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Scanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering [email protected] 515-294-8187

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Page 1: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Scanning Electron MicroscopySEM

Warren Straszheim, PhDMARL, 23 Town [email protected] 515-294-8187

Page 2: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

How it works

• Create a focused electron beam

• Accelerate it

• Scan it across the sample

• Map detector output to screen

Page 3: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 4: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 5: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Create an electron beam

Three main types of guns of increasing brightness and coherence

• Tungsten

• LaB6

• Field Emission

Page 6: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Accelerate the beam

• Requires vacuum to support the voltageto prevent scattering

Page 7: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Focus the beamlenses and apertures

• Wehnelt/Gun

• Condenser lens

• Objective lens

Page 8: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Benefits of SEM

• Shorter wavelength – higher resolution (0.1 nm electron at 10 keV vs 500 nm for light)

• Longer working distance – greater depth of focus

• Generally intuitive image interpretation(super magnifying glass)

• Scanned beam – perfect parfocality

• Wealth of signals: SE BSE, X-ray, voltage

• Energetic beam - microanalysis

Page 9: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Limitations of SEM

• First surface technique – limited penetration(can’t see through contamination)

• Vacuum requirement

• Conductivity “requirement”

Page 10: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Sample preparation

• Generally minimal

• Clean and dry

• Cut sample to fit and show structure of interest

• Secure sample (tape, glue, clamp)

• Embed or polish for cross sections

• Coat with metal or carbon (optional)

Page 11: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Available signals

• Auger electrons

• Secondary electrons

• Backscattered electrons

• Characteristic x-rays

• Continuum x-rays

• Cathodoluminescence

• Absorbed current

Page 12: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Contrast mechanism:Topography

Secondary electrons have a limited escape depth – many are created but few escape

A tilted (more vertical surface) allows more to escape – brighter signal

Page 13: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Extended depth of focus

Page 14: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Magnification range of less than 50x to 100s of kx

Page 15: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Continuous zoom from low magnification to high magnification

Page 16: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 17: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 18: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 19: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 20: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 21: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 22: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

By the way, this was a non-conductive sample

High-vac, low-vac (variable pressure), and environmental modes

Page 23: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 24: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Image Interpretation• Illumination

• Detection

• Line of sight

Page 25: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Contrast mechanism:Atomic number

Higher atomic number/electron density leads to

• greater secondary electron yield (coat samples with metal)

• greater backscattering coefficient

Atomic number is the only contrast mechanism for polished samples

Page 26: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

What signal should you use? SE or BSE

Page 27: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 28: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

What is the magnification?

240,000x . . .

Page 29: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

or 127,000x?

Page 30: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Horizontal field width (HFW) = 1000um

Magnification = Display width/HFWMag * HFW = Display width

240,000 x 1000um = 240 mm = 9.5 inches127,000 x 1000um = 127 mm = 5.0 inches

I use a 5-inch Polaroid print as the standard.Other sizes are fake magnification.

Page 31: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Resolution/Quality/SpeedPick two

• Small beam (spot size) leads to better spatial resolution but fewer electrons

• Bigger beam leads to more signal quality (less noise) but also less resolution

• Dwell time can be adjusted widely

High resolution images are worthless if you can’t see the detail through all of the noise

Page 32: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Other issues

• Astigmatism - range of focal lengths

• Charging - unstable imaging

• Contamination – obscures features of interest

• Unstable specimens – moving targets

Page 33: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Charging leading to flattening of SE image

Page 34: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

BSE image is somewhat more immune to charging

Page 35: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Oil leftover from “cleaning”

Page 36: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

SEM images the first surface, be that sample, contamination, or surfactant

Page 37: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

The Importance of Cleanliness

Any organic residue left on the sample will build up and obscure the sample

with time.

Page 38: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

BSE imaging may be better at showing the true size

Page 39: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Contamination layer builds up and shows in SE

Page 40: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Contamination build-up after examination at 150kx

Page 41: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Contamination is still visible at 15kx

Page 42: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Residue is visible even at 5000x .

Longer exposure leads to more build up.

Even short exposures lead to contamination.

Page 43: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

As-received 100kx Cleaned with plasma

Page 44: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

As-received 150kx Cleaned with plasma

Page 45: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Anatomic considerations:bit depth

Where can you distinguish gray levels?

Page 46: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

256 levels, 8-bit

Page 47: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

128 levels, 7-bit

Page 48: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

64 levels, 6-bit

Page 49: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

32 levels, 5 bit

Page 50: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

16 levels, 4-bit

Page 51: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

8 levels, 3-bit

Page 52: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Anatomic considerations:Pixel density

• How many pixels are enough?

• What’s the difference between pixels and dots per inch?

Page 53: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

1024 pixels

Page 54: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

512 pixels

Page 55: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

256 pixels

Page 56: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

128 pixels

Page 57: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 58: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

PPI versus DPI(for when editors gets fussy)

• PPI = pixels per inch, how we describe images

• DPI = dots per inch, how printers describe files

• It takes about 8x8 dots to render 1 gray pixel

• Therefore a 1600 dpi requirement is met by a 1024-pixel image printed no more than 5 inches wide.

Page 59: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu

Environmental Mode

• Variable pressure mode used for non-conductive or out-gassing samples

• Environmental mode used to maintain sample at equilibrium (micro-grapes)

• Various gas choices (water, air, reducing)

• Heating and cooling options (-25C to 1000C)

Page 60: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu
Page 61: Scanning Electron Microscopy SEMcanfield.physics.iastate.edu/course/Canfield 2018 SEM.pdfScanning Electron Microscopy SEM Warren Straszheim, PhD MARL, 23 Town Engineering wesaia@iastate.edu