13 edler isc konstanz

17
Flasher setup for bifacial measurements Alexander EDLER, Michel SCHLEMMER, Joachim RANZMEYER, Rudolf HARNEY

Upload: sandia-national-laboratories-energy-climate-renewables

Post on 12-Apr-2017

232 views

Category:

Presentations & Public Speaking


1 download

TRANSCRIPT

Page 1: 13 edler isc konstanz

Flasher setup for bifacial measurements

Alexander EDLER, Michel SCHLEMMER, Joachim RANZMEYER, Rudolf HARNEY

Page 2: 13 edler isc konstanz

Outline

MotivationIntroduction of the add-on setupCharacterization of the setupCapacitance effects Bifacial measurements

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

Bifacial measurementsSummary

- 2 -

Page 3: 13 edler isc konstanz

Motivation

− Measure cell properties under actual operating conditions (using albedo) in a controlled environment

− Additional effects in bifacial measurement over std. measurement?

− New module sorting methods

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

− New module sorting methods required?

− Appropriate measurement procedure to quantify the energy yield for bifacial operation?

− Customize cell process for bifacial module operation?

- 3 -

Page 4: 13 edler isc konstanz

Bifacial cell tester

− Single light source at 1,7m distance

− 2 perpendicular mirrors− Reference cell in measurement

plane− Conventional flasher contacting

frame

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

frame

- 4 -

Ezquer et. al., Proceedings of 25th EUPVSEC Valencia 2010

− Aluminium coated mirrors @ 45°AOI

− Rack installed in Berger flasher system

Grid

Page 5: 13 edler isc konstanz

PT100 temperature sensor instead of IR sensor

Cells contacted in standard frame, which can be removed to change cell

Bifacial cell tester

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012 - 5 -

Reference cell in top view

std. meas. (10x) with covered rearside E1-C123

ISC [A] 9,297

VOC [V]0,645

FF [%]75,6

eta [%]18,81

First meas. (10x) in bifacial rackwith covered rearside E1-C123 9,262 0,645 75,8 18,79

Page 6: 13 edler isc konstanz

Spectrum characterization

6

8

10

12

70

80

90

100

110Irradiance [W/m

²nm]

Comparison Spectra & %R Mirror

%R Mirror @ AOI=45°

E without Mirror [W/m²]

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

0

2

4

6

300 500 700 900 1100 1300 1500 1700

30

40

50

60

70

Wavelength [nm]

Irradiance [W/m

²nm]

E without Mirror [W/m²]

E wih Mirror [W/m²]

- 6 -

Reflected light within Class A specification for AM1.5G

Page 7: 13 edler isc konstanz

Intensity filter steps

100110

400383

80 =1000*0,8*0,2*0,582

expectedmeasured

Intensity without any filter [W/m²]measured1000

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012 - 7 -

20% covered area 50% covered area 80% covered area

160185

800803

500476

200230

Partial shading is achieved using intensity filters at 30cm distance from the cell

Page 8: 13 edler isc konstanz

Illumination homogeneity

20

10

00 10 20 30 40 50

current

[A/cm²]

X Axis [cm]

Y Axis [cm]

0,1200

0,1247

0,1293

0,1340

0,1387

0,1433

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012 - 8 -

40

30Y Axis [cm]

0,1433

0,1480

0,15270,1550

Specification of flasher setup states homogeneity of intensity <2%» Larger area increases the intensity variation » 7% (min-max) variation over cell area -> Class B according to

measurement standards

Page 9: 13 edler isc konstanz

Summary bifacial setup

+ Easy to use+ Simple construction+ Add-on for individual existing

system+ Constant temperature

measurement+ 1 reference cell to correct for

- Illumination homogeneity Class B

- Currently limited to 16A- Discrete illumination levels

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

+ 1 reference cell to correct for intensity fluctuations

+ Inline compatibility

- 9 -

• Illumination level covers relevant range(1-1,5 suns)

• Option to measure 1-cell modules

• Direct rearside illumination instead of diffuse light

Page 10: 13 edler isc konstanz

Problems with fast IV-Sweeps

− Fast voltage sweeps induce IV curve distortion

− Significant for all high-efficiency, high resistivity and especially for n-type based cells

− Depending on measurement direction and illumination intensity

6

8

10

[A]

