2007 年計算數學研討會 中山大學
DESCRIPTION
2007 年計算數學研討會 中山大學. Ren-Chuen Chen 陳仁純 高雄師範大學 O. Voskoboynikov 霍斯科 交通大學. Modeling and Simulation of Classical and Quantum Computer Devices. Jen-Hao Chen 陳人豪 交通大學 Jinn-Liang Liu 劉晉良 高雄大學. Part 1. Classical Computer. Microprocessor. Microchips. MOSFET. MOSFET - PowerPoint PPT PresentationTRANSCRIPT
2007 年計算數學研討會中山大學
Ren-Chuen Chen 陳仁純
高雄師範大學
O. Voskoboynikov霍斯科
交通大學
Modeling and Simulation of Classical and Quantum Computer Devices
Jen-Hao Chen陳人豪交通大學
Jinn-Liang Liu 劉晉良高雄大學
Part 1. Classical Computer
Microchips Microprocessor
MOSFET
1or 0Either :Bit
MOSFET (Metal Oxide Semiconductor Field Effect Transistor)
Semiconductor
A semiconductor is a material that can behave as a conductor or an insulator depending on what is done to it. We can control the amount of curre
nt that can pass through a semiconductor.
Kingfisher Science Encyclopedia
Czochralski Crystal Growth
12 吋矽晶圓
Sand Ingot Wafer Doping IC
Silicon IngotGold Ingots
Silicon Crystal
-
Si Si Si
Si
SiSi
Si
Si
Si
Shared electrons
Doping Impurities (n-Type)
Electron
-
Si Si Si
Si
SiSi
Si
Si
As
Extra
Valence band, Ev
Eg = 1.1 eV
Conducting band, Ec
Ed ~ 0.05 eV
Valence band, Ev
Eg = 1.1 eV
Conducting band, Ec
Ea ~ 0.05 eV
Electron
-
Si Si Si
Si
SiSi
Si
Si
B
Hole
Doping Impurities (p-Type)
S. Roy and A. Asenov, Science 2005
3D, 30nm x 30nm
2003 L = 4 nm Research2005 L = 45 nm Production2018 L = 7 nm Production
MOSFET (Metal Oxide
Semiconductor Field Effect Transistor)
Gate Length: 90 nm (2005 In Production) (Device Size) 65 nm (2006 In Production) 34 nm (This Talk)
Device SizesVs.Models
n+ n+
p-
interfacelayer
junctionlayer
junctionlayer
gate contactsource contact drain contact
bulk contact
BC D
I J
E
A F
B’ E’
C’ D’
R.-C. Chen and J.-L. Liu, JCP 2005L=IJ=34nm
Quantum Corrected Energy Transport Model
Doping Concentration
Physical Models
Drift diffusion model (3 PDEs)
Energy transport model
(5 PDEs)
Hydrodynamic Model
(7 PDEs)
Energy Transport Model
(2.5) ),(
(2.4) ),(
(2.3) ,
(2.2) ,
(2.1) ),(
0
0
p
ppp
n
nnn
p
n
DAS
p
n
R
R
NNpnq
EJS
EJS
J
J
• the electrostatic potential • n the electron concentration• p the hole concentration• J the current density• S the energy flux• E the electric field• R the generation-
recombination rate
nqDnq nnn J )()(
)(),(
00
2
TpTn
i
nnpp
nnpqpnR
Auxiliary Relationships
Density Gradient Theory (Bohm Quantum Potentials)
,2
,2
qp
qn
p
pb
n
nb
p
n
pqDpq
nqDnq
pqppp
nqnnn
)(
)(
J
J
Constant sPlanck' ,12/ *2 qmb nn
)10( ,12/ 34*2 Oqmb pp
New Variables
nnp
Self-Adjoint Formulation
expexp 2n
T
qni
T
qnni u
Vn
Vnn
2expexp pT
qpi
T
qppi v
Vn
Vnp
i
nTqn unV
ln
2
i
pTqp vnV
ln
2
Self-Adjoint DGET Model
(3.26) ,
(3.25) ,
(3.24) ,
(3.23) ,
(3.22) ,
(3.21) ,
(3.20) ,
p
n
pp
n
p
n
p
R
R
Z
Z
R
R
F
G
G
J
J
n
n
Adaptive Algorithm
SolveSolve
Initial meshInitial mesh
Error > TOLError > TOL
Error EstimationError Estimation RefinementRefinement
Yes
Post-ProcessPost-Process
No
PreprocessingPreprocessing
Gummel outer iterationGummel outer iteration
Solve Poisson Eq.Solve Poisson Eq.
SolveSolve pnvu ,,,
Error > TOLError > TOL
pn gg ,
Yes
No
(3.26) ,
(3.25) ,
(3.24) ,
(3.23) ,
(3.22) ,
(3.21) ,
(3.20) ,
p
n
pp
n
p
n
p
R
R
Z
Z
R
R
F
G
G
J
J
n
n
Finite Element MethodMonotone IterationExponential Fitting
The Final Adaptive Mesh
0 20 40 60 80 100
0
20
40
60
80
100
Transverse Distance (nm)
Dep
th (
nm)
Electron Concentration
Electron Temperature
Hole Quantum Potential
Electron Current Density
Drain Current for MOSFET
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 10
0.5
1
1.5
2
2.5
3
3.5
4
4.5
VDS
(V)
I DS (
mA
/ m
)
ETDGDGET
Conclusion
New Model (DGET, Self-Adjointness)
Better Approximation
Global Convergence (Monotone Iterative Method)
Efficiency
Easy Implementation