asml introduces the new generation twinscanŽ the … · asml arf roadmap 200 and 300 mm 150 nm 130...
TRANSCRIPT
![Page 1: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/1.jpg)
/ Slide 1
ASML Introduces theNew Generation TWINSCAN�the XT:1250
![Page 2: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/2.jpg)
/ Slide 2
The TWINSCAN XT:1250
� A 193-nm volume production tool for the 65-nm node� Aimed at the 200-mm and 300-mm markets� Ultra-k1 solutions portfolio as standard� A modular configuration
![Page 3: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/3.jpg)
/ Slide 3
Enhanced dual-stage performance� Improved imaging provides higher performance
0123456789
101112131415
130 115 100 90 80 70 65Design Rule
CD
U-3
sig
(nm
)
Exposure System CDU Requirement : ~7.5% of Design Rule
Single stage
XT:1250
![Page 4: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/4.jpg)
/ Slide 4
Enhanced dual-stage performance� Dual stages provide overlay advantage for higher
yield�more good die per wafer
Single stage AA
Single stage AB
68
1012141618202224262830323436
130 115 100 90 80 70 65Design Rule
Ove
rlay
(nm
)
XT:1250 AA
XT:1250 AB
Exposure System Overlay Requirement : ~25% of Design Rule
![Page 5: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/5.jpg)
/ Slide 5
Enhanced dual-stage performance� Dual stages provide an average of 22% greater
throughput across a range of die sizes
607080
90100110120
130140150
5x5
6x6
7x7
8x8
9x9
10x
10
11x11
12x
12
13x13
14x
14
15x15
16x
16
17x
17
18x
18
19x
19
20x
20
21x21
22x
22
23x
23
24x24
25x25
26x26
Die Size (mm)
XT:1250
300
mm
Thr
ough
put (
WPH
)
Single Stage
![Page 6: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/6.jpg)
/ Slide 6
ASML ArF roadmap 200 and 300 mm150 nm
130 nm
100 nm
90 nm
70 nm
1999 2000 2001 2002 2003 2004 2005
PAS 5500/1100NA=0.75
PAS 5500/950BNA=0.63
Very high NA & low k1 advances on compact TWINSCANTM platform
80 nm
Innovations for ArF lithography
Improvements for130-nm production
High NA for 100-nm production
Improvements for 90-nm production
/1100B0.75
AT:1100BNA=0.75
AT:1150C0.75
/1150C0.75
AT:1200BNA=0.85
XT:1250NA=0.85
PAS 5500TM
/900 NA=0.6
Very high NA for 80-nm production
Res
olut
ion
(nm
)
![Page 7: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/7.jpg)
/ Slide 7
Ultra-k1 products as a standard feature
� Addresses challenges in manufacturing with low k1
0.25
0.35
0.45
0.50
0.65
0.75
0.85
0.95
1000 500 350 250 150 90 45
K1
Val u
eG-line
I-line
KrFArF
F2
Resolution (nm)
![Page 8: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/8.jpg)
/ Slide 8
Ultra-k1 products
� Standard on the XT:1250� Mask design optimization
� Aberration measurement and control
� Process variability compensation
� Optional� Customized illumination
![Page 9: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/9.jpg)
/ Slide 9
XT:1250 imaging results: dense lines*
70 nm (BIM)
+0.05 �m0.00-0.05 �m +0.10 �m-0.10 �m-0.15 �m +0.15 �m140-nm pitch through focus. Binary mask. 70-nm lines: dipole NA=0.85, sigma 0.93/0.69.TArF6111, Ft=175 nm on Arc28
65 nm (AttPSM)Design on mask: 65-nm 1:1 pitch6% AttPSMDipole 35X illumination settingNA=0.85, sigma 0.93/0.69TArF6111, Ft=175 nm on Arc28
*Data acquired using an AT:1200B
![Page 10: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/10.jpg)
/ Slide 10
XT:1250 imaging results: dense contact holes*85 nm (AttPSM)
170-nm pitch6% AttPSMNA=0.85, sigma 0.93/0.69 QUASARTM-30Process: 250-nm TArF 7047, 82-nm AR19
-0.2µm +0.2µmnominal
80 nm (CPL**)
160-nm pitch1:1 contacts
75 nm (CPL)
150-nm pitch1:1 contacts
65 nm (CPL)
130-nm pitch1:2 contacts
**Reticle CPL� technology from ASML MaskTools*Data acquired using an AT:1200B
![Page 11: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/11.jpg)
/ Slide 11
A modular response to customer requirements
XT:1250 - a modular configuration
25% reduction in footprint 4.5 m
2.02 m
2.89 m1.2 m
2.0 m
0.6 m
![Page 12: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/12.jpg)
/ Slide 12
108 TWINSCANS INSTALLED Sep 03
XT built on established TWINSCAN platform - TWINSCAN installed base
12124646
5050
![Page 13: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/13.jpg)
/ Slide 13
Fab requirement specifications lowered
� Up to 50% reduction in facility requirements
� Process cooling water
� Clean dry air
� Exhaust heat load
� etc.
![Page 14: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/14.jpg)
/ Slide 14
The XT:1250: customer ordersShipping in Q2 2004
![Page 15: ASML Introduces the New Generation TWINSCANŽ the … · ASML ArF roadmap 200 and 300 mm 150 nm 130 nm 100 nm ... 1000 500 350 250 150 90 45 K 1 V al u e G-line I-line KrF ... sigma](https://reader038.vdocuments.pub/reader038/viewer/2022103108/5b3634ee7f8b9a3a6d8e0c07/html5/thumbnails/15.jpg)
/ Slide 15
Commitment