FF=75,3%

FF=80,1%

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

intensity− Asymmetric effect− Not limited to bifacial

measurements− ISC and VOC evaluation not

affected

- 10 -

0

2

4

0,3 0,4 0,5 0,6 0,7

I [A

]

U [V]

OC-SC

SC-OC

Page 11: 13 edler isc konstanz

Diffusion capacitance explained

1E+12

1E+13

1E+14

1E+15

MC

D d

ensi

ty [c

m-³

]

U=0VU=0,3VU=0,5V

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

− Diffusion capacitance consists of bulk minority charges.− Applying forward bias changes equilibrium concentration by orders of

magnitude! » large amounts of charge − Allocation/ generation of these charges in “ms” range requires a

charging current, which is subtracted from external current» Measurement error

- 11 -

1E+110 50 100 150

distance from junction [µm]

U=0,5VU=0,6V

Page 12: 13 edler isc konstanz

8,0

8,5

4,4

MPP scan approach

− 1st measurement to collectISC &VOC values

− 2nd measurement to scan narrow MPP interval only

» We artificially extend the measurement time available

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

0,44 0,55

7,5

8,0

0,48 0,50 0,52 0,54 0,563,8

4,0

4,2

I [A

]

U[V]

MPP scan SC-OC MPP scan OC-SC SC-OC full IV scan OC-SC full IV scan

P [W

]

U [V]

measurement time available for each data point

» Self-validating method as scans in both directions match

» Works for all cell types available at ISC

- 12 -

Page 13: 13 edler isc konstanz

Bifacial measurements

FF [%] ISC [A]

77

77,5

78

78,5

12

13

14

15

textured rear1

textured rear2

flat rear (2Ohm cm)

flat rear (5Ohm cm)

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

Cell types: textured rearside vs. flat rearsidelow vs. high resistivity

- 13 -

Effective Intensity [suns]

75

75,5

76

76,5

77

1 1,1 1,2 1,3 1,4 1,5

8

9

10

11

12

1 1,1 1,2 1,3 1,4 1,5

flat rear (5Ohm cm)

Bifacial Bifacial

Page 14: 13 edler isc konstanz

Bifacial measurements

VOC [mV]

PMPP[W]

644

646

648

650

652

654

textured rear14

4,5

5

5,5

6

6,5

7

1 1,1 1,2 1,3 1,4 1,5

Bifacial

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012 - 14 -

636

638

640

642

1 1,1 1,2 1,3 1,4 1,5

textured rear1

textured rear2

flat rear (2Ohm cm)

flat rear (5Ohm cm)

1 1,1 1,2 1,3 1,4 1,5

17

17,5

18

18,5

19

19,5

20

1 1,1 1,2 1,3 1,4 1,5

η [%]

Effective intensity [suns]

Bifacial

Bifacial

Page 15: 13 edler isc konstanz

Bifacial measurements

8

10

12

14

16

18f(0-1),r(0)

f(0), r(0-1)

f(1), r(0-0,5)

f(0-1), r(1)

sum f(0),r(0-1)+f(1)

74

75

76

77

78FF [%] IMPP [A]

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012 - 15 -

0

2

4

6

8

0 0,5 1 1,5 2

71

72

73

74

0 0,2 0,4 0,6 0,8 1 1,2 1,4

Effective intensity [suns]

BifacialSingle side BifacialSingle side

Measurements show linearity in ISC and IMPP

» Both could be used for cell sorting

Page 16: 13 edler isc konstanz

Summary

− We have installed a setup for bifacial measurements in our Berger flasher

− IEC flasher measurement criteria could be fulfilled, with the exception of spacial homogeneity required for Class A

− A solution for the accurate testing of high capacitance cells was found− Initial measurements have demonstrated suitability for bifacial

investigations

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

− No obvious reason for inline bifacial sorting found

We measure your cell!

- 16 -

Page 17: 13 edler isc konstanz

Summary

− We have installed a setup for bifacial measurements in our Berger flasher

− IEC flasher measurement criteria could be fulfilled, with the exception of spacial homogeneity required for Class A

− A solution for the accurate testing of high capacitance cells was found− Initial measurements have demonstrated suitability for bifacial

investigations

Alexander Edler, bifiPV workshop, Konstanz, April 23rd 2012

− No obvious reason for inline bifacial sorting found

We measure your cell!

- 17 -

Thank you for your attention!