2. background vn vp...1 and c 2 c 1 ) , c 2 ) 1hz 10hz 100hz 1khz 10khz 100khz 30db-10db-50db 60db...

1
Optimization of phase compensation constants C 1 =1nF, C 2 =0.1μF NULL Circuit Fast and Stable Switching C 1 and C 2 depending on the measurement item Settling time reduction 1/10 オペアンプ試験技術Null法のシミュレーション・実測評価 青木里穂 片山翔吾 佐々木優斗 町田恒介 中谷隆之 王建龍 桑名杏奈 畠山一実 小林春夫 1. Research Objective [1] J. M. Bryant, “Simple Op Amp Measurements”, Analog Dialogue, vol. 45. pp 2123 (2011). [2] Op Amp Applications Handbook, Analog Devices, (2004). [3] K. Blake, “Op Amp Precision Design: PCB Layout Techniques”, Microchip Technology Inc., Tech. Rep. AN1258 (2009). [4] R. Dopkin, Analog Circuit Design, Linear Technology (2013). [5] G. Robert, F. Taenzler, M. Burns, An Introduction to Mixed-Signal IC Test & Measurement, 2nd edition, Oxford University Press (2012). [6] Y. Sasaki, K. Machida, R. Aoki, S. Katayama, T. Nakatani, J. Wang, K. Sato, T. Ishida, T. Okamoto, T. Ichikawa, A. Kuwana, K. Hatayama, H. Kobayashi, "Accurate and Fast Time Testing Technique of Operational Amplifier DC Offset Voltage in μV -order by DC-AC Conversion", IEEE 3rd International Test Conference in Asia, Tokyo (Sept. 2019). References 5. Conclusion 4. SPICE Simulation Verification Accurate and Fast measurement of Operational Amplifier For reliable and low-cost IoT systems Approach 2. Background - + Differential inputs Single-ended output Extremely high gain Operational Amplifier Apply NULL method to mass production testing Goal Measurement time : Long Mass production testing : Difficult NULL Method Good capacitor value selection Fast, stable operation V P V N Measured Operational Amplifier Auxiliary Operational Amplifier Operational Amplifier : Vendor provided SPICE model 3. NULL Method Prototype Experimental Circuit using NULL Method Input sine wave (1mV P-P , 1kHz) Change C 1 and C 2 C 1 =0.1μF , C 2 =0.1μF 1Hz 10Hz 100Hz 1kHz 10kHz 100kHz 30dB -10dB -50dB 60dB Vout C 1 =1nF, C 2 =0.1μF 1Hz 10Hz 100Hz 1kHz 10kHz 100kHz 1MHz 36dB 0dB 60dB Vout fc30Hz Slow Optimal value : C 1 =1nF, C 2 =0.1μF fc1kHz Fast < Offset Voltage > Square wave input (1μV P-P , 1Hz) - + + Ideal + = In practice + Vout= 1mVp-p 0.0s 0.4s 0.8s 1.2s 1.6s 2.0s 0μV 400μV 200μV - 400μV - 200μV - 600μV 1μV P-P 1mV P−P Easy Measurement < CMRR > R L [] CMRR [dB] 2 126 10 126 100 126 V P +2.5V +3.0V V N -2.5V -2.0V Vout= 500uVp-p 1nF 0.01uF 0.1uF 40ms 120ms 200ms 280ms 360ms 4mV 8mV 0mV -4mV -8mV When R L =10kΩ, C 1 =1nF, C 2 is varied R L → 10kΩ, C 1 1nF, C 2 Large CMRR Fast response No.1 No.2 No.3 No.4 No.5 131 131 134 115 125 Experimental results (dB) for R L =10kΩ NULL Method Minus input voltage of amplifier Zero potential with servo loop < Frequency Characteristics > 30 times faster Almost the same Minute error ×1,000 Measure Simulation results 群馬大学 理工学府 電子情報・数理教育プログラム ローム(株) Fast Key device in IoT systems 佐藤賢央 石田嵩 岡本智之 市川保

Upload: others

Post on 05-Jul-2020

1 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: 2. Background VN VP...1 and C 2 C 1 ) , C 2 ) 1Hz 10Hz 100Hz 1kHz 10kHz 100kHz 30dB-10dB-50dB 60dB Vout C 1 =1nF, C 2 ) 1Hz 10Hz 100Hz 1kHz 10kHz 100kHz1MHz 36dB 0dB 60dB Vout fc≅30Hz

