what’s new in ic-cap 2011 - keysight · ic-cap 2011.04 what’s new page 1 april 2011 what’s...

IC-CAP 2011.04 What’s New

April 2011

What’s new in

IC-CAP 2011.04

Overview of the new

capabilities included in

IC-CAP 2011.04

April 2011

Device Modeling Marketing Team

Agilent EEsof EDA

IC-CAP 2011.04

Agilent’s IC-CAP Recent History


April 2011


April 2011

IC-CAP 2011.04 new features at glance

Turn-key add-on products:

Agilent W8510 IC-CAP Wafer Professional (WaferPro) (upgrade)

o New Prober drivers, examples and tutorials, UI and programming enhancements

CMOS Packages Model Versions and other Upgrades, BSIM 4.6.5, PSP 103.1, BSIMSOI 4.3

CMOS Measurement Package now works with IC-CAP WaferPro (new)

New Measurement and Simulation Capabilities:

B1505A driver now supports more than one pulsed unit

User customizable SMU On/Off Units Order

TAMS L488 LAN-GPIB adapter is now supported

Several Simulation Enhancements: support for .PARAM command in HSPICE

ADS Verilog-A support is now included in IC-CAP Analysis license

New UI and Usability Features:

Title and footer in Multiplots are now enabled

Plot any data in setups (including non-rectangular data)

Use checkbox to enable/disable parameters in optimizers tables

Extra field “Comment” added to Variable Table

All Supported OS/Platform:

Windows XP SP3, Vista, Windows 7 (new)

LINUX RH4 and RH5

Solaris 10 (last release)

Important Notice about Platform Support

Support for Solaris Platform will be discontinued starting

on the IC-CAP 2012 release.

Our next release, IC-CAP 2011.0x will be the last release on

Solaris.


April 2011

Operating System Windows Red Hat Linux HP-UX Solaris

32/64 Bit 32 32 32 32 32/64 32/64 32/64 32/64 32 64

OS Version 2000 XP Vista Win7 RHEL3 RHEL4 RHEL5 11iPA-RISC 10 10

IC-CAP 2010.08

IC-CAP 2011.04

IC-CAP 2011.0x

IC-CAP 2012.xx

DROPPEDSUPPORTED DEPRECATED

IC-CAP 2011.04 Licenses

• New Licenses (Flex Version 2.9) are

required.

• New IC-CAP License Wizard helps

setting up licenses.

• ICCAP_LICENSE_FILE

environment variable replaces

AGILEESOFD_LICENSE_FILE

• http://edocs.soco.agilent.com/displa

y/iccap201101/IC-

CAP+License+Setup

From the Programs Menu:


April 2011

License wizard detects license

status and helps user to request

and/or setup new license file.

http://edocs.soco.agilent.com/display/iccap201101/IC-CAP+License+Setup





April 2011

The BIG PICTURE: IC-CAP Architecture

IC-CAP Environment

• Programming Extraction Language (PEL)• Graphic Capabilities• IC-CAP GUI Studio• Switch Matrix and prober drivers

IC-CAP Analysis

• Optimizers• Simulator (spice3 and DC, AC, transient, Verilog-A for ADS)• Plot Optimizer

DC

AC

LRZ/C-V

Time Domain

Noise

BSIM3

BSIM4

PSP HiSIM2

AHBT

Agilent Turn-key Extraction Packages

Si BJT

MESFET

PHEMT

SPECTRE-MMSIM

Link to 3rd-party simulators

HSPICE

ELDOSABER

IC-CAP Modeling Suite

Target

Third-party Extractions (BJT)

Root

Measurement Drivers

IC-CAP core product

spice3ADS

HiSIM_HV

CornerBSIM4SOI

WaferPro Automated

Measurement Environment

What is IC-CAP Wafer Professional (WaferPro)?

Makes possible efficient, well defined methodology for identifying

typical, corner and statistical data for device modeling

Eliminate need for equipment supervision (run measurements

overnight), increase team efficiency

Optimize utilization of lab equipment

Turn-Key Automated Measurement Solution:

Fully automated single and multi-wafer measurements across temperature

Drivers for most common probers, switch matrixes, and thermal controlled chucks included

Full wafer map support

Fast—supports measurements with 407X and 408X Agilent Parametric Test systems

No operator supervision required, wafer realignment at temperature change is automatic

View real-time results, status, data and plots without interrupting test

Graceful exception handling per user-defined Pass/Fail criteria

Advanced architecture allows efficient organization of data and fast data analysis & processing

Test plans run seamlessly on different test stations with different hardware

Supports broad range of DC and RF measurements


April 2011


April 2011

IC-CAP Wafer Professional - Overview

WaferPro is powerful,

flexible and easy to

navigate and customize

What’s New in IC-CAP WaferProNew routines, examples and tutorials

• New basic example Routines are

available along with a new

tutorial.

