) Technology
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SNRSNRDTRDTR = SNR= SNRConvConv + 2.0 dB+ 2.0 dB
Reader Width:Reader Width: RRDTRDTR >> RRConvConv
WWDTRDTR
RRDTRDTR
TTWWGGWWTTSS
WWDTRDTR >> WWConvConvWriter Width:Writer Width:
SNRSNRmediamedia::
Advantages DTR over Conventional For Same Track SpacingAdvantages DTR over Conventional For Same Track Spacing
SNRSNRDTRDTR = SNR= SNRConvConv + 3.9 dB+ 3.9 dBSNRSNRelectronicelectronic::
WWConvConv
RRConvConv
TTWW
Erasure BandsErasure Bands
Higher data rate/reliability and/or higher areal density Higher data rate/reliability and/or higher areal density and/or higher fly height and/or higher fly height Higher SNR of DTR:Higher SNR of DTR:
DTR Increases the Head Read and Write Width Tolerances DTR Increases the Head Read and Write Width Tolerances Improving Head YieldsImproving Head Yields
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• TDK showed data on a DTR disk that they are produced recently at the Joint [NA]PMRC conference in Monterey (Y. Soeno et al):
Recent TDK Demo of DTR TechnologyRecent TDK Demo of DTR Technology
SEM photo of the fabricated discrete tracksComparison of track profile in both discrete track
and continuous magnetic film media
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Key Issues/Challenges for DTR
• Technology has been around since the 1970s• Several barriers to implementation
– Ability to produce DTR structures with steep groove walls and defect free surfaces
– Full surface compliance– Flyability– Developing a manufacturing process with low cost
and high yield
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2000 2002 2004 2006 2008 2010 2012
10
100
1000
10
1520
3040
60
80120
160240
320480
640960
1280
920
100% CAGR60% CAGR40% CAGRDTR @ MR160DTR @ MR240DTR @ MR320
PerpendicularPerpendicular
Areal Density & Capacity vs. Time
YearYear
Are
al D
ensi
ty (G
b/in
Are
al D
ensi
ty (G
b/in
22 ))
ConventionalConventional
SAFSAF
PatternedPatternedHAMRHAMR
Long. AD DemoLong. AD Demo135 Gb/in135 Gb/in22
853 kbpi, 158 ktpi853 kbpi, 158 ktpi
Perp. AD DemoPerp. AD Demo111Gb/in111Gb/in22
850 kbpi, 131 ktpi850 kbpi, 131 ktpi
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MR/am
Media Evolution Expected to Continue As Generally Predicted
• Conventional - 80 GB (Maybe 120 GB)– Multilayer Films, Directly Coupled– Don’t Overlook OR Effects
• SAF/AFC - 120 GB (Some 80 GB) – 240 GB – Ferri-magnetically Coupled Films
• Low “Effective” Mrt• Moderate Hc• Thermal Stability
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MR/am
Media Evolution(continued)
• Perpendicular - > 240 GB– Granular/Oxide doped - most likely first– Multilayer Superlattice to come next
• DTR/Self Ordered Arrays – Future Tech.
Design Point Limits for Each Media Type Still Not Set
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MR/am
Acknowledgements
• The extensive contributions of Gerardo Bertero, David Wachenschwanz, Chris Bajorek and Tom Yamashita to this presentation are gratefully acknowledged