• Optimization of phase compensation constants

C1=1nF, C2=0.1μF

NULL Circuit → Fast and Stable

• Switching C1 and C2 depending on the measurement item

Settling time reduction → ≒ 1/10

オペアンプ試験技術Null法のシミュレーション・実測評価

青木里穂 片山翔吾 佐々木優斗 町田恒介 中谷隆之 王建龍 桑名杏奈 畠山一実 小林春夫

1. Research Objective

[1] J. M. Bryant, “Simple Op Amp Measurements”, Analog Dialogue, vol. 45. pp 21–23

(2011).

[2] Op Amp Applications Handbook, Analog Devices, (2004).

[3] K. Blake, “Op Amp Precision Design: PCB Layout Techniques”, Microchip

Technology Inc., Tech. Rep. AN1258 (2009).

[4] R. Dopkin, Analog Circuit Design, Linear Technology (2013).

[5] G. Robert, F. Taenzler, M. Burns, An Introduction to Mixed-Signal IC Test &

Measurement, 2nd edition, Oxford University Press (2012).

[6] Y. Sasaki, K. Machida, R. Aoki, S. Katayama, T. Nakatani, J. Wang, K. Sato, T. Ishida, T.

Okamoto, T. Ichikawa, A. Kuwana, K. Hatayama, H. Kobayashi, "Accurate and Fast Time

Testing Technique of Operational Amplifier DC Offset Voltage in μV-order by DC-AC

Conversion", IEEE 3rd International Test Conference in Asia, Tokyo (Sept. 2019).

References

5. Conclusion

4. SPICE Simulation Verification

Accurate and Fast measurement of

Operational Amplifier

For reliable and low-cost IoT systems

Approach

2. Background

-

+

Differential inputs Single-ended output

Extremely high gain

Operational Amplifier

Apply NULL method to mass production testing

Goal

Measurement time : Long

Mass production testing : Difficult

NULL Method

Good capacitor value selection

Fast, stable operation

VP

VN

Measured

Operational Amplifier

Auxiliary

Operational Amplifier

Operational Amplifier :

Vendor provided

SPICE model

3. NULL Method Prototype

Experimental Circuit

using NULL Method

Input sine wave

(1mVP-P , 1kHz)

Change

C1 and C2

C1=0.1μF, C2=0.1μF

1Hz 10Hz 100Hz 1kHz 10kHz 100kHz

30dB

-10dB

-50dB

60dB Vout

C1=1nF, C2=0.1μF

1Hz 10Hz 100Hz 1kHz 10kHz 100kHz 1MHz

36dB

0dB

60dB Vout

fc≅30Hz Slow

Optimal value :

C1=1nF, C2=0.1μF

fc≅1kHz Fast

< Offset Voltage >

Square wave input

(1μVP-P , 1Hz)

-

+𝑉𝑖𝑛+𝑉𝑖𝑛−

Ideal 𝑉𝑖𝑛+ = 𝑉𝑖𝑛−

In practice 𝑉𝑖𝑛+ ≠ 𝑉𝑖𝑛−

Vout=1mVp-p

0.0s 0.4s 0.8s 1.2s 1.6s 2.0s

0μV

400μV

200μV

-400μV

-200μV

-600μV

1μVP-P 1mVP−P

Easy Measurement

< CMRR >

RL [kΩ] CMRR [dB]

2 126

10 126

100 126

VP … +2.5V → +3.0V

VN … -2.5V → -2.0V

Vout=

500uVp-p1nF0.01uF

0.1uF

40ms 120ms 200ms 280ms 360ms

4mV

8mV

0mV

-4mV

-8mV

When RL=10kΩ, C1=1nF, C2 is varied

RL → 10kΩ, C1 → 1nF, C2 → Large

CMRR → Fast response

No.1 No.2 No.3 No.4 No.5

131 131 134 115 125

Experimental results (dB) for RL=10kΩ

NULL MethodMinus input voltage of amplifier

→ Zero potential with servo loop

< Frequency Characteristics >

30 times faster

Almost the same

Minute error → ×1,000

Measure

Simulation results

群馬大学 理工学府 電子情報・数理教育プログラム

ローム(株)

Fast

Key device in IoT systems

佐藤賢央 石田嵩 岡本智之 市川保