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IC Test Handler Series AL700 2016 October ATECO INC

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Page 1: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

IC Test Handler Series AL700

2016 October

ATECO INC

Page 2: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

Copyright reserved by ATECO(주)아테코

Confidential

2

1. Company Introduction

2. Features

3. Main Specification

4. Functions

5. Proposals

Contents

Page 3: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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3

Overview

Company Name ATECO Inc.

President Thomas Lee

Capital USD 750,000

Website www.ateco.co.kr

Established 2012 August 09th

Address

#306

274, Samsungro, Yeongtong-gu, Suwon-si

Gyeonggi-do 443-766, Republic of Korea

Business AreaTest Equipment for None Memory Semiconductor, MEMS,

Trading Business

We will create new business with passion and pride

Page 4: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

Copyright reserved by ATECO(주)아테코

ConfidentialOrganization

4

CEO/Thomas

R&D CenterSales TeamManagement

• SSD Test Chamber

• MEMS Related

• Non-Memory

• Trading Business

• Equipment Business

Remarks

Senior R&D Engineering Group with Over 18years Engineering

Experience in Semiconductor Industry such as Memory Test Handler,

LED Sorter, Wet Station, etc

Production

Page 5: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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Starting

~ 2014 ~ 2015

Buz Maximize

With High EndTri-Temp

MEMS8/16para

R&D

~ 2016

• MEMS Test Handler Localization

• Image Test Handler

• New Generation Handler

• Trading Business

• 8para Development

• SSD Test Chamber

• Market Survey

• Evaluation & Sales

• Tri-temp Development

• Active Thermal Control

• MEMS Survey

Growth Maximize Business areas

eB

iz V

alu

e

5

Growth StrategyATECO will grow and maximize its business area with high end products and

successful localization

R&D Resource for the No 1 Technology of Test Handlers & Global Sales Relationship

100% Benchmark

Competitive Price Add 2Nd Value

In Niche Market

Maximize Product

Values

Page 6: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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Features

6

Page 7: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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7

Logic Handler Series AL700

1. Handler Compatibility

Japan Seiko Epson

NS8040

NS8080 & NS8080W

NS8160

100% Compatible

2. 8Picker per Head

High Throughput : 13,000

Friendly User Interface

AL708

8para Handler

AL708

8Picker Structure

Page 8: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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8

Handler Layout

Load Color Tray Unload

Hot Plate

Test Site

Manual

Tray

Page 9: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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9

AL716 16/32Para Handler

Rear View Front View without Top Cover

Under Production

Page 10: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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10

1. Handler Compatibility

NS8040

NS8080 & NS8080W

NS8160

2. Small/Thin Package Handling

3. High Throughput with Short Index Time

4. Friendly User Interface

Page 11: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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Main

Specification

11

Page 12: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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12

AL708 Main Specifications

Throughput : 8300 UPH

(Octal, 4x2 Layout, Ambient, Test Time = 0~3sec)

Index Time : 0.4sec(Ambient, Hot )

Test Mode

Octal = 4x2 Layout, 40+40+40x60mm Standard Pitch

Quad = 2x2 Layout, 80x60mm Standard Pitch, Y Axis Max 63.5mm

4x1 Layout 40mm pitch

Single

Package Size : 3x3 ~ 50x50 mm

Test Zone : Chamber Type

Temperature Accuracy : 50°C to 90°C: ±2°C

90°C to 130°C: ±3°C

Contact Force : 850N

Binning : 6 Bins(3 Auto, 3 Manual Tray)

Page 13: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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13

AL708 Main Specifications

Change Kits Compatibility

100% Compatible with NS7000 & NS 8000 Series

Footprint : 1950(W) x 1575(D) x 2083(H)

Weight : 1150KG

Vacuum Air : Vacuum Pump

Operation

Front : LCD Monitor, Track Ball Mouse

Operation Panel

Rear : LCD Touch Monitor,

Operation Panel

ESD : Less Than 100 Voltage

Power : AC200 ~ 240V 50/60Hz, Single phase 6kVA

Page 14: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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14

ATECO Handler Comparison

Test Site Standard

Pitch

Contact

Force

Test Site

Type

CK

Compatibility

Dimension

(Test Area)

