경종민 [email protected] 1 future prospect of ic technology (itrs)-ii ( 계속 ) 2002. 9.16

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경경경 [email protected] 1 Future Prospect of IC Technology (ITRS)-II ( 경경 ) 2002. 9.16

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Page 1: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

경종민 [email protected]

1

Future Prospect of IC Technology (ITRS)-II ( 계속 )

2002. 9.16

Page 2: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

2

Design Verification Challenges

[ ≤65nm / Beyond 2007 ]1. Design for verifiability

– New methodology needed• Understanding of how design errors occur

producing easy-to-verify design– Characterize and minimize performance and area

impact2. Higher levels of abstraction

– Verification methods for the higher-levels of abstraction

– Complexity of design enabled by higher-level design– Equivalence checking between higher-level and

lower-level models

Page 3: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

3

Design Verification Challenges

3. Human factors in specification– How to specify what I want, correctly and efficiently– Need to understand what kinds of specifications are

most understandable (clear vs. opaque)– Need to consider how to make specifications

modular and modifiable (not intractable)4. Verification of non-digital systems

– Hybrid systems verification for analog properties/effects

– Verification of probabilistic systems5. Heterogeneous systems

– How to model, analyze, and verify MEMS, EO devices, and electro-biological device

Page 4: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

4

Design Test• High speed device interface

– Faster I/O Speed: multiple GHz– Complex I/O protocol:

• simultaneous bidirectional, differential signaling with voltage swings of ~100 mV

• Highly integrated SOC design– Larger integrated devices

• Non-linear complexity growth for design tools, DFT, manufacturing test

– Integration of analog, mixed signal• Nonlinear increase in the cost of testability,

design verification, manufacturing test

Page 5: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Design Test Challenges[ ≥65nm / Through 2007 ]1. At-speed test with increasing frequencies

– Continuation of at-speed functional test with increased clock frequencies

– At-speed structure test with increased clock frequencies– Test and on-chip measurement techniques for multi-GHz serial

ports

2. Capacity gap between DFT/Test generation/Fault grading tools and design complexity– Better EDA tools for advanced fault models– DFT to enable low-cost ATE– Non-intrusive logic BIST– AMS DFT/BIST, especially at high frequencies

3. Quality and yield impact due to test equipment limits– Power and thermal management during test– Fault diagnosis and design for diagnosability– Yield improvement and failure analysis tools and methods

Page 6: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Design Test Challenges4. Signal integrity testability and new fault models

– Signal integrity testability– Fault models for analog failures

5. SOC test– Integration of SOC test methods onto test

equipment platform– Integration of multiple fabric-specific test

methodologies– DFT, BIST and test methods compatible with core-

based SOC environment and constraints– Embedded memory built-in self-diagnosis and self-

repair – Test reuse

Page 7: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

7

Design Test Challenges[ ≥65nm / Beyond 2007 ]1. Integrated self-testing for heterogeneous SOCs

– Test of multi-GHz RF front-ends on chip– Use of on-chip programmable resources for SOC

self-test– Dependence on self-test solution for SOC– (Analog) signal integrity test issues caused by

interference from digital to analog circuitry– Test methods for heterogeneous SOC including

MEMS and EO components

Page 8: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Design Test Challenges2. Diagnosis and reliability screens

– Diagnosis and failure analysis for AMS parts– Design for efficient and effective burn-in to screen

out latent defects– Quality and yield impact due to test equipment

limits– New timing-related fault models for defects/noise in

nanometer technologies3. Fault tolerance and on-line testing

– DFT and fault tolerant design for logic soft errors– Logic self-repair using on-chip reconfigurability– System-level on-line testing

Page 9: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

경종민 [email protected]

9

IP Reuse2002. 9. 16

Page 10: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

10

Contents• Introduction to IP reuse• Design for reuse• Efforts for IP reuse• On-chip bus-based SoC architecture for IP

reuse• Virtual component interface

Page 11: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Contents• Introduction to IP reuse

– SoC (System-on-Chip)– Productivity gap– New design methodology– Advantage of IP reuse– Difficulties of IP reuse

• Design for reuse• Efforts for IP reuse• On-chip bus-based SoC architecture for IP reuse• Virtual component interface

Page 12: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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2008 year(0.07m)

130,000,000 gates

4%

SoC (System-on-Chip)• SoC era is opened due to

– Increasing silicon capacity and– Shrinking time-to-market.

