mios_jisl

8/7/2019 MIOS_JISL

1/45

Minolta Innovative Optical SystemMinolta Innovative Optical System

TechnologyTechnology

8/7/2019 MIOS_JISL

2/45

Contents

Numerical Gloss Control

Numerical UV Control

Minolta Innovative Optical SystemMinolta Innovative Optical System

8/7/2019 MIOS_JISL

3/45

Objects that composed of the same materials, may have

variances in colors due to differences in the gloss of the

surfaces.

For example, when the surface condition of a shiny or

high gloss sample is being changed using a sandpaper,

it will cause the sample to look duller in color.

Color & GlossColor & Gloss

Before After

8/7/2019 MIOS_JISL

4/45

SpecularComponent IncludedSpecularComponent Included

SC

I The total amount of reflected light including the totalamount of specular component is taken into accountfor the measurement. The total amount of light is thesame and therefore the reflectance data of matte and

glossy surface is the same. It measures the total colour appearance independent

of the surface conditions.

When to useWhen to use:

Recommended for most CCM measurements Can be selected for certain QC measurements

8/7/2019 MIOS_JISL

5/45

SpecularComponent ExcludedSpecularComponent Excluded

SCE The specular component is excluded. Only the diffused

reflected light is taken into account for the measurement

and the reflectance data of the matte and glossy surface is

different. A matte surface is brighterbut less saturated

and a glossy surface will show a darkerbut highersaturation.

These results are close to visual perception

When to useWhen to use:

Recommended for most QC measurements Can be selected for certain CCM measurements too,

provided the surface is smooth and flat

If the surface is not smooth and flat, some light rays mayreflect in the directional reflection path which is not

wanted.

8/7/2019 MIOS_JISL

6/45

Traditional SCI/SCE Switching

Numerical Gloss Control Method

Numerical Gloss Control Advantage

Traditional Method vs Numerical Gloss Control

Numerical Gloss ControlNumerical Gloss Control

Contents

8/7/2019 MIOS_JISL

7/45

Traditional MethodTraditional Method

Specular Component Included and Excluded (SCI/SCE)

Physical gloss trap is opened and closed

mechanically

Switching time is necessary (much longer thanmeasuring time)

Moving parts are a potential danger ofbreak-down

Simultaneous measurements (completely same

conditions of sample) are impossible.

8/7/2019 MIOS_JISL

8/45

SCE SCI

Gloss Trap Closed

Sample

TraditionalTraditional SCISCI/SCE Measurement/SCE Measurement

8/7/2019 MIOS_JISL

9/45

SCE SCI

Traditional SCI/Traditional SCI/SCESCE MeasurementMeasurement

Gloss Trap Opened

Sample

8/7/2019 MIOS_JISL

10/45

SCE SCI

Gloss Trap Closed

Sample

TraditionalTraditional SCISCI/SCE Measurement/SCE Measurement

8/7/2019 MIOS_JISL

11/45

SCE SCI

Gloss Trap Opened

Sample

Traditional SCI/Traditional SCI/SCESCE MeasurementMeasurement

8/7/2019 MIOS_JISL

12/45

Illumination

Two flashes are activated

Diffuse Directional


8/7/2019 MIOS_JISL

13/45

First illumination - diffused

Sample


8/7/2019 MIOS_JISL

14/45

Sample


Second illumination - directional

8/7/2019 MIOS_JISL

15/45

Illumination

Two flashes are activated

Diffuse Directional

Calculation

With the data obtained by diffused illumination reflection and

directional illumination reflection, the CPU calculate the SCI

and SCE data simultaneously


8/7/2019 MIOS_JISL

16/45

Diffused light

deflection

Sample


8/7/2019 MIOS_JISL

17/45

Directional light

reflection

Sample


8/7/2019 MIOS_JISL

18/45


NGC calculation

SCE

Reflection due to diffuseReflection due to diffuse

illuminationillumination

SCI

Reflection by directionalReflection by directional

illuminationillumination

SCI

SCE

Simultaneously

8/7/2019 MIOS_JISL

19/45

Exclusive and patented

Practical and time saving

fast sampling - SCI & SCE in 4 seconds

Fully reliable no mechanism


Contents

8/7/2019 MIOS_JISL

20/45

Traditional Method Numerical Gloss Control

Switching between SCI and SCEtakes longer time

Quick measurement (SCI and SCEtakes 4 seconds)

Completely same conditions ofsample for SCI/SCE measurementis impossible

Completely same conditions ofsample for SCI/SCE measurement

Moving parts are subjected tobreakdown

No moving part


Contents

8/7/2019 MIOS_JISL

21/45

BLACKLIGHT

A blacklight is an illumination using wavelengths mostly

outside the visible regions of the spectrum. Example of

such light is the UV lamp.

It emits energy in the ultraviolet region

This light is use to illuminate fluorescent samples like

fluorescent jigsaw puzzle, while shirts or socks, to

cause them to appear striking or glow even when theyare in a dark room.

Fluorescent Material & WhitenessFluorescent Material & Whiteness

8/7/2019 MIOS_JISL

22/45

FLUORESCENT MATERIAL

Fluorescent material are chemicals that absorbs the

energy emitted by the backlight and re-emits it as light

in the visible region.