AL708 1~84x2

X:40, Y:60~1200N Chamber

NS6000

NS7000

NS8000

1950(W) x 1575(D) x 2083(H)

(184 x130)

AL708W 1~8

4x2

X:40/60, Y:60 2,400N Chamber

NS6000

NS7000

NS8000

1950(W) x 1575(D) x 2083(H)

(344 x 146mm)

AL7161~16

(32Option)

4x2

X:40/60, Y:602,400N Chamber

NS6000

NS7000

NS8000

1950(W) x 1575(D) x 2083(H)

(344 x 146mm)

Page 15: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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15

High Throughput

AL708/AL708W AL716

Hex / Ambient - 13000

Hex / Hot - 8400

Octal / Ambient 8300 13000

Octal / Hot 5450 8400

Quad / Ambient 8100 8100

Quad / Hot 5450 5450

Dual / Ambient 4700 4700

Dual / Hot 4050 4050

Single / Ambient 2700 2700

Single /Hot 2500 2500

Unit per Hour

Page 16: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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Functions

16

Page 17: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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17

MOTOR : 750W

PRESS ACTUATOR

High Contact Force

200Kg per Head

High Contact Force

Chamber + Direct Heating Concept !

Page 18: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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18

Individual Z Motor

8 Picker Units

Picker Units

8 Pickers with Individual Z axis Motor

Page 19: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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19

Contact Force

Applications

Contact Force/Device

High Contact Option (4800N)

Minimum Force Maximum Force

1 site 5.0N 4800N

2 sites 5.0N 2400N

4 sites 2.5N 1200N

With EP Regulator Control for Air pressure of

Cylinder it provides High Precise and Stable

Contact Force

2years Lifetime guaranteed with 24hours Use

Page 20: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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20

Contact Plunger Pressure Control Unit

100% Compatible – Air Buffer Mechanism

EP Regulator

Air Input

2mm Air Buffer Stroke

3Axis Buffer Cylinder

Contact Pusher Tip & Blade

Page 21: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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21

Precise Contact Structure

Contact Force Range

Min. 5.0N ~ 2400N

(Option 4800N)

Double Device Detect

by Vision Camera

by Cylinder End Sensor

Air Buffer(2mm)

for AL708/716

Contact Accuracy

Yield Improvement

Page 22: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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22

Contact Handling

Small/Thin PKG Detection with Fiber Sensor

PASS

FAIL

0.5mm Less[Fiber Sensor]

Digital Display

>1000 : OK

< 600 : NG

Page 23: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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23

Precise Control Unit

High

Stiffness

Picker

Precise Temperature

Chamber Sensor Position Scale

Digital Vacuum Sensor

Page 24: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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24

Flexible Layout

DUT ARRAY FOR AL708

Octal

40mm 40mm 40mm

60mm

DUT ARRAY FOR AL708W

Octal

60mm 60mm

60mm

60mm

Page 25: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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25

Flexible Layout

DUT ARRAY FOR AL716

Octal

Hex

60mm 60mm

60mm

60mm

40mm 40mm 40mm 40mm 40mm 40mm40mm

60mm

Page 26: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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26

Flexible Layout NS6000 NS7000 NS8000 AL708/AL716

NS6000 CK

Shuttle O O O O

Test Head O O(Modify) O O(Modify)

Hot Plate O O O O

Docking Plate O O(Modify) O O(Modify)

NS7000 CK

Shuttle X O O O

Test Head X O X O

Hot Plate O O O O

Docking Plate X O O O

NS8040CK

Shuttle X X O O

Test Head X X O O(Modify)

Hot Plate O O O O

Docking Plate X O O O(Modify)

NS8080CK

Shuttle X O O O

Test Head X X X O

Hot Plate O O O O

Docking Plate X X O O

Page 27: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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27

Easy Maintenance Features

Easy Access – Front & Rear Panel

Two Monitors

Front Monitor

Rear Monitor

Mouse & Button

Touch Screen &

Button

Page 28: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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28

Easy Accessible for maintenance

Top Cover Front Ionizer-(6+2ea)

Side View Front Cover

Easy Maintenance Features

Page 29: IC Test Handler Series AL700 - Transcend T Logic Handler_1610.pdf · IC Test Handler Series AL700 ... Test Equipment for None Memory Semiconductor, MEMS, ... Double Device Detect

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Thank You