Source : SIA roadmap

1999 year(0.18m)

5,250,000 gates

MPEG2 Decoder (4%): 200,000 gates

TMS320C50 (1%) 40,000 gates

MPEG2 Encoder (27%): 1,400,000 gates

Page 13: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Productivity Gap

Productivity Gap

Silicon capacity

1988 1992 1996 2000

Design capability

0.8u 0.6u0.5u

0.35u

0.18u

10

1

# of Tr./Chip(million)

100

Page 14: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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New Design Methodology• IP reuse is a solution to the productivity gap.• What is IP?

– IP (Intellectual Property) is composed of• Design file and document file• License (copyright, patent, and trade secret)• Technical support

– Pre-designed and pre-verified macro block– Other names: VC (Virtual Component), core

IPSoC

Page 15: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Advantage of Reuse

Design Effort (for a specific function)

Project (where a specificfunction is required.) Design for Reuse

= IP Development

Design by Reuse = Design Reuse

Design for one-time use

1st 2nd 3rd 4th 5th

Productivity is improved by using the well-designed IP’s.

Page 16: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Reuse or not, that’s the Question!

• Design of IP for external reuse ; >3~5 X development cost (vs. one-time use), Not very often due to cost,.., typically one or two per chip now.

• Design of IP for internal reuse ; 2~3 X dev. cost (vs. one-time use, occurs quite often.

• Instantiation of IP developed for reuse ; 10 x productivity boost in instantiation, while IP developed for one-time use incurs 2 x prod. boost (compared to non-reuse)

• Development for reuse? Domain-independent IP must be developed for reuse; domain-specific IP like multi-media or data communication blocks maybe yes if planned to be used on several product generations or several different products in a short period of time, like within 2 years; application-specific blocks probably not.

• Reuse occurs more often than we think, i.e., through adding new features, fixing bugs, improving performance, or further integration, etc. (white box reuse vs. black box reuse)

Page 17: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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IP Specification and its translation

• Formal vs. executable specification; Formal specification handles functional behavior, timing, power and area, but not quite commercial, while Executable spec includes onlt function but commercial like C, C++, S 이 , vera, Specman, etc.

• Design procedure can be either Waterfall or Spiral; waterfall works until 0.35 micron; spiral approach simultaneously considering hw, sw, power, timing and physical is necessary below 0.18, definitely.

• Correct by construction(waterfall, or top-down) or construct by correction (UltraSPARC project at SUN)?

• Top down or Bottom up? Where do they meet? Downward path; translate(refine) the upper level specification; Upward path; integrate and verify

Page 18: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Difficulties of IP Reuse• Standardization problem of IP deliverables

– Is a simple concept, but actually difficult. (due to culture difference and communication barriers)

• Marketing problem– IP marketing strategy, media, license, pricing

policy

• Security problem– Tradeoff between accessibility and theft

protection

• Management problem– Version control, search, backup and interface

between CAD tools

Page 19: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

19

Contents• Introduction to IP reuse• Design for reuse

– Principles– Modeling guideline– IP deliverables– IP classification– Factors in selecting IP’s

• Efforts for IP reuse• On-chip bus-based SoC architecture for IP reuse• Virtual component interface

Page 20: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Design for Reuse• Principles

– A module will be modified and reused in other projects by other design teams.

– A module must be easy to be integrated into a design even without the original designer.

• Techniques for design reuse (= good design techniques)– Good documentation– Good code– Thorough commenting– Well-designed verification environments– Robust scripts

• We already learned these techniques, but in the pressure of a real design project → can’t get reusable design.– Additional effort is required for reusable design, as an early

investment on the future project.

Page 21: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Modeling Guideline• The RTL description of soft IP’s must have

– Consistency, readability, portability, interoperability, and synthesizability.

• RMM (Synopsys) presents RTL coding guidelines on– Naming convention: signal, variable, port name and more– Coding for portability– Guidelines for clocks and resets– Coding for synthesis– Designing with memories– Code profiling

• For example,– Use registers for all outputs (even inputs if possible)– Use flip-flop instead of latch– Use single edge & single clock– Use synchronous RAM

Page 22: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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RMM• Reuse Methodology Manual (RMM)

– Is used as a text book for reusable design• Written by Michael Keating (Synopsys, Inc.)

and Pierre Bricaud (Mentor Graphics Corp.)– Focus

• How to fit reusable IP’s into SoC development methodology

• How to design reusable soft and hard IP’s• How to integrate IP’s into SoC design• How to verify timing and functionality in

large-scale SoC designs

Page 23: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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IP Deliverables• IP deliverables

– Documentation– Test scheme– Related test bench– Interface– Behavioral model– Emulation model– Test sheet– Synthesizable RTL HDL model– Gate-level netlist

Page 24: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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IP Classification• Hardware IP’s