• New Routines are available for

Bipolar, Diodes, Resistors, Ring

Oscillators and Capacitors.

• Getting Started ―Step by Step‖

tutorial now available


April 2011

What’s New in IC-CAP WaferProNew Prober/Matrix/Chucks Drivers

• Support for Tokyo Electron (TEL) P8 and P12 fully

automated wafer probers.

• Support for Keithley K70x in simple, bridge and invert

configurations.

• Support for Advanced Temperature Test (ATT) Thermal

Chucks

• On Windows, support for direct link between Nucleus and

ProberBench without using GPIB interface. This allows to

run IC-CAP and Nucleus/ProberBench on the same

Windows machine

Acknowledgements:

Agilent would like to thank Cascade Microtech, Tokyo Electron and Accretech for

their assistance in developing and testing the prober drivers.


April 2011

What’s New in IC-CAP WaferProWorking with the CMOS Modeling Packages

WaferPro now works in

conjunction with the

CMOS modeling

packages. It is now

possible to configure

WaferPro from the

CMOS Measurement

Package (1), create and

run a WaferPro project

(2,3), read measured

data back into the

CMOS Measurement

Package (4) and extract

the final library (5) with

the Extraction module.


April 2011

CMOS

Measurement

Module

CMOS

Extraction

Module

WaferPro

Run

Routines

Device Types

Device Table

WaferPro

Project File

.xml

Wafer Map

Dies

Device Lists

WaferPro Data

Repository

Select Data

for extraction

1

CMOS

Library

Project Data

2

3

54

What’s New in IC-CAP WaferProOther Enhancements

Bench View additional option bench variables

Temperature Tolerance (degC) – Let the user define the temperature resolution. When the difference

between current temperature and the desidered temperature is less than the Tolerance set by the user,

WaferPro will change the temperature.

Go Home Before Die Move – Option to Move the probe head back to the Home position.

Go to Reference When Die Changes – Option to move the probe head back to the Reference point.

Instrument View

Measure During Stabilization - During the stabilization delay due to a temperature change, WaferPro may

begin performing measurements while running automated alignment every 5 minutes.

Stabilize at First Step - Optimize the stabilization sequence.

Block and Subsites Definition

NOCONTACT - Measurement is performed without contacting the device. This is useful for calibrating the C-

V meters using capacitance measurements.

Fill Subsite Positions by Pitch - Calculates Subsite positions using specified base and pitch.

Single Run and Debug

Contact Before Exe – Option to automatically contact the wafer before executing Single/Debug mode.

Clear Log - Clear execution or error logs.


April 2011

http://edocs.soco.agilent.com/display/iccap201101/Configuring+a+WaferPro+Project







http://edocs.soco.agilent.com/display/iccap201101/Block+and+Subsites+Definition





http://edocs.soco.agilent.com/display/iccap201101/Single+Run+and+Debug

http://edocs.soco.agilent.com/display/iccap201101/Single+Run+and+Debug

What’s New in CMOS Modeling PackagesModel Updates

• HiSIM_HV 1.2.1 for High

Voltage / High Power

CMOS

• BSIM4 is now version

4.6.5

• BSIM4SOI is now version

4.3 in ADS

• HiSIM2 and HiSIM_HV

latest version are

supported using Verilog-

A with ADS. (Verilog-A

license is now included in

IC-CAP Analysis)


April 2011

Model

Model

Version

Extraction

(IC-CAP)

Agilent

ADS

2011_01

Agilent

Verilog-A

with ADS

HSPICE

E2010.12-

SP1

MMSIM

10.1

ELDO

2010.02

BSIM3 3.3.2.4 3.3 _ 3.3.2.4 3.3 3.3.2.4

BSIM4 4.6.5 4.6.5 _ 4.6.6 4.6.5 4.6.5

BSIMSOI4 4.4.0 4.3 _ 4.3.1 4.3.1 -

HiSIM2 2.5.1 2.4.1 2.5.1 2.5.0 2.5.0 -

HiSIM_HV 1.2.1 1.2 1.2.1 1.2.1 1.2.1 -

PSP 103.1.1 103 _ 103.1.2 103.1.1 -

What’s New in the CMOS Modeling PackagesOther new features


April 2011

• A safe operation area (SOA) can be

defined. This feature prevents

measurements of devices using drain

voltages and currents which lead to

excess power consumption and a

possible device breakdown.

