シリコンドリフト検出器のsr-txrfへの適用sunbeam.spring8.or.jp/top/seika/ohp/jssr2002/10p10.pdf•...
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SPring-8
SR-TXRF
1 2 3 4 5 6 7
1 2 3 4 5 6 7SES
SPring-8BL16XUX2
SSD)XTXRFSSD
X2
SDD3SSD
SPring-8XBL16XUBL16B2
SDD5mm2Ge-SSDEG & G, ORTECIGLET-111455
6mCu4X1011atoms/cm2Mn,
Co, Ni, CuSiX12keVSi0.05
SDDSSDXCuKaXX
AlSDD40,00050,000cpsSSD
8,000cps15%
SDDSSDMn, Co, Ni, CuSiTXRFSDD10atoms/cm2
SSDSiSDD
SSD1TXRF
X
1.G
HP http://sunbeam.spring8.or.jp/
2. N. Awaji et al, Jpn. J. Appl. Phys., 39(2000)L1252. 3. L. Struder et al, Microsco. Microanal., 4(1999)622.
0
10000
20000
30000
40000
50000
60000
70000
0 1000 2000 3000 4000 5000 6000
Io / cps
If of
Cu
Ka
/ cp
s
SDD
Ge SSDDead time was 15%at If = 8,000 cps.
SDDSSDXX
1
10
100
1000
10000
100000
1000000
0 2 4 6 8 10 12 14 16
XRF Energy / keV
Inte
nsit
y : c
ount
s(10
00se
c)
Si
MnCo Ni Cu
Zn
Ge SSD : Cu LLD=2.3X109atoms/cm2
Ar
SDD: Cu LLD=3.9X109atoms/cm2
SDDSSDSiTXRF
SPring-8-BL16XUXSSDXTXRFSSDX
SDDSSD
SDDGe-SSDX
SDDGe-SSD SDDX
SDD
SDD
Ge-SSD
SDD
SSD
BL16XUBM-BL10100
BLTXRF SDD Ge-SSD 6BU
TXRF 1000130cm1000DipTXRF
XX
X
X
LiF(200), LiF(220)PET(002), TAP(001)2d=80,160
X
X
SDDSSD
CuKaSDDGe-SSD ~ Ag Shaping time
SDD +Kapton 50m
SDD
CuKaSDDSSD
SDD4~5cps Ge-SSD8cps15%
Fig CuKaSDDSSD
0
10000
20000
30000
40000
50000
60000
70000
0 1000 2000 3000 4000 5000 6000
Io / cps
If of
Cu
Ka
/ cp
s
SDD
Ge SSDDead time was 15%at If = 8,000 cps.
TXRFSDDSSD4E11 Mn,Co,Ni,Cu on Si
SDD109atoms/cm2SSD
Fig SDDSSDSiTXRF
1
10
100
1000
10000
100000
1000000
0 2 4 6 8 10 12 14 16
XRF Energy / keV
Inte
nsity
: co
unts
(100
0sec
)
Si
Mn CoNi
Cu
Zn
Ge SSD : Cu LLD=2.3X109atoms/cm2
Ar
SDD: Cu LLD=3.9X109atoms/cm2
Mn ~ Ag
Fig. Relative Sensitivity of SDD against SSD
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0 5 10 1 5 20 2 5
X-ray Emission Energy : keV
Rel
ativ
e S
ensi
tivi
ty o
f S
DD
aga
inst
SS
D
Mn
Co Ni
Y Mo
AgExcited by 26.8 keV
Excited by 10 keV
Co,Ni7keV20
Y,Mo,Ag1522keV6070
Fig XRF spectrum of 4E11 Mn,Co,Ni,Cu on Si
1.0E+00
1.0E+01
1.0E+02
1.0E+03
1.0E+04
1.0E+05
1.0E+06
0 2000 4000 6000 8000 10000 12000 14000 16000 18000
hv / eV
Inte
nsity
/ co
unts
con
vert
ed t
o10
00se
c m
easu
rem
ents
XRF
BG
LLD
LLD of Cu : 1.1E10 atoms/cm2
LLD of Cu : 3.9E9 atoms/cm2
XX=01717mm
Y
W wire : 100 um
Si wafer
Fig. W wire on Si wafer
W-La (counts), Y=-5.7mm
0
20000
40000
60000
80000
100000
120000
140000
160000
180000
-10 -5 0 5 10 15 20 25X (mm)
W-La (counts), X=0mm
0
200000
400000
600000
800000
1000000
1200000
1400000
-6.5 -6 -5.5 -5 -4.5 -4Y (mm)
XRF
Kapton50m
SiBG
LLD
LLD of Cu : 5.7E9 atoms/cm2
LLD of Cu : 3.9E9 atoms/cm2
Fig XRF spectrum of 4E11 Mn,Co,Ni,Cu on Si
1.0E+00
1.0E+01
1.0E+02
1.0E+03
1.0E+04
1.0E+05
1.0E+06
0 2000 4000 6000 8000 10000 12000 14000 16000 18000
hv / eV
Inte
nsity
/ co
unts
con
vert
ed t
o10
00se
c m
easu
rem
ents
LLD
LLD
Fig Length(Sample-SDD) vs Cu LLD
3.0E+09
4.0E+09
5.0E+09
6.0E+09
7.0E+09
8.0E+09
9.0E+09
1.0E+10
50 70 90 110 130 150 170 190 210 230 250
Length / mm
Cu
LLD
( a
tom
s/cm
2 )
0
50
100
150
200
250
300
350
Inte
nsity
of C
u Ka
(BG
) /
coun
tsCu Ka
BG of Cu Ka
with Collimator
Cu LLD
4E11 Mn, Co, Ni, Cu on Si
SDD
FWHM,Live timeShaping time
LLD of Cu : 2X1011atoms/cm2
Shaping time100FWHM
Shaping timeLive time
Shaping time100200
Fig.Live timeShaping time
0
50
100
150
200
250
0 50 100 150 200 250 300 350
Shaping time
CuK
a FW
HM
eV
80
82
84
86
88
90
92
94
96
98
100
Live
tim
e : %
2E13 Mn, Co, Ni, Cu on Si
SDD109atoms/cm2SSDSDDSSDXTXRF
SDDX5mm210mm2SDDSDDXBL40XU
SDDSSDSi SB