薄膜材料解析x線回折装置 x-ray diffractometer · キーワード...

X

4

PHILIPSX'Pert-MRD XCuK2.2kW4

4XX()

InGaAs/GaAs

e-mailnkojima@toyota-ti.ac.jp

X-ray Diffractometerfor Thin Film Analysis

X1/4

R-AXIS RAPID(460mm256mm 100100 )XCu-K1.5418Mo-K0.7108127.4mm1/4-170200

e-mailktashiro@toyota-ti.ac.jp

X-ray Diffractometerfor Single Crystal Structure Analysis

X1/4

X20m1/4

R-AXIS RAPID IIMo VariMaxXXRA-Micro7HFM Crystal Structure ()XMo-Kl0.7108X31kW/mm2 1.05106

C9H13N3O5

e-mailktashiro@toyota-ti.ac.jp

X-ray Diffractometer for Structure Analysis of Small-size Single Crystal

XSAXSXPilatus

X2WAXDSAXSSAXS, WAXD,Raman

X Nanoviewer (Rigaku) Pilatus 100K 300K (Dectris) FTIR Alpha (Bruker) Raman Mobile Cube (Lambda Vision) LinkamLinkamLinkamRigakuHandmade

1mmIR

SAXS

e-mailktashiro@toyota-ti.ac.jp

X

Highly-Brilliant Small-angle X-ray Scattering Apparatus

XX

XXX30cm3

R-AXIS VII ()(300 mm300 mm 100m100m)XCu-K1.5418Mo-K0.7108105.9mm4500.255

160X

e-mailktashiro@toyota-ti.ac.jp

Dynamic Imaging-Plate System for Polymer Materials

XDSC

XD-tex/25XDSCX

RINT-TTR III ()D/teX-25(X)XCu-K(=1.5418)Mo-K(= 0.7108)403500.510/min1.5902.580o/min1095RH70

3mg

WAXDDSC

e-mailktashiro@toyota-ti.ac.jp

X

Simultaneous Measurement System of Powder X-ray Diffraction and Differential Scanning Calorimeter

X2XXPSPC

XXX20PSPCHi-StarX

DIP1000 (MAC Science)2002008080mHi-STARPSPCWeissenberg

WAXDSAXS

e-mailktashiro@toyota-ti.ac.jp

X

Transmission X-ray Diffractometer with Imaging Plate Detector