• Enable/disable measurement setups.

• Change the order of execution of the

measurement sets.

• Add custom parameters to a given

model. This can be useful in

implementing effects which are not

presently included into a given

simulation model. An example can be

the resistance of connect lines to the

drain of a transistor which could be

included into the simulation model.

• It is now possible to import measured

data from other measurement software.

Select Configuration>

Configure Measurement Set

SOA Options

Enable/disables setups

define order

What’s New in IC-CAP PlatformMain changes in simulation

• The .PARAM statement is now supported for

spice syntax. Parameters defined with the

.PARAM statement in tab 'Circuit' will appear

in the tab 'Parameter Table'. When Defined

in tab 'Test Circuit' on a DUT, they will

appear in the tab 'DUT Parameters'.

Other distribution is possible applying the

keywords #echo, $mpar() and $dpar().

Note:not all simulators support the .PARAM

statement.

• You can now perform VerilogA simulations

with ADS 2011.01 as part of standard IC-

CAP simulation capability, without the

requirement to purchase a separate ADS

license to run VerilogA (you must have a 2.9

version of iccap_analysis license).


April 2011

What’s New in IC-CAP PlatformIC-CAP PEL

• New function EVALUATE_TRANSFORM() is now available in PEL language.

x = EVALUATE_TRANSFORM(<Transform Name>, args)

It is equivalent to:

ICCAP_FUNC(<Transform Name>, "Execute―, <args>)

x = DATASET(<Transform Name>)

Application: simplified PEL structure when working with the DEPOTS concept

For an application example, see examples/demo_features and then

3_MEAS_ORGANIZE_n_VERIFY_DATA/0_MASTER_FILES/DIODE_MEAS_MASTERFILE_demodata_PELdep.mdl

and Dut/Setup/Transform NWA_Spar/Spar_Diode_on/S_deemb_open

• Matrix indexes can be specified for the dataset call.

For example, x=DATASET(mydata.12) now works.


April 2011

What’s New in IC-CAP PlatformIC-CAP UI

• IC-CAP Variable Tables now

have an extra Comment field

to aid with documentation of

custom extraction PEL.

• System variable

ICCAP_EDITOR_FONT_SIZE

controls the size of the font

used in Macro/transforms and

circuit pages. Available sizes:

7,8,9,10,14 or 15.

• Selection of parameters for

optimization in the Plot

Optimizer or normal Optimize

transform can now be done by

using a check box


April 2011

What’s New in IC-CAP PlatformIC-CAP Plots

• Specify Header and Footer in

Multiplot Studio type plots.

• Specify 2nd

order sweep

information in a plot using

Curve Data field

(see next slides for details)

• The new system variable

SCATTER_NUM_SIGMAS

controls the number of

contours displayed in a

scatter plot.


April 2011

In Multiplot Tile

definition

What’s New in IC-CAP PlatformIC-CAP Plots – Non Rectangular Data

• Specify 2nd

order

information in a plot using

Curve Data field

• The new system variable

SCATTER_NUM_SIGMAS

controls the number of

contours displayed in a

scatter plot.


April 2011

Before 2011

power compliance

representation

IC-CAP 2011

NOTE: Requires user to write PEL code to select and represent data

For an example, see

demo_features\4_PLOT\2_Handling_of_nonrectangular_data_in_Plots.mdl

Controlling SMU Order

• It is now possible to control the

ON/OFF order of SMU’s when

running a DC or combined DC/AC

measurements to avoid stressing the

device in unsafe operating

conditions.

• To set the order, use the system

variables:

UNIT_ORDER_ON

UNIT_ORDER_OFF


April 2011

Instrument Unit Table in the

Hardware Setup Window

Set the SMU order

in the variables

In this example, the

frequency is the inner

sweep, however, user can

control the order the bias is

turned on (Source, Drain,

Gate) and off (usually

reverse order)

IC-CAP 2011.04 on the Web

Web page:

http://www.agilent.com/find/eesof-iccap2011_04

(includes link to this presentation)

Download page:

http://www.agilent.com/find/eesof-iccap-latest-downloads

IC-CAP Main Page:

http://www.agilent.com/find/eesof-iccap


April 2011














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