– In terms of hardness• Hard IP’s : given as a layout (placement & routing

done )• Soft IP’s : given as a synthesizable description

– RTL(Register Transfer Level) description: Verilog, VHDL

• Firm IP’s : with floorplanning and placement done– In terms of programmability

• Processor IP’s• Fixed function hardware IP’s

• Software IP’s– C code: Complex algorithm, speed-optimized code– Assembly code:

Page 25: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Hardware IP’s Tendency

Hard IP

Soft IP

Class Tendency

custo

miza

bl

e

pre

dicta

bl

e

porta

bl

e

tech

. d

ep

en

dent

long

desig

n

time

Page 26: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Functionality

Performance

Power

Area

Interface

Support tools

Trade-off

Factors in Selecting IP’s

Credibility

Business terms

Silicon technology

Technical support

…and more

Reuse quality

Page 27: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Selecting Processor IP’s• Processor IP Selection Criteria

– power, performance, area, cost– flexibility– hardness(hard IP vs. soft IP)– available system software(compiler, assembler)– development environment(in-circuit emulator)– simulation model(speed & accuracy)– supported library– supported OS– inter-operability with other IP’s

Common criteriafor all kinds of IP’s

Specific criteriafor processor IP’s

Page 28: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Contents• Introduction to IP reuse• Design for reuse• Efforts for IP reuse

– VSI– Design and Reuse (D&R)– RMM– MORE program

• On-chip bus-based SoC architecture for IP reuse

• Virtual component interface

Page 29: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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VSI• Virtual Socket Interface (VSI) Alliance: www.vsi.org

– An industry group working to facilitate the adoption of design reuse

• Object– Define, develop, authorize, test and promote “open

standard specifications on IP’s”• Development Working Groups (DWG): Define details of IP

deliverables– System Level Design DWG– Manufacturing Related Test DWG– On-Chip Busses DWG– Mixed Signal Design DWG– Implementation/Verification DWG– IP Protection DWG– Virtual Component Transfer DWG

Page 30: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Design and Reuse (D&R)• Design and Reuse: www.design-reuse.com

– A private company but public

• Provided services– IP yellow page service (catalog and

advertisement)– IP marketing/sales assistance service– Tools and services on IP qualification and IP

prototyping

Page 31: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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MORE Program• MORE (Measure Of Reuse Excellence)

assessment program calculates MORE metric– www.openmore.com– Spreadsheet-based assessment (10 pages)– 150 rules and guidelines based on RMM

• 30 are language-specific (VHDL or Verilog)– Tested with IP companies in Pilot Program

• Weighting factors are being refined.– MORE is the reuse quality reference metric.

Page 32: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Section Item Type AssessmentUnweighted

Score Max ScoreWeighted

Score

I Macro Design Guidelines 11 18 30.56%3 System-Level Design Issues: Rules and Tools 7 12

3.2 Timing and Synthesis Issues 5 103.2.3 Reset 5 10

3.2.3.1

The basic reset strategy for the chip is documented, especially 1) synchronous or asynchronous, 2) internal or external power-on reset, 3) more than one reset (hard vs. soft reset), 4) each macro individually resettable, for debug purposes R S 5 10

3.3 Functional Design Issues 2 23.3.1 System Interconnect and On-Chip Buses 2 2

3.3.1.2If an on-chip busing scheme is used, then the appropriate bus strategy is selected for the different kinds of blocks used in the SoC design. G A 2 2

5 RTL Coding Guidelines 4 65.2 Basic Coding Practices 4 4

5.2.1 General Naming Conventions 4 4

5.2.1.2 Lowercase letters for all signal names, variable names, and port names. G A 2 25.2.1.3 Uppercase letters for names of constants and user-defined types. G A 2 2

5.3 Coding for Portability 0 25.3.3 Packages 0 0

5.3.3.1

If VHDL, then all parameter values and function definitions for a design put into a single separate file (a "package") and named <DesignName>_package.vhd. G NA 0 0

5.3.4 Include Files 0 2

5.3.4.1If Verilog, then keep the `define statements for a design in a single separate file.* G N 0 2

MORE Program

Design rules for reusable design Assessment

MORE metric

Page 33: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Contents• Introduction to IP reuse• Design for reuse• Efforts for IP reuse• On-chip bus-based SoC architecture for IP

reuse– SoC architecture overview– A typical SoC architecture– System bus vs. peripheral bus– On-chip buses

• Virtual component interface

Page 34: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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SoC Architecture Overview• SoC architecture trend

– At least one programmable processor– Hierarchical bus architecture

• Processor bus > system bus > peripheral bus– Synchronous bus clocking (single clock)– Various proprietary on-chip buses (OCB)

Page 35: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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A Typical SoC Architecture

CPU Co-processor Cache

Processor bus

Peripheral bus

CoreOCB BridgeCoreCoreIP’s with

low bandwidth

System bus

ArbiterCPU BridgeCoreCoreCoreIP’s with

high bandwidth

Page 36: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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System vs. Peripheral Bus

System bus Peripheral bus

Multiple master operation

Single bus master

Pipelined operation Non-pipelined operation

Single & Burst transfer Single transfer only

Split transaction support No split transaction

Cache support No cache support

Error code/timeout No timeout support

Timing analysis is required

Timing ensured by protocol

Page 37: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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On-Chip Buses– ARM (www.arm.com): AMBA

• AHB(Advanced High-Performance Bus) / APB(Advanced Peripheral Bus)

– IBM (www.chips.ibm.com): CoreConnect• PLB(Processor Local Bus) / OPB(On-chip Peripheral Bus)

– PALM Chip (www.palmchip.com) • M Bus / Palm Bus

– Mentor Graphics (www.inventra.com) • FISP Bus

– OMI (www.omimo.be) • PI (Peripheral Interconnect) Bus

– Fujitsu (www.fujitsu.com) • Spcl Bus

Hierarchy of on-chip bus (from VSIA)

Page 38: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Research on IP Integration

global system specification and designspecification language

exploration&partitioning&architecture selection

software synthesis

interface&communication

synthesis

hardware synthesis

co-verification

prototype/real product development

property assessment (performance, cost, power, ...)

Co-design research focus

Page 39: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Contents• Introduction to IP reuse• Design for reuse• Efforts for IP reuse• On-chip bus-based SoC architecture for IP

reuse• Virtual component interface

– VCI– Cost of IP integration– Peripheral VCI– Basic VCI

Page 40: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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VCI• Standardized IP interface is required to minimize

integration cost.• Virtual Component Interface (VCI) Standard

– Defined by VSI Alliance for easy IP integration– Specification on IP interface, not on-chip bus– Support point-to-point connection between IP’s and

on-chip bus-based IP integration– Bus wrapper is used to connect VCI-compliant IP’s to

proprietary OCB’s.• VCI Family

– Peripheral VCI– Basic VCI– Advanced VCI

Page 41: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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OCBMaster

OCBSlave

VCI• Point-to-point • On-chip bus-based

integration

VCI-compliant IP

Master

Core

Slave

Core

Request

Response

Master

Core

Slave

Core

Slave Master

On-Chip Bus

Wrapper

Page 42: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Cost of IP Integration

Core

Very low Low High Very high

On-chip bus

matchinginterface

Core

VCI-compliantinterface

Wrapper

Core

mismatchinginterface

Wrapper

Core

customizedinterface

Wrapper

IP Integration Cost

When interface of IP matches

OCB

When interface of

IPis compliant

with VCI

When interface of

IP mismatches

OCB

When interface of

IP is customized for special purpose

On-chip bus On-chip bus On-chip bus

Page 43: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Peripheral VCI• Simple interface• Peripheral on-chip bus• Low-speed point-to-point

IP connection• Read or write at a time• Non-pipelined operation

PVCI Core

ADDRESSBE

WDATA

RDATARERROR

EOP

ACKVAL

RD

RESETNCLOCK

Read/Write command

Handshake

CommonSignals(ADDR/DATA)

Page 44: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Basic VCI• Peripheral VCI + • System on-chip bus• High-speed point-to-point

IP connection• Read and write are

independent of each other.

• Pipelined operation

ADDRESSBE

WDATA

RDATARERROR

EOP

CMDACKCMDVAL

CMD

RESETNCLOCK

CFIXEDCLEN

CONTIGCONST

PLENWRAP

RSPVALRSPACK

REOP

BVCI Core

Read/Write command

Handshake (Write)

CommonSignals(ADDR/DATA)

Handshake (Read)

Auxiliarysignals for

bursttransfer

Page 45: 경종민 kyung@ee.kaist.ac.kr 1 Future Prospect of IC Technology (ITRS)-II ( 계속 ) 2002. 9.16

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Summary• IP reuse can reduce the productivity gap in

SoC.• Modeling guidelines to design reusable

modules need to be set up before project start.• There are many factors in selecting IP’s,

technical, cost, cultural, business, etc.• Efforts for design reuse: VSI, D&R, MORE, VCX• On-chip bus-based SoC architecture is

presented.• Standardized IP interface (i.e,, VCI) is required

to minimize integration cost.