The sample appears white when it reflects all

wavelengths in the visible regions at nearly 100%.

When the reflectance is less in the blue wavelength,

the sample will appear to be yellowish. Fluorescent materials, sometimes referred to as

Optical Brighteners, are added to the samples

Fluorescent Material & WhitenessFluorescent Material & Whiteness

8/7/2019 MIOS_JISL

23/45

As fluorescent materials are used in many products like

paper and white shirts, whiteness measurement

becomes a must in these industries to monitor the

quality of the product as well as to ensure unnecessary

lost.

Correct measurement of whiteness demands an

instrument equipped with an adjustment device

capable of regulating the UV intensity.

The instrument is regarded as calibrated, if the amountof UV falling onto the sample is similar to that

encountered in daylight.

Whiteness MeasurementWhiteness Measurement

8/7/2019 MIOS_JISL

24/45

Traditional UV Adjustment Method

Numerical UV Adjustment Method

Numerical UV Control Merit

Traditional Method vs. Numerical UV Control

Anti-Triplet Effect

Numerical UV ControlNumerical UV Control

Contents

8/7/2019 MIOS_JISL

25/45

UV filter moves up and down to change UV content

of illumination to meet the value of fluorescent

calibration standard

Total energy is adjusted for one colorimetric index,

e.g., CIE WI with D65.

The procedure is based on trial and error to find the

exact filter position

Tedious

Traditional MethodTraditional Method

8/7/2019 MIOS_JISL

26/45

UV Cut Filter

100% UV

Fluorescent standard

Reflection

Calibration value

Illumination

Traditional UV CalibrationTraditional UV Calibration

8/7/2019 MIOS_JISL

27/45

Reflection

Calibration value

Illumination

Fluorescent Standard

UV Cut

Filter

Partial UV

UV Cut Filter


8/7/2019 MIOS_JISL

28/45


UV Cut Filter

0% UV


Reflection

Calibration value

Illumination

8/7/2019 MIOS_JISL

29/45

Maybe calibrated

UV Cut Filter

Adjusted UV



Reflection

Calibration value

Illumination

8/7/2019 MIOS_JISL

30/45

Two flashes

First: With 100% UV radiation

Second: 0% UV radiation


8/7/2019 MIOS_JISL

31/45

400 nm UV Cut Filter


Numerical UV CalibrationNumerical UV Calibration

First illumination with UV

8/7/2019 MIOS_JISL

32/45

400 nm UV Cut Filter



First illumination without UV

8/7/2019 MIOS_JISL

33/45

Two illumination

First: With 100% UV radiation

Second: 0% UV radiation)

Calculation

With the data obtained by 100% UV and 0% UV, the CPU

calculates the ratio to meet the calibration data in each

wavelength.


8/7/2019 MIOS_JISL

34/45

ReflectionIllumination


First illumination @ 100% UV

8/7/2019 MIOS_JISL

35/45


IlluminationSecond illumination @ 0% UV

ReflectionIllumination

8/7/2019 MIOS_JISL

36/45

Reflection

100% UV

Calibration Value

0% UV

a

b


8/7/2019 MIOS_JISL

37/45

For measurement, there are 2 illumination

The ratios obtained by 100% UV and 0% UV in

calibration, are adapted to the data obtained by

measurement to calculate the UV adjustedmeasurement value.

UV adjustment can be done in various ways:-

Whiteness Index

Whiteness Index & Tint

Profile

Granz & Griesser

Numerical UV MeasurementNumerical UV Measurement

8/7/2019 MIOS_JISL

38/45

Reflection100% UV

0% UV

Adjusted Measurement

valuea

b

Numerical UV MeasurementNumerical UV Measurement

8/7/2019 MIOS_JISL

39/45

Exclusive and patented

Practical and time saving

Total UV measurement process drastically simplified

Multiple information for UV analysis by as singlemeasurement

Parameter setting without hardware manipulation

No human error

Reliable No mechanical parts

Numerical UV Calibration MeritNumerical UV Calibration Merit

Return

8/7/2019 MIOS_JISL

40/45

Tr iti l t ri l C tr l

Calibrati tak s l r

ti

Instant calibrati n

Fl r sc nt sampl as tb pos b manyill mination ringcalibration

Only t o ill mination forcalibration

Mec anical parts s bject towearand tear omec anical parts

imitedparameters witfrequent manipulation

Manyparameters/42nm cutoff, ardand

soft illumination

ri l C tr lri l C tr l

R t r

8/7/2019 MIOS_JISL

41/45

AntiAnti--Triplet EffectTriplet Effect

Triplet Effect

Certain fluorescent materials has triplet effect, this

will cause a dip of the spectral graph just after the

fluorescent region as shown in the graph. Due to a high intensity illumination by the xenon flash

on the sample for a very short time.

Will not happen in normal illumination condition

8/7/2019 MIOS_JISL

42/45

Intensive Flash


8/7/2019 MIOS_JISL

43/45

Soft Flash


8/7/2019 MIOS_JISL

44/45


Soft Flash

Triplet EffectEffect

Return

Intensive Flash

8/7/2019 MIOS_JISL

45/45

Return

Manish Kapadia

Chief manager

JISL

mios_jisl

Documents