RENO PMT TEST

PMT type DAQ setup Single Photon Electron

Resolution Dark Current After Pulse Ratio with two

methods Summary

Kyung Ju Ma, 2007. Oct. 6 RENO Collaboration meeting

강 운구 , 김 영덕 , 마 경주 ,

공 대정 1, 김 동희 1, 김 우영 1, 김 지은 1, 서 준석 1, 사무엘 스테파냔 1, 아딜 칸 1,

안드레이 김 1, 박 인곤 2, 박 명렬 3, 안 정근 4, 이 효상 4,

김 수봉 5, 김 장호 5, 김 현수 5, 박 강순 5, 박 정식 5, 신 경하 5, 이 재승 5, 전 은주 5, 최

선호 5, 권 은향 6, 김 동현 6, 박 차원 6, 서 현관 6, 유 인태 6,

최 수용 6, 최 영일 6, 김 성현 7, 김 재률 7, 임 인택 7, 장 지승 7, 정 인석 7, 주 경광 7, 오

영도 8, YU. Krylov9, G. Novokova9, E. Yanovich9, N. Danilov10

세종대학교 . 1 경북대학교 . 2 경상대학교 . 3 동신대학교 . 4 부산대학교 . 5 서울대학교 .

6 성균관대학교 . 7 전남대학교 . 8 포항가속기연구소 . 9INR. 10IPCE

RENO Collaborators

8” and 10” PMTsHamamatsu

R5912PhotonisXP1806

HamamatsuR7081

Signal fromXP1806

Hp pulse/function generator 8116A

R5912, XP1806 -data taking

100Mhz, FADC Module(shaped)PMT set with ice water & Dark Box

DAQ SETUP

Single Photon Electron Resolution

R 7081

116 [mV] 61.5

[mV]※ qtot ∝ Charge of SPE

Clear single photon electron peak

Peak-to-Valley gain SPE charge [pC]

R 5912 ~ 4 ~107 (1300V) 24.0

Xp1806 ~ 4 ~107 (1550V) 12.3

Temp..[oC] Mean Error[±]

2.9 1.21 x102

1.50

14.3 1.16×102

0.98

24.5 1.14×102

2.32

Gain dependence of temperature

Dark Current Temperature Dependence(R5912) RENO expected Dark Current at 10 ~ 15 oC is ~ 6 K/s

6~10 K/s are measured for the expected region which are more higher than expected. For the steep increase at 14 ~ 15oC, the spent time after closed

dark Box having been considered.

Dark Current Temperature Dependence(R7081)

linear dependence

show 8 K/s for the region of 10 ~15 oC

more higher than R5912 and XP1806

Dark Current Temperature Dependence(XP1806)

linear dependence

show 2 ~ 3 K/s for the region of around 10 oC

After Pulse Ratio using accumulated Method(R5912)

First After Pulse Ratio = 1.88 %

Second After Pulse Ratio= 3.65 %

After Pulse Ratio using accumulated Method(XP1806)

First After Pulse Ratio =3.26 %

Second After Pulse Ratio=2.47 %

After Pulse Ratio using accumulated Method(R7081)

First After Pulse Ratio =2.57 %

Second After Pulse Ratio=2.91 %

Pulse Ratio using clustering Method(R5912)

After Pulse Ratio = 2.6 ~3.9 %

After Pulse peaks are occurred after 0.7, 1.7 and 6.7 micro second.(Primary signal region (1300,1360)

ⅹ10nsPro

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0.7 micro. Sec.1.7 micro. Sec. 6.7 micro. Sec.

Pulse Ratio using clustering Method(xp1806)

ⅹ10ns

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After Pulse peaks are occurred after 1.2 and 6.7 micro second. (Primary signal region (1310,1350)

1.2 micro. Sec. 6.7 micro. Sec.

Pulse Ratio using clustering Method(R7081)

ⅹ10nsPro

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(No.

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SP

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0.1

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After Pulse Ratio = 2.1 ~2.6 %

After Pulse peaks are occurred after 0.7 and 6.7 micro second. (Primary signal region (1010,1050)

0.7 micro. Sec. 6.7 micro. Sec.

After Pulse Ratio using the clustering Method

Both PMT show 2 ~ 3 % which is correspond to the PMT specification

After Pulse don’t show temperature dependence. it has been known and

convinced

SUMMARY

Tested PMT: Hamamatsu PMT(8 inch-R5912, 10inch-R7081),

Photonis PMT(8 inch XP1806)

DAQ setup: 100Hz FADC, PMT set with ICE water, 10ns width Pulse generator

R5912, r7081 show the clear single photon electron resolution.

Gain and Dark Current show the temperature dependence.

Dark Currents are 6~10 K/s(R5912), 8K/s(R7081), 2~3K/s(XP1806) for the temp.

range(10~15oC)

After Pulse Ratio(APR) was tested using two method (Accumulating, Clustering ).

- APR by Clustering Method for R5912, XP1806 and R7081 show 2 ~ 3 % which is correspond to the PMT specification

- APR by Accumulated metod for R5912, XP1806 and R7081 show 5 ~5.7 % which is correspond to the PMT specification

R5912, XP1806 and R7081 have typical After Pulse shape as show fixed After Pulse time region after Primary Signal.

After Pulse don’t show temperature dependence.

NEXT STEP

XP1806 base noise problem fix and single photo electron resolution study.

Dark Current dependence on Spending time (after Dark Box closing, after HV turn on) and temperature.

study about the different result for After Pulse Ratio by Accumulated method and